{"id":"https://openalex.org/W2126362033","doi":"https://doi.org/10.1109/dft.2013.6653599","title":"A low cost reliable architecture for S-Boxes in AES processors","display_name":"A low cost reliable architecture for S-Boxes in AES processors","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2126362033","doi":"https://doi.org/10.1109/dft.2013.6653599","mag":"2126362033"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2013.6653599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074720386","display_name":"Ting An","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ting An","raw_affiliation_strings":["Institut Mines-Telecom, Telecom Paris Tech LTCI-CNRS, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, Telecom Paris Tech LTCI-CNRS, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Alves de Barros Naviner","raw_affiliation_strings":["Institut Mines-Telecom, Telecom ParisTech, LTCI-CNRS, 46, rue Barrault 75634, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, Telecom ParisTech, LTCI-CNRS, 46, rue Barrault 75634, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062676433","display_name":"Philippe Matherat","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Matherat","raw_affiliation_strings":["Institut Mines-Telecom, Telecom Paris Tech LTCI-CNRS, Paris, France","Inst. Mines Telecom, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, Telecom Paris Tech LTCI-CNRS, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Inst. Mines Telecom, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3773,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.69283293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"155","last_page":"160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.9063471555709839},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8651353120803833},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7074863910675049},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6518192291259766},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5555891990661621},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.47970718145370483},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.46056443452835083},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43404096364974976},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3510301113128662},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.17368629574775696},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17025122046470642},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.15203800797462463}],"concepts":[{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.9063471555709839},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8651353120803833},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7074863910675049},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6518192291259766},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5555891990661621},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.47970718145370483},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.46056443452835083},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43404096364974976},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3510301113128662},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.17368629574775696},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17025122046470642},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15203800797462463},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dft.2013.6653599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01024892v1","is_oa":false,"landing_page_url":"https://imt.hal.science/hal-01024892","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, U.S. Outlying Islands. pp.155-160","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W104126654","https://openalex.org/W1515827409","https://openalex.org/W1537875328","https://openalex.org/W1581073174","https://openalex.org/W1595155753","https://openalex.org/W1967031301","https://openalex.org/W1968760107","https://openalex.org/W1997805593","https://openalex.org/W1999528892","https://openalex.org/W2087402364","https://openalex.org/W2110162979","https://openalex.org/W2124687434","https://openalex.org/W2126260501","https://openalex.org/W2127262877","https://openalex.org/W2132646199","https://openalex.org/W2149174385","https://openalex.org/W2149767240","https://openalex.org/W2154667225","https://openalex.org/W2398150135","https://openalex.org/W2533713938","https://openalex.org/W4285719527","https://openalex.org/W6630967683"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W2797678940","https://openalex.org/W3008821054","https://openalex.org/W1933211537","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2000379092","https://openalex.org/W2153096481","https://openalex.org/W1836055744"],"abstract_inverted_index":{"This":[0,40],"paper":[1],"presents":[2],"a":[3],"fault-tolerant":[4,80],"architecture":[5],"for":[6,50],"AES":[7,38,64],"processors":[8],"in":[9,37],"order":[10],"to":[11],"mitigate":[12],"the":[13,18,27,34,60,69,73],"reliability":[14],"issues":[15],"introduced":[16],"by":[17],"continued":[19],"shrinking":[20],"of":[21,63],"CMOS":[22],"technology.":[23],"We":[24],"concentrate":[25],"on":[26,30],"faults":[28],"occurring":[29],"S-Boxes":[31],"which":[32],"consume":[33],"largest":[35],"hardware":[36,47],"processor.":[39],"hybrid":[41],"solution":[42,71],"combines":[43],"time":[44],"redundancy":[45,48,62],"and":[46,55,76,88],"strategies":[49],"masking":[51],"all":[52],"single":[53],"transient":[54],"permanent":[56],"faults.":[57],"By":[58],"exploiting":[59],"inherent":[61],"processor":[65],"with":[66],"parallel":[67],"implementation,":[68],"proposed":[70],"limits":[72],"area":[74],"overhead":[75],"overcomes":[77],"many":[78],"popular":[79],"techniques":[81],"such":[82],"as":[83],"Triple":[84,89],"Modular":[85],"Redundancy":[86,91],"approach":[87],"Temporal":[90],"approaches.":[92]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}