{"id":"https://openalex.org/W4379115540","doi":"https://doi.org/10.1109/ddecs57882.2023.10139388","title":"A Low-cost Residue-based Scheme for Error-resiliency of RNN Accelerators","display_name":"A Low-cost Residue-based Scheme for Error-resiliency of RNN Accelerators","publication_year":2023,"publication_date":"2023-05-03","ids":{"openalex":"https://openalex.org/W4379115540","doi":"https://doi.org/10.1109/ddecs57882.2023.10139388"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs57882.2023.10139388","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ddecs57882.2023.10139388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045068003","display_name":"Nooshin Nosrati","orcid":"https://orcid.org/0009-0007-6230-5271"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Nooshin Nosrati","raw_affiliation_strings":["University of Tehran,School of Electrical and Computer Engineering, College of Engineering,Tehran,Iran","School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran,School of Electrical and Computer Engineering, College of Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007933406","display_name":"Zainalabedin Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Zainalabedin Navabi","raw_affiliation_strings":["University of Tehran,School of Electrical and Computer Engineering, College of Engineering,Tehran,Iran","School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran,School of Electrical and Computer Engineering, College of Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1227,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.40888813,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"32","issue":null,"first_page":"83","last_page":"86"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.732057511806488},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5671361088752747},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.5348578691482544},{"id":"https://openalex.org/keywords/recurrent-neural-network","display_name":"Recurrent neural network","score":0.5289818048477173},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5238240361213684},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4323299527168274},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4078630208969116},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3506426215171814},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.13011053204536438}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.732057511806488},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5671361088752747},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.5348578691482544},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.5289818048477173},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5238240361213684},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4323299527168274},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4078630208969116},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3506426215171814},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.13011053204536438},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs57882.2023.10139388","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ddecs57882.2023.10139388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1998730330","https://openalex.org/W2016066384","https://openalex.org/W2016881569","https://openalex.org/W2068071875","https://openalex.org/W2150025103","https://openalex.org/W2513554817","https://openalex.org/W2767260595","https://openalex.org/W2781626870","https://openalex.org/W2886321931","https://openalex.org/W2903175372","https://openalex.org/W3013700197","https://openalex.org/W3026699014","https://openalex.org/W3042905487","https://openalex.org/W3120468333","https://openalex.org/W3120931476","https://openalex.org/W3161596461","https://openalex.org/W4238485759","https://openalex.org/W4280513934","https://openalex.org/W6948096699"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2377919138","https://openalex.org/W2378857091","https://openalex.org/W4256502920","https://openalex.org/W103652678","https://openalex.org/W2999756192","https://openalex.org/W4226090359","https://openalex.org/W4382701072","https://openalex.org/W2011624601","https://openalex.org/W2975817033"],"abstract_inverted_index":{"Acceleration":[0],"and":[1,52,72,126],"power":[2],"reduction":[3],"requirements":[4],"are":[5,106,109],"usually":[6],"the":[7,11,21,44,98,101,158],"main":[8],"constraints":[9],"for":[10,63,148],"design":[12],"of":[13,23,41,100],"Artificial":[14],"Neural":[15,69],"Network":[16],"(ANN)":[17],"accelerators.":[18],"However,":[19],"in":[20,67,73,122],"case":[22],"safety-critical":[24],"applications":[25],"like":[26],"autonomous":[27],"driving,":[28],"reliability":[29],"takes":[30],"precedence":[31],"over":[32],"other":[33],"requirements.":[34],"Although":[35],"ANN":[36],"algorithms":[37],"provide":[38,142],"a":[39,133],"degree":[40],"inherent":[42],"resiliency,":[43],"hardware":[45,86],"part":[46],"is":[47],"still":[48],"vulnerable":[49],"to":[50,88,103,111,144,164],"faults":[51],"may":[53],"cause":[54],"catastrophic":[55],"failures.":[56],"This":[57],"paper":[58],"proposes":[59],"using":[60],"residue":[61],"codes":[62],"detecting":[64],"soft":[65],"errors":[66],"Recurrent":[68],"Networks":[70],"(RNNs),":[71],"particular,":[74],"Long":[75],"Short-Term":[76],"Memory":[77],"(LSTM)":[78],"networks.":[79],"We":[80],"attach":[81],"Concurrent":[82],"Error":[83],"Detection":[84],"(CED)":[85],"units":[87],"an":[89],"entire":[90],"LSTM":[91],"structure":[92],"or":[93,114],"its":[94],"substructures.":[95],"Depending":[96],"on":[97],"granularity":[99],"components":[102],"which":[104],"they":[105,156],"applied,":[107],"CEDs":[108,131,141],"referred":[110],"as":[112],"coarse-grain":[113],"fine-grain":[115,130,139],"CEDs.":[116],"The":[117],"simulation":[118],"results":[119],"show":[120],"that":[121],"fault":[123,146],"detection":[124,147],"rate":[125,160],"misprediction":[127,159],"coverage":[128],"rate,":[129],"have":[132],"better":[134],"performance":[135],"than":[136],"coarse-grain.":[137],"Specifically,":[138],"residue-based":[140],"up":[143],"97%":[145],"extremely":[149],"large":[150],"(10<sup>-2</sup>)":[151],"bit":[152],"error":[153],"rates.":[154],"Moreover,":[155],"reduce":[157],"by":[161],"84%":[162],"compared":[163],"unprotected":[165],"LSTM.":[166]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}