{"id":"https://openalex.org/W4410583111","doi":"https://doi.org/10.1109/ddecs63720.2025.11006682","title":"Towards an Automated Debugging Approach for Fault Identification in Quantum Circuits","display_name":"Towards an Automated Debugging Approach for Fault Identification in Quantum Circuits","publication_year":2025,"publication_date":"2025-05-05","ids":{"openalex":"https://openalex.org/W4410583111","doi":"https://doi.org/10.1109/ddecs63720.2025.11006682"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs63720.2025.11006682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs63720.2025.11006682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5106309874","display_name":"Anton Maidl","orcid":null},"institutions":[{"id":"https://openalex.org/I2898391981","display_name":"Deutsches Zentrum f\u00fcr Luft- und Raumfahrt e. V. (DLR)","ror":"https://ror.org/04bwf3e34","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I2898391981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Anton Maidl","raw_affiliation_strings":["German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany","institution_ids":["https://openalex.org/I2898391981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080636091","display_name":"Abhoy Kole","orcid":"https://orcid.org/0000-0002-2300-267X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Abhoy Kole","raw_affiliation_strings":["DFKI GmbH,Cyber-Physical Systems,Bremen,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DFKI GmbH,Cyber-Physical Systems,Bremen,Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088951659","display_name":"Kamalika Datta","orcid":"https://orcid.org/0000-0003-1191-998X"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Kamalika Datta","raw_affiliation_strings":["University of Bremen,Institute of Computer Science,Bremen,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Bremen,Institute of Computer Science,Bremen,Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074452368","display_name":"Jannis Stoppe","orcid":"https://orcid.org/0000-0003-2952-3422"},"institutions":[{"id":"https://openalex.org/I2898391981","display_name":"Deutsches Zentrum f\u00fcr Luft- und Raumfahrt e. V. (DLR)","ror":"https://ror.org/04bwf3e34","country_code":"DE","type":"facility","lineage":["https://openalex.org/I1305996414","https://openalex.org/I2898391981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jannis Stoppe","raw_affiliation_strings":["German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany","institution_ids":["https://openalex.org/I2898391981"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071742136","display_name":"Rolf Drechsler","orcid":"https://orcid.org/0000-0002-9872-1740"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Drechsler","raw_affiliation_strings":["University of Bremen,Institute of Computer Science,Bremen,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Bremen,Institute of Computer Science,Bremen,Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4704,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.86533679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"19","last_page":"24"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.8370562791824341},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6736094355583191},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5961068868637085},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4700307548046112},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42557236552238464},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4052632451057434},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32044821977615356},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.27797478437423706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15550968050956726},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14681097865104675}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.8370562791824341},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6736094355583191},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5961068868637085},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4700307548046112},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42557236552238464},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4052632451057434},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32044821977615356},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.27797478437423706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15550968050956726},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14681097865104675},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs63720.2025.11006682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs63720.2025.11006682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320311687","display_name":"Ministry of Education","ror":"https://ror.org/03m01yf64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W391578156","https://openalex.org/W2033216491","https://openalex.org/W2052891002","https://openalex.org/W2084652510","https://openalex.org/W2168676717","https://openalex.org/W2760965790","https://openalex.org/W2841500134","https://openalex.org/W2963481762","https://openalex.org/W2990961515","https://openalex.org/W3109961245","https://openalex.org/W4242275969","https://openalex.org/W4379536095","https://openalex.org/W4398785913","https://openalex.org/W6786598339","https://openalex.org/W6858925099"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2480201319","https://openalex.org/W2978026406","https://openalex.org/W1999657508","https://openalex.org/W2399091034","https://openalex.org/W2351581202","https://openalex.org/W2366922255"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,84,103,182],"propose":[4],"a":[5,35,72,105,175],"novel":[6],"method":[7,141],"for":[8],"locating":[9],"and":[10,136,150],"diagnosing":[11],"bugs":[12],"in":[13,17,159],"quantum":[14,19,32,152],"circuits.":[15],"Debugging":[16],"the":[18,26,31,39,49,66,88,91,99,119,134,167,171,185,194,200],"domain":[20],"is":[21,45,69],"especially":[22],"challenging":[23],"due":[24,47],"to":[25,48,59,117,145],"inherent":[27],"inability":[28],"of":[29,34,62,90,101,107,139,161,170,178,188,202],"assessing":[30],"state":[33],"program.":[36],"Moreover,":[37],"explaining":[38],"root":[40],"cause":[41],"behind":[42],"unexpected":[43],"outcomes":[44],"hard":[46],"limited":[50],"information":[51,86],"gain":[52],"provided":[53],"by":[54,142],"measurements.":[55,96,130],"Our":[56,154],"approach":[57,165],"aims":[58],"address":[60],"both":[61],"these":[63],"issue:":[64],"Firstly,":[65],"bug":[67,172],"site":[68],"identified":[70],"using":[71],"standard":[73],"circuit":[74,189,195],"slicing":[75],"technique":[76],"combined":[77],"with":[78,174,193,199],"an":[79],"associated":[80],"measurement":[81,137],"strategy.":[82],"Secondly,":[83],"provide":[85],"about":[87],"nature":[89],"bug,":[92],"generated":[93],"through":[94],"repeated":[95],"To":[97],"minimize":[98],"number":[100,187,201],"measurements,":[102],"introduce":[104],"notion":[106],"equivalence":[108],"classes":[109,123],"based":[110],"on":[111],"unitary":[112],"operations.":[113],"This":[114],"allows":[115],"us":[116],"partition":[118],"gate":[120,148],"library":[121],"into":[122],"that":[124,158,184],"produce":[125],"indistinguishable":[126],"results":[127,156],"under":[128],"certain":[129],"Finally,":[131],"We":[132],"assess":[133],"effectiveness":[135],"complexity":[138],"our":[140,164],"applying":[143],"it":[144],"relevant":[146],"primitive":[147],"components":[149],"well-known":[151],"algorithms.":[153],"empirical":[155],"shows":[157],"95.79%":[160],"all":[162],"cases,":[163],"reveals":[166],"correct":[168],"location":[169],"along":[173],"valid":[176],"set":[177],"fault":[179],"candidates.":[180],"Furthermore,":[181],"demonstrate":[183],"required":[186],"executions":[190],"scales":[191],"logarithmically":[192],"depth":[196],"or":[197],"linearly":[198],"qubits.":[203]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}