{"id":"https://openalex.org/W1968745901","doi":"https://doi.org/10.1109/dft.2012.6378229","title":"Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG","display_name":"Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W1968745901","doi":"https://doi.org/10.1109/dft.2012.6378229","mag":"1968745901"},"language":"en","primary_location":{"id":"doi:10.1109/dft.2012.6378229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2012.6378229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058451785","display_name":"\u00d3scar Acevedo","orcid":"https://orcid.org/0000-0001-7080-0386"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Oscar Acevedo","raw_affiliation_strings":["ECE Department, Southem Illinois University, Carbondale, IL, USA","ECE Department, Southern Illinois University, Carbondale, IL 62901-6603"],"affiliations":[{"raw_affiliation_string":"ECE Department, Southem Illinois University, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"ECE Department, Southern Illinois University, Carbondale, IL 62901-6603","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009349080","display_name":"Dimitri Kagaris","orcid":"https://orcid.org/0000-0003-2061-5080"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dimitri Kagaris","raw_affiliation_strings":["ECE Department, Southem Illinois University, Carbondale, IL, USA","ECE Department, Southern Illinois University, Carbondale, IL 62901-6603"],"affiliations":[{"raw_affiliation_string":"ECE Department, Southem Illinois University, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"ECE Department, Southern Illinois University, Carbondale, IL 62901-6603","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5058451785"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":1.1602,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.76634814,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"233","last_page":"238"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cube","display_name":"Cube (algebra)","score":0.8194167017936707},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.7528843879699707},{"id":"https://openalex.org/keywords/polynomial","display_name":"Polynomial","score":0.6279498338699341},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6023224592208862},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.4908767342567444},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.48151788115501404},{"id":"https://openalex.org/keywords/system-of-linear-equations","display_name":"System of linear equations","score":0.4771004319190979},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.46655482053756714},{"id":"https://openalex.org/keywords/finite-field","display_name":"Finite field","score":0.4411817789077759},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37956342101097107},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.3474646806716919},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.30436545610427856}],"concepts":[{"id":"https://openalex.org/C53051483","wikidata":"https://www.wikidata.org/wiki/Q861555","display_name":"Cube (algebra)","level":2,"score":0.8194167017936707},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.7528843879699707},{"id":"https://openalex.org/C90119067","wikidata":"https://www.wikidata.org/wiki/Q43260","display_name":"Polynomial","level":2,"score":0.6279498338699341},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6023224592208862},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.4908767342567444},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.48151788115501404},{"id":"https://openalex.org/C94523830","wikidata":"https://www.wikidata.org/wiki/Q11203","display_name":"System of linear equations","level":2,"score":0.4771004319190979},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.46655482053756714},{"id":"https://openalex.org/C77926391","wikidata":"https://www.wikidata.org/wiki/Q603880","display_name":"Finite field","level":2,"score":0.4411817789077759},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37956342101097107},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.3474646806716919},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.30436545610427856},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dft.2012.6378229","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dft.2012.6378229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.7400000095367432,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1582825744","https://openalex.org/W1592515516","https://openalex.org/W2101900253","https://openalex.org/W2103249102","https://openalex.org/W2117673729","https://openalex.org/W2130730834","https://openalex.org/W2138530143","https://openalex.org/W2145675266","https://openalex.org/W2147710469","https://openalex.org/W2162442687"],"related_works":["https://openalex.org/W2119351822","https://openalex.org/W2761125259","https://openalex.org/W2184933991","https://openalex.org/W2152745368","https://openalex.org/W4288754393","https://openalex.org/W2188176208","https://openalex.org/W2761883387","https://openalex.org/W2133482355","https://openalex.org/W2080947141","https://openalex.org/W2058952975"],"abstract_inverted_index":{"In":[0,54,79],"built-in":[1],"test":[2,6,65,128],"pattern":[3],"generation,":[4],"a":[5,14,25,38,44,63,74,104,118,126,132,151],"cube":[7,66,129],"is":[8,18,34,95],"usually":[9],"encoded":[10],"or":[11],"compressed":[12],"by":[13,36,142],"seed":[15,32],"vector":[16,33],"that":[17,120,154],"used":[19],"as":[20,135],"the":[21,52,57,84,88,100,122,138,147,156],"initial":[22],"state":[23],"of":[24,41,77,102],"Linear":[26],"Feedback":[27],"Shift":[28],"Register":[29],"(LFSR).":[30],"The":[31,92],"found":[35,141],"solving":[37,103],"linear":[39],"system":[40,76],"equations":[42],"using":[43,87],"fixed":[45],"(but":[46],"arbitrarily":[47],"chosen)":[48],"characteristic":[49,59],"polynomial":[50,60,140],"for":[51],"LFSR":[53,58],"contrast,":[55],"finding":[56],"to":[61,136],"generate":[62],"given":[64,127],"provides":[67],"more":[68],"design":[69],"freedom":[70],"but":[71,107],"results":[72,145],"in":[73,125,130],"non-linear":[75,105],"equations.":[78],"this":[80],"paper,":[81],"we":[82],"address":[83],"latter":[85],"problem":[86],"Berlekamp-Massey":[89],"(BM)":[90],"algorithm.":[91],"BM":[93],"algorithm":[94],"very":[96],"efficient":[97],"and":[98],"obviates":[99],"need":[101],"system,":[106],"it":[108],"cannot":[109],"work":[110],"with":[111],"don't":[112,123,157],"care":[113],"values.":[114],"We":[115],"present":[116],"therefore":[117],"procedure":[119],"assigns":[121,155],"cares":[124,158],"such":[131],"way":[133],"so":[134],"minimize":[137],"resulting":[139],"BM.":[143],"Experimental":[144],"demonstrate":[146],"substantial":[148],"improvement":[149],"over":[150],"previous":[152],"technique":[153],"greedily.":[159]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}