{"id":"https://openalex.org/W1964247345","doi":"https://doi.org/10.1109/dft.2012.6378230","title":"Maintaining proximity to functional operation conditions under enhanced-scan tests based on functional broadside tests","display_name":"Maintaining proximity to functional operation conditions under enhanced-scan tests based on functional broadside tests","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W1964247345","doi":"https://doi.org/10.1109/dft.2012.6378230","mag":"1964247345"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2012.6378230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2012.6378230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["School of Electrical & Computer Eng. Purdue University, W. Lafayette, IN, U.S.A","School of Electrical & Computer Eng. Purdue University W. Lafayette, IN 47907, U. S. A"],"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Eng. Purdue University, W. Lafayette, IN, U.S.A","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"School of Electrical & Computer Eng. Purdue University W. Lafayette, IN 47907, U. S. A","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0468428,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"239","last_page":"244"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/broadside","display_name":"Broadside","score":0.9432560205459595},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6254517436027527},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5514777302742004},{"id":"https://openalex.org/keywords/functional-testing","display_name":"Functional testing","score":0.5362483859062195},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5111947655677795},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5107367038726807},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40411192178726196},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3694937229156494},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.29378682374954224},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23942524194717407},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16417646408081055},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1089673638343811},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08042016625404358}],"concepts":[{"id":"https://openalex.org/C57130246","wikidata":"https://www.wikidata.org/wiki/Q849965","display_name":"Broadside","level":2,"score":0.9432560205459595},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6254517436027527},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5514777302742004},{"id":"https://openalex.org/C80823478","wikidata":"https://www.wikidata.org/wiki/Q4493432","display_name":"Functional testing","level":3,"score":0.5362483859062195},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5111947655677795},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5107367038726807},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40411192178726196},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3694937229156494},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.29378682374954224},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23942524194717407},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16417646408081055},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1089673638343811},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08042016625404358},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2012.6378230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2012.6378230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1568407911","https://openalex.org/W1902443706","https://openalex.org/W1976944456","https://openalex.org/W1983213617","https://openalex.org/W2096146619","https://openalex.org/W2103607431","https://openalex.org/W2104955033","https://openalex.org/W2108103162","https://openalex.org/W2108254527","https://openalex.org/W2118112213","https://openalex.org/W2122827545","https://openalex.org/W2128229078","https://openalex.org/W2133913685","https://openalex.org/W2145300792","https://openalex.org/W2150670853","https://openalex.org/W2153919046","https://openalex.org/W2161876909","https://openalex.org/W2164754947","https://openalex.org/W3147280372","https://openalex.org/W4253755996","https://openalex.org/W6682516163"],"related_works":["https://openalex.org/W4379115630","https://openalex.org/W4248862039","https://openalex.org/W2007255031","https://openalex.org/W1479961795","https://openalex.org/W2018356883","https://openalex.org/W2159498927","https://openalex.org/W3119880501","https://openalex.org/W2124578543","https://openalex.org/W2155804389","https://openalex.org/W2914448942"],"abstract_inverted_index":{"In":[0],"a":[1,50],"circuit":[2],"with":[3],"enhanced-scan,":[4,57],"any":[5],"two-pattern":[6],"test":[7],"can":[8],"be":[9],"applied":[10],"to":[11,52,86],"detect":[12],"delay":[13],"faults.":[14],"However,":[15],"the":[16,58],"tests":[17,31,66,72],"may":[18],"deviate":[19],"substantially":[20],"from":[21,69],"functional":[22,33,38,53,70],"operation":[23,34,54],"conditions,":[24],"and":[25],"result":[26],"in":[27,61,74],"overtesting.":[28],"Functional":[29],"broadside":[30,71],"create":[32],"conditions":[35,55],"during":[36],"their":[37],"clock":[39],"cycles":[40],"by":[41],"using":[42],"reachable":[43],"states":[44],"as":[45],"scan-in":[46],"states.":[47],"To":[48],"maintain":[49],"proximity":[51],"under":[56,92],"procedure":[59],"described":[60],"this":[62,93],"paper":[63],"generates":[64],"enhanced-scan":[65],"that":[67,82],"differ":[68],"only":[73],"small":[75],"numbers":[76],"of":[77],"values.":[78],"Experimental":[79],"results":[80],"show":[81],"it":[83],"is":[84],"possible":[85],"achieve":[87],"high":[88],"transition":[89],"fault":[90],"coverage":[91],"constraint.":[94]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}