{"id":"https://openalex.org/W2043194656","doi":"https://doi.org/10.1109/dft.2013.6653612","title":"SmartInjector: Exploiting intelligent fault injection for SDC rate analysis","display_name":"SmartInjector: Exploiting intelligent fault injection for SDC rate analysis","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2043194656","doi":"https://doi.org/10.1109/dft.2013.6653612","mag":"2043194656"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2013.6653612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027610573","display_name":"Jianli Li","orcid":"https://orcid.org/0000-0001-8195-3820"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianli Li","raw_affiliation_strings":["School of Computer, National University of Defense Technology, China","School of Computer, National University of Defense Technology; Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, National University of Defense Technology, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"School of Computer, National University of Defense Technology; Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111989911","display_name":"Qingping Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingping Tan","raw_affiliation_strings":["School of Computer, National University of Defense Technology, China","School of Computer, National University of Defense Technology; Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer, National University of Defense Technology, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"School of Computer, National University of Defense Technology; Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"236","last_page":"242"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9822999835014343,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7701458930969238},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7247926592826843},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7009963393211365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6194906234741211},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5444563031196594},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5433490872383118},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5131319165229797},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5067070126533508},{"id":"https://openalex.org/keywords/outcome","display_name":"Outcome (game theory)","score":0.48414334654808044},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.47241511940956116},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.45543110370635986},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3818962872028351},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.22830501198768616},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14065521955490112},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09658071398735046},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.06955379247665405},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.060649573802948},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.05556485056877136}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7701458930969238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7247926592826843},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7009963393211365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6194906234741211},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5444563031196594},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5433490872383118},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5131319165229797},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5067070126533508},{"id":"https://openalex.org/C148220186","wikidata":"https://www.wikidata.org/wiki/Q7111912","display_name":"Outcome (game theory)","level":2,"score":0.48414334654808044},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.47241511940956116},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.45543110370635986},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3818962872028351},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.22830501198768616},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14065521955490112},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09658071398735046},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.06955379247665405},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.060649573802948},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.05556485056877136},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C144237770","wikidata":"https://www.wikidata.org/wiki/Q747534","display_name":"Mathematical economics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2013.6653612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1500849457","https://openalex.org/W1686420892","https://openalex.org/W1978887233","https://openalex.org/W2032094184","https://openalex.org/W2034593585","https://openalex.org/W2100866260","https://openalex.org/W2105372251","https://openalex.org/W2123331260","https://openalex.org/W2123379964","https://openalex.org/W2130189691","https://openalex.org/W2132362854","https://openalex.org/W2144495364","https://openalex.org/W2144512449","https://openalex.org/W2150267144","https://openalex.org/W4249144718","https://openalex.org/W4250893082","https://openalex.org/W4255519882","https://openalex.org/W6637151178","https://openalex.org/W6645152971"],"related_works":["https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2185394135","https://openalex.org/W2082366402","https://openalex.org/W2122349997","https://openalex.org/W2098626762","https://openalex.org/W2760189237","https://openalex.org/W2121043529","https://openalex.org/W2742111403","https://openalex.org/W2083209667"],"abstract_inverted_index":{"Recently,":[0],"researchers":[1],"have":[2],"shown":[3],"that":[4,146],"exploiting":[5],"symptom-based":[6],"solutions":[7,19],"provides":[8],"a":[9,115],"promising":[10],"way":[11],"to":[12,25,29,42,96,99,110,127,133,175,188,193],"achieve":[13],"low-cost":[14],"fault":[15,51,70,88,106,117,130,148,181,190],"tolerance.":[16],"However,":[17],"these":[18],"cannot":[20],"provide":[21],"enough":[22],"reliability":[23],"due":[24],"lack":[26],"of":[27,61,122,158,171],"ability":[28],"handle":[30],"silent":[31],"data":[32],"corruptions":[33],"(SDCs).":[34],"To":[35],"address":[36],"SDCs":[37],"efficiently,":[38],"it":[39],"is":[40,154,185],"important":[41],"identify":[43],"them":[44],"effectively.":[45],"This":[46],"paper":[47],"presents":[48],"an":[49,65,141],"intelligent":[50],"injection":[52,131,182],"framework,":[53],"SmartInjector,":[54],"which":[55,93],"can":[56,84],"analyze":[57,134],"the":[58,62,80,91,105,112,147,159,168,186,195],"SDC":[59,135,172],"rates":[60],"instructions":[63],"in":[64,140],"application":[66],"accurately":[67],"with":[68],"affordable":[69],"simulation":[71,89,149,197],"efforts.":[72],"Based":[73],"on":[74,177],"program":[75],"analysis,":[76],"SmartInjector":[77,102,126,153,184],"firstly":[78],"prunes":[79],"faults":[81,92],"whose":[82],"outcome":[83,107,191],"be":[85,97],"known":[86],"without":[87],"or":[90],"are":[94],"considered":[95],"equivalent":[98],"other":[100],"faults.":[101],"also":[103],"employs":[104],"prediction":[108,192],"technique":[109],"reduce":[111,194],"time":[113,150,160],"for":[114,137,162],"single":[116,196],"simulation.":[118],"The":[119],"decreased":[120],"requirement":[121],"computational":[123],"resources":[124],"allows":[125],"perform":[128],"detailed":[129],"experiments":[132],"rate":[136,173],"each":[138],"instruction":[139],"application.":[142],"Validation":[143],"results":[144],"show":[145],"needed":[151],"by":[152],"only":[155],"about":[156],"0.15%":[157],"required":[161],"simulating":[163],"all":[164],"possible":[165],"faults,":[166],"while":[167],"analysis":[169],"accuracy":[170],"reaches":[174],"94%":[176],"average.":[178],"Unlike":[179],"existing":[180],"frameworks,":[183],"first":[187],"exploit":[189],"time.":[198]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}