{"id":"https://openalex.org/W4396507933","doi":"https://doi.org/10.1109/ddecs60919.2024.10508928","title":"Interface Protection Against Transient Faults","display_name":"Interface Protection Against Transient Faults","publication_year":2024,"publication_date":"2024-04-03","ids":{"openalex":"https://openalex.org/W4396507933","doi":"https://doi.org/10.1109/ddecs60919.2024.10508928"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs60919.2024.10508928","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs60919.2024.10508928","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041646690","display_name":"J\u00e1n Mach","orcid":"https://orcid.org/0000-0003-4810-1655"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":true,"raw_author_name":"J\u00e1n Mach","raw_affiliation_strings":["Institute of Computer Engineering and Applied Informatics, Slovak University of Technology,Bratislava,Slovakia,842 16"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering and Applied Informatics, Slovak University of Technology,Bratislava,Slovakia,842 16","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054505543","display_name":"Luk\u00e1\u0161 Koh\u00fatka","orcid":"https://orcid.org/0000-0002-5679-6250"},"institutions":[{"id":"https://openalex.org/I4210152232","display_name":"Institute of Informatics of the Slovak Academy of Sciences","ror":"https://ror.org/04jgqpc26","country_code":"SK","type":"facility","lineage":["https://openalex.org/I207624831","https://openalex.org/I4210152232"]},{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Luk\u00e1\u0161 Koh\u00fatka","raw_affiliation_strings":["Institute of Informatics, Information Systems and Software Engineering, Slovak University of Technology,Bratislava,Slovakia,842 16"],"affiliations":[{"raw_affiliation_string":"Institute of Informatics, Information Systems and Software Engineering, Slovak University of Technology,Bratislava,Slovakia,842 16","institution_ids":["https://openalex.org/I110757952","https://openalex.org/I4210152232"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063985077","display_name":"Pavel \u010ci\u010d\u00e1k","orcid":"https://orcid.org/0000-0002-3021-1971"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Pavel \u010ci\u010d\u00e1k","raw_affiliation_strings":["Institute of Computer Engineering and Applied Informatics, Slovak University of Technology,Bratislava,Slovakia,842 16"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Engineering and Applied Informatics, Slovak University of Technology,Bratislava,Slovakia,842 16","institution_ids":["https://openalex.org/I110757952"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5041646690"],"corresponding_institution_ids":["https://openalex.org/I110757952"],"apc_list":null,"apc_paid":null,"fwci":0.6674,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67540755,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"136","last_page":"141"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7207090854644775},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.6618931889533997},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.574087917804718},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.48959165811538696},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17277184128761292},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1519058644771576},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.14009907841682434},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12596198916435242}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7207090854644775},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.6618931889533997},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.574087917804718},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.48959165811538696},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17277184128761292},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1519058644771576},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.14009907841682434},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12596198916435242},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs60919.2024.10508928","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs60919.2024.10508928","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Gender equality","id":"https://metadata.un.org/sdg/5"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1591874831","https://openalex.org/W1999938868","https://openalex.org/W2021708499","https://openalex.org/W2072566448","https://openalex.org/W2102480715","https://openalex.org/W2126523287","https://openalex.org/W2147446937","https://openalex.org/W2167002145","https://openalex.org/W3099340226","https://openalex.org/W3113196971","https://openalex.org/W4205220096","https://openalex.org/W4285146714","https://openalex.org/W4388831844"],"related_works":["https://openalex.org/W2349878854","https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W4244925124","https://openalex.org/W2377879397","https://openalex.org/W2903984874","https://openalex.org/W1577327694","https://openalex.org/W2887517211"],"abstract_inverted_index":{"Increasing":[0],"bus":[1,30],"frequency":[2,91],"to":[3,18],"fulfill":[4],"the":[5,13,16,33,36,56,76,89],"performance":[6],"requirements":[7],"of":[8,15,26,35,58,75],"dependable":[9],"applications":[10,77],"may":[11],"increase":[12],"susceptibility":[14],"system":[17],"transient":[19,29,59],"faults.":[20],"This":[21],"paper":[22],"describes":[23],"an":[24],"integration":[25],"protection":[27,41,83],"against":[28],"faults":[31,60],"into":[32],"interface":[34,65],"Hardisc":[37],"RISC-V":[38],"core.":[39],"The":[40,69,82],"is":[42],"based":[43],"on":[44,88],"information":[45],"redundancy":[46,49],"with":[47],"spatial":[48],"features.":[50],"It":[51],"enables":[52],"uninterrupted":[53],"execution":[54],"in":[55],"presence":[57],"and":[61,92,95],"provides":[62],"a":[63,85],"hardware-software":[64],"for":[66],"its":[67],"reporting.":[68],"benchmarking":[70],"results":[71],"indicate":[72],"that":[73],"most":[74],"will":[78],"be":[79],"impacted":[80],"minimally.":[81],"has":[84],"negligible":[86],"impact":[87],"maximal":[90],"8%":[93],"area":[94],"power":[96],"consumption":[97],"overhead.":[98]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}