{"id":"https://openalex.org/W4379113698","doi":"https://doi.org/10.1109/ddecs57882.2023.10139331","title":"Bits, Flips and RISCs","display_name":"Bits, Flips and RISCs","publication_year":2023,"publication_date":"2023-05-03","ids":{"openalex":"https://openalex.org/W4379113698","doi":"https://doi.org/10.1109/ddecs57882.2023.10139331"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs57882.2023.10139331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs57882.2023.10139331","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044247285","display_name":"Nicolas Gerlin","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Nicolas Gerlin","raw_affiliation_strings":["Infineon Technologies AG,Germany","Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013456037","display_name":"Endri Kaja","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Endri Kaja","raw_affiliation_strings":["Infineon Technologies AG,Germany","Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Fabian Vargas","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061780029","display_name":"Li Lu","orcid":"https://orcid.org/0000-0002-6720-9066"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Li Lu","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030577367","display_name":"Anselm Breitenreiter","orcid":"https://orcid.org/0000-0001-7095-7551"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Anselm Breitenreiter","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101711633","display_name":"Junchao Chen","orcid":"https://orcid.org/0000-0002-4413-0937"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Junchao Chen","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063940342","display_name":"Markus Ulbricht","orcid":"https://orcid.org/0000-0001-9230-640X"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Markus Ulbricht","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092071977","display_name":"Maribel Gomez","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146398","display_name":"Minerals Technologies (United States)","ror":"https://ror.org/04hg6v996","country_code":"US","type":"company","lineage":["https://openalex.org/I4210146398"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maribel Gomez","raw_affiliation_strings":["MINRES Technologies,Germany","MINRES Technologies, Germany"],"affiliations":[{"raw_affiliation_string":"MINRES Technologies,Germany","institution_ids":["https://openalex.org/I4210146398"]},{"raw_affiliation_string":"MINRES Technologies, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092071978","display_name":"Ares Tahiraga","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ares Tahiraga","raw_affiliation_strings":["Infineon Technologies AG,Germany","Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031968154","display_name":"Sebastian Prebeck","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Prebeck","raw_affiliation_strings":["Infineon Technologies AG,Germany","Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079520321","display_name":"Eyck Jentzsch","orcid":"https://orcid.org/0009-0007-1440-7433"},"institutions":[{"id":"https://openalex.org/I4210146398","display_name":"Minerals Technologies (United States)","ror":"https://ror.org/04hg6v996","country_code":"US","type":"company","lineage":["https://openalex.org/I4210146398"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eyck Jentzsch","raw_affiliation_strings":["MINRES Technologies,Germany","MINRES Technologies, Germany"],"affiliations":[{"raw_affiliation_string":"MINRES Technologies,Germany","institution_ids":["https://openalex.org/I4210146398"]},{"raw_affiliation_string":"MINRES Technologies, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]},{"id":"https://openalex.org/I176453806","display_name":"University of Potsdam","ror":"https://ror.org/03bnmw459","country_code":"DE","type":"education","lineage":["https://openalex.org/I176453806"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milo\u0161 Krsti\u0107","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Germany","University of Potsdam, Germany","IHP - Leibniz Institute for High Performance Microelectronics, Germany"],"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Germany","institution_ids":["https://openalex.org/I92894754"]},{"raw_affiliation_string":"University of Potsdam, Germany","institution_ids":["https://openalex.org/I176453806"]},{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046956677","display_name":"Wolfgang Ecker","orcid":"https://orcid.org/0000-0002-9362-8096"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Ecker","raw_affiliation_strings":["Infineon Technologies AG,Germany","Infineon Technologies AG, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG,Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Infineon Technologies AG, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5044247285"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":0.391,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58658869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"140","last_page":"149"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.8040574193000793},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.747545599937439},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6715645790100098},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5978105664253235},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5485348701477051},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5395983457565308},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5218590497970581},{"id":"https://openalex.org/keywords/life-critical-system","display_name":"Life-critical