{"id":"https://openalex.org/W2062151021","doi":"https://doi.org/10.1109/dft.2013.6653581","title":"DaemonGuard: O/S-assisted selective software-based Self-Testing for multi-core systems","display_name":"DaemonGuard: O/S-assisted selective software-based Self-Testing for multi-core systems","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2062151021","doi":"https://doi.org/10.1109/dft.2013.6653581","mag":"2062151021"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2013.6653581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005530303","display_name":"Michael A. Skitsas","orcid":null},"institutions":[{"id":"https://openalex.org/I34771391","display_name":"University of Cyprus","ror":"https://ror.org/02qjrjx09","country_code":"CY","type":"education","lineage":["https://openalex.org/I34771391"]}],"countries":["CY"],"is_corresponding":true,"raw_author_name":"Michael A. Skitsas","raw_affiliation_strings":["Department of ECE, KIOS Research Center University of Cyprus, Nicosia, Cyprus"],"affiliations":[{"raw_affiliation_string":"Department of ECE, KIOS Research Center University of Cyprus, Nicosia, Cyprus","institution_ids":["https://openalex.org/I34771391"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035714231","display_name":"Chrysostomos Nicopoulos","orcid":"https://orcid.org/0000-0001-6389-6068"},"institutions":[{"id":"https://openalex.org/I34771391","display_name":"University of Cyprus","ror":"https://ror.org/02qjrjx09","country_code":"CY","type":"education","lineage":["https://openalex.org/I34771391"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"Chrysostomos A. Nicopoulos","raw_affiliation_strings":["Department of ECE, University of Cyprus, Nicosia, Cyprus"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of Cyprus, Nicosia, Cyprus","institution_ids":["https://openalex.org/I34771391"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063130153","display_name":"Maria K. Michael","orcid":"https://orcid.org/0000-0002-1943-6547"},"institutions":[{"id":"https://openalex.org/I34771391","display_name":"University of Cyprus","ror":"https://ror.org/02qjrjx09","country_code":"CY","type":"education","lineage":["https://openalex.org/I34771391"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"Maria K. Michael","raw_affiliation_strings":["Department of ECE, KIOS Research Center University of Cyprus, Nicosia, Cyprus"],"affiliations":[{"raw_affiliation_string":"Department of ECE, KIOS Research Center University of Cyprus, Nicosia, Cyprus","institution_ids":["https://openalex.org/I34771391"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5005530303"],"corresponding_institution_ids":["https://openalex.org/I34771391"],"apc_list":null,"apc_paid":null,"fwci":1.8913,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.8600125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"45","last_page":"51"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7568328380584717},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6340650320053101},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.5783207416534424},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.573400616645813},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.555528461933136},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5369989275932312},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.5279356837272644},{"id":"https://openalex.org/keywords/system-under-test","display_name":"System under test","score":0.5229357481002808},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.5151811838150024},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.49911952018737793},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4767909049987793},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4317287802696228},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.4197617769241333},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36793404817581177},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.32241055369377136},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.3013973832130432},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.2905808389186859},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12360942363739014},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.1007157564163208}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7568328380584717},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6340650320053101},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.5783207416534424},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.573400616645813},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.555528461933136},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5369989275932312},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.5279356837272644},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.5229357481002808},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.5151811838150024},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.49911952018737793},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4767909049987793},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4317287802696228},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.4197617769241333},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36793404817581177},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.32241055369377136},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.3013973832130432},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.2905808389186859},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12360942363739014},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.1007157564163208},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2013.6653581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2013.6653581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320335322","display_name":"European Regional Development Fund","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1891950198","https://openalex.org/W1906369229","https://openalex.org/W1995827686","https://openalex.org/W2046441569","https://openalex.org/W2099783606","https://openalex.org/W2103363686","https://openalex.org/W2103477679","https://openalex.org/W2120635877","https://openalex.org/W2125156827","https://openalex.org/W2132836329","https://openalex.org/W2156710719","https://openalex.org/W2157225945","https://openalex.org/W2162696040","https://openalex.org/W2164264749","https://openalex.org/W2169875292"],"related_works":["https://openalex.org/W1988901622","https://openalex.org/W2886756146","https://openalex.org/W3214776400","https://openalex.org/W3197709817","https://openalex.org/W1603792055","https://openalex.org/W1551391429","https://openalex.org/W2098804367","https://openalex.org/W3132885237","https://openalex.org/W2331368077","https://openalex.org/W2384797600"],"abstract_inverted_index":{"As":[0],"technology":[1],"scales":[2],"deep":[3],"into":[4],"the":[5,43,51,59,74,86,102,116,141,180],"sub-micron":[6],"regime,":[7],"transistors":[8],"become":[9],"less":[10],"reliable.":[11],"Future":[12],"systems":[13],"are":[14],"widely":[15],"predicted":[16],"to":[17,32,80,184],"suffer":[18],"from":[19],"considerable":[20],"aging":[21],"and":[22,41,109,125,134,169,190],"wear-out":[23],"effects.":[24],"This":[25],"ominous":[26],"threat":[27],"has":[28],"urged":[29],"system":[30,137,195],"designers":[31],"develop":[33],"effective":[34],"run-time":[35],"testing":[36,57,82,113,178,188],"methodologies":[37],"that":[38,100,118,139,175],"can":[39],"monitor":[40],"assess":[42],"system's":[44],"health.":[45],"In":[46],"this":[47],"work,":[48],"we":[49,95],"investigate":[50],"potential":[52],"of":[53,61,88,105,114,143,153],"online":[54],"software-based":[55],"functional":[56],"at":[58,147,179],"granularity":[60],"individual":[62,106,144],"microprocessor":[63],"core":[64],"components":[65,146],"in":[66,187],"multi-core":[67],"systems.":[68],"While":[69],"existing":[70],"techniques":[71],"monolithically":[72],"test":[73,170],"entire":[75],"core,":[76],"our":[77],"approach":[78],"aims":[79],"reduce":[81],"time":[83,189],"by":[84,130],"avoiding":[85],"over-testing":[87],"under-utilized":[89],"units.":[90],"To":[91],"facilitate":[92],"fine-grained":[93],"testing,":[94],"introduce":[96],"DaemonGuard,":[97],"a":[98,131,151,156,162],"framework":[99,160],"enables":[101],"real-time":[103],"observation":[104],"sub-core":[107,181],"modules":[108,117],"performs":[110],"on-demand":[111],"selective":[112,177],"only":[115],"have":[119],"recently":[120],"been":[121],"stressed.":[122],"The":[123],"monitoring":[124],"test-initiation":[126],"process":[127,138],"is":[128],"orchestrated":[129],"transparent,":[132],"minimally-intrusive,":[133],"lightweight":[135],"operating":[136,164],"observes":[140],"utilization":[142],"datapath":[145],"run-time.":[148],"We":[149],"perform":[150],"series":[152],"experiments":[154],"using":[155],"full-system,":[157],"execution-driven":[158],"simulation":[159],"running":[161],"commodity":[163],"system,":[165],"real":[166],"multi-threaded":[167],"workloads,":[168],"programs.":[171],"Our":[172],"results":[173],"indicate":[174],"operating-system-assisted":[176],"level":[182],"leads":[183],"substantial":[185],"savings":[186],"very":[191],"low":[192],"impact":[193],"on":[194],"performance.":[196]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}