{"id":"https://openalex.org/W1975097284","doi":"https://doi.org/10.1109/dft.2013.6653583","title":"Run-time mapping for reliable many-cores based on energy/performance trade-offs","display_name":"Run-time mapping for reliable many-cores based on energy/performance trade-offs","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W1975097284","doi":"https://doi.org/10.1109/dft.2013.6653583","mag":"1975097284"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2013.6653583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/3430640","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014159983","display_name":"Cristiana Bolchini","orcid":"https://orcid.org/0000-0001-5065-7906"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"C. Bolchini","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074815903","display_name":"Matteo Carminati","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Carminati","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Miele","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052267211","display_name":"Anup Das","orcid":"https://orcid.org/0000-0002-5673-2636"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT","SG"],"is_corresponding":false,"raw_author_name":"A. Das","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100755285","display_name":"Akash Kumar","orcid":"https://orcid.org/0000-0001-7125-1737"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT","SG"],"is_corresponding":false,"raw_author_name":"A. Kumar","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070594442","display_name":"Bharadwaj Veeravalli","orcid":"https://orcid.org/0000-0001-9000-1813"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["IT","SG"],"is_corresponding":false,"raw_author_name":"B. Veeravalli","raw_affiliation_strings":["Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]"],"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore]","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5014159983"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":4.3495,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.9458318,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"58","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.9011326432228088},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7315058708190918},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7174311876296997},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6728283762931824},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.5998175740242004},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5669358968734741},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4961486756801605},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4159248173236847},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4134308993816376},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39835137128829956},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3671424388885498},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19276762008666992},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.09610781073570251},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07068565487861633}],"concepts":[{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.9011326432228088},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7315058708190918},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7174311876296997},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6728283762931824},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.5998175740242004},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5669358968734741},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4961486756801605},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4159248173236847},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4134308993816376},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39835137128829956},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3671424388885498},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19276762008666992},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.09610781073570251},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07068565487861633},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/dft.2013.6653583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarbank.nus.edu.sg:10635/71697","is_oa":false,"landing_page_url":"http://scholarbank.nus.edu.sg/handle/10635/71697","pdf_url":null,"source":{"id":"https://openalex.org/S7407052290","display_name":"National University of Singapore","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus","raw_type":"Conference Paper"},{"id":"pmh:oai:re.public.polimi.it:11311/760446","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/760446","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:3430640","is_oa":true,"landing_page_url":"https://zenodo.org/record/3430640","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:3430640","is_oa":true,"landing_page_url":"https://zenodo.org/record/3430640","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1966283530","https://openalex.org/W1990911977","https://openalex.org/W2031853729","https://openalex.org/W2040466547","https://openalex.org/W2085806930","https://openalex.org/W2095985528","https://openalex.org/W2099237366","https://openalex.org/W2103492651","https://openalex.org/W2105407012","https://openalex.org/W2110336202","https://openalex.org/W2112199513","https://openalex.org/W2113615756","https://openalex.org/W2116359224","https://openalex.org/W2129442721","https://openalex.org/W2129950790","https://openalex.org/W2131061940","https://openalex.org/W2147320072","https://openalex.org/W2152165066","https://openalex.org/W2161350011","https://openalex.org/W2161625020","https://openalex.org/W2168157060","https://openalex.org/W3148014290","https://openalex.org/W3149104842","https://openalex.org/W4230714982","https://openalex.org/W4238550660","https://openalex.org/W4239812042","https://openalex.org/W4243767447","https://openalex.org/W6671885353","https://openalex.org/W6676972942","https://openalex.org/W6678774128","https://openalex.org/W6683479801"],"related_works":["https://openalex.org/W2183751629","https://openalex.org/W2168011386","https://openalex.org/W1030923862","https://openalex.org/W2122592404","https://openalex.org/W4244614293","https://openalex.org/W4256332449","https://openalex.org/W2315243270","https://openalex.org/W2337334590","https://openalex.org/W2624804828","https://openalex.org/W2259083908"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,57,82],"run-time":[4],"resource":[5],"manager":[6],"for":[7,56],"NoC-based":[8],"many-core":[9],"architectures":[10],"that":[11,62],"dynamically":[12],"determines":[13],"the":[14,21,25,45,63,97,111],"most":[15],"effective":[16],"mapping":[17,80],"of":[18,24,59,87],"tasks":[19],"on":[20,33],"processing":[22],"nodes":[23],"architecture":[26],"to":[27,43,77,102],"optimize":[28],"system":[29],"reliability":[30],"while":[31,109],"leveraging":[32],"performance":[34],"and":[35,92],"communication":[36,84,104],"energy.":[37],"An":[38],"adaptive":[39,64,98],"engine":[40,65,95,99],"is":[41,100],"exploited":[42],"pursue":[44],"given":[46],"optimization":[47,68,94],"goal":[48],"taking":[49],"into":[50],"account":[51],"various":[52],"metrics.":[53],"Experimental":[54],"results":[55],"set":[58],"benchmarks":[60],"show":[61],"(with":[66],"MTTF":[67,74,91,113],"only)":[69],"achieves":[70],"16%":[71],"improvement":[72],"in":[73],"with":[75,90],"respect":[76],"static":[78],"pre-computed":[79],"at":[81],"reasonable":[83],"energy":[85,93,105],"overhead":[86],"10%.":[88],"Further,":[89],"turned-on,":[96],"able":[101],"minimize":[103],"consumption":[106],"by":[107],"50%":[108],"exploiting":[110],"available":[112],"slack.":[114]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}