system","score":0.4438028633594513},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4217539429664612},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.41714349389076233},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26835304498672485},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.26016032695770264},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.24848756194114685},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.21770241856575012},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09920647740364075}],"concepts":[{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.8040574193000793},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.747545599937439},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6715645790100098},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5978105664253235},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5485348701477051},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5395983457565308},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5218590497970581},{"id":"https://openalex.org/C163707989","wikidata":"https://www.wikidata.org/wiki/Q1996307","display_name":"Life-critical system","level":3,"score":0.4438028633594513},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4217539429664612},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.41714349389076233},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26835304498672485},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.26016032695770264},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.24848756194114685},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.21770241856575012},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09920647740364075},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs57882.2023.10139331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs57882.2023.10139331","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320311649","display_name":"Ministry of Education","ror":"https://ror.org/036nq5137"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2048241035","https://openalex.org/W2086449885","https://openalex.org/W2134131335","https://openalex.org/W2145071552","https://openalex.org/W2342824154","https://openalex.org/W2550854960","https://openalex.org/W2554037413","https://openalex.org/W2913135501","https://openalex.org/W2938993579","https://openalex.org/W2964015378","https://openalex.org/W2975936067","https://openalex.org/W2982093475","https://openalex.org/W3048039335","https://openalex.org/W3048221011","https://openalex.org/W3095711704","https://openalex.org/W3099613315","https://openalex.org/W3210162968","https://openalex.org/W4211116224","https://openalex.org/W4285244116","https://openalex.org/W4308659744","https://openalex.org/W4310502075","https://openalex.org/W4312878747","https://openalex.org/W6726873649"],"related_works":["https://openalex.org/W2895044751","https://openalex.org/W2019331916","https://openalex.org/W2888578907","https://openalex.org/W2171660074","https://openalex.org/W2135370717","https://openalex.org/W2111405992","https://openalex.org/W2945958501","https://openalex.org/W2134801004","https://openalex.org/W754709491","https://openalex.org/W1549261274"],"abstract_inverted_index":{"Electronic":[0],"systems":[1,195],"can":[2,147],"be":[3,30],"submitted":[4],"to":[5,9,32,158,185,189],"hostile":[6],"environments":[7],"leading":[8],"bit-flips":[10],"or":[11,19,35],"stuck-at":[12],"faults":[13],"and,":[14],"ultimately,":[15],"a":[16,41,83],"system":[17],"malfunction":[18],"failure.":[20],"In":[21],"safety-critical":[22,164,197],"applications,":[23],"the":[24,45,59,62,78,110,139,143,160,186,191],"risks":[25],"of":[26,44,61,142,162,193],"such":[27,170],"events":[28],"should":[29],"managed":[31],"prevent":[33],"injuries":[34],"material":[36],"damage.":[37],"This":[38],"paper":[39,183],"provides":[40],"comprehensive":[42],"overview":[43],"challenges":[46],"associated":[47],"with":[48,138],"designing":[49],"and":[50,53,73,91,94,105,122,128,132,155,174,178],"verifying":[51],"safe":[52],"reliable":[54],"systems,":[55],"as":[56,58,171],"well":[57],"potential":[60],"RISC-V":[63,144],"architecture":[64],"in":[65,77,166,181,196],"addressing":[66],"these":[67,136],"challenges.We":[68],"present":[69],"several":[70],"state-of-the-art":[71],"safety":[72,168],"reliability":[74],"verification":[75,85,98],"techniques":[76,137],"design":[79,111],"phase.":[80],"These":[81],"include":[82],"highly-automated":[84],"flow,":[86],"an":[87,95],"automated":[88,116],"fault":[89,97,106,156],"injection":[90],"analysis":[92],"tool,":[93],"AI-based":[96],"flow.":[99],"Furthermore,":[100],"we":[101],"discuss":[102],"core":[103],"hardening":[104,118],"mitigation":[107],"strategies":[108],"at":[109],"level.":[112],"We":[113],"focus":[114],"on":[115,126],"SoC":[117],"using":[119],"model-driven":[120],"development":[121],"resilient":[123],"processing":[124],"based":[125],"sensing":[127],"prediction":[129],"for":[130],"space":[131],"avionic":[133],"applications.By":[134],"combining":[135],"inherent":[140],"flexibility":[141],"architecture,":[145],"designers":[146],"develop":[148],"tailored":[149],"solutions":[150],"that":[151],"balance":[152],"cost,":[153],"performance,":[154],"tolerance":[157],"meet":[159],"requirements":[161],"various":[163],"applications":[165],"different":[167],"domains,":[169],"avionics,":[172],"automotive,":[173],"space.":[175],"The":[176],"insights":[177],"methodologies":[179],"presented":[180],"this":[182],"contribute":[184],"ongoing":[187],"efforts":[188],"improve":[190],"dependability":[192],"computing":[194],"environments.":[198]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-29T08:15:47.926485","created_date":"2025-10-10T00:00:00"}