{"id":"https://openalex.org/W2947185665","doi":"https://doi.org/10.1109/ddecs.2019.8724642","title":"New categories of Safe Faults in a processor-based Embedded System","display_name":"New categories of Safe Faults in a processor-based Embedded System","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2947185665","doi":"https://doi.org/10.1109/ddecs.2019.8724642","mag":"2947185665"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2019.8724642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2019.8724642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2009.11621","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"C. Gursoy","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"C. Gursoy","raw_affiliation_strings":["Tallinn University of Technology -, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology -, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Jenihhin","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"M. Jenihhin","raw_affiliation_strings":["Tallinn University of Technology -, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology -, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":null,"display_name":"A. S. Oyeniran","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"A. S. Oyeniran","raw_affiliation_strings":["Tallinn University of Technology -, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology -, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":null,"display_name":"D. Piumatti","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Piumatti","raw_affiliation_strings":["Politecnico di Torino, Dip. Automatica e Informatica - Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Dip. Automatica e Informatica - Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":null,"display_name":"J. Raik","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"J. Raik","raw_affiliation_strings":["Tallinn University of Technology -, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology -, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":null,"display_name":"M. Sonza Reorda","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Dip. Automatica e Informatica - Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Dip. Automatica e Informatica - Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":null,"display_name":"R. Ubar","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"R. Ubar","raw_affiliation_strings":["Tallinn University of Technology -, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology -, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.984,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73272124,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7544999718666077},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6363999843597412},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4632999897003174},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4352000057697296},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4034999907016754},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.38269999623298645},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.3788999915122986},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.36059999465942383}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7544999718666077},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6363999843597412},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6015999913215637},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5785999894142151},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5005999803543091},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4632999897003174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43720000982284546},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4352000057697296},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4034999907016754},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.38269999623298645},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.3788999915122986},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.36059999465942383},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.35040000081062317},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.33239999413490295},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3248000144958496},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.289000004529953},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.2874000072479248},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.28619998693466187},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.2775999903678894},{"id":"https://openalex.org/C28472234","wikidata":"https://www.wikidata.org/wiki/Q213666","display_name":"Real-time operating system","level":2,"score":0.2709999978542328},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.2660999894142151},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.25699999928474426},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.2558000087738037},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.2540000081062317},{"id":"https://openalex.org/C132835097","wikidata":"https://www.wikidata.org/wiki/Q7663745","display_name":"System safety","level":2,"score":0.25290000438690186}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ddecs.2019.8724642","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2019.8724642","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:arXiv.org:2009.11621","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2009.11621","pdf_url":"https://arxiv.org/pdf/2009.11621","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2009.11621","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2009.11621","pdf_url":"https://arxiv.org/pdf/2009.11621","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1974001719","https://openalex.org/W1978853990","https://openalex.org/W2103376470","https://openalex.org/W2108572593","https://openalex.org/W2123976827","https://openalex.org/W2130132458","https://openalex.org/W2143384237","https://openalex.org/W2156837195","https://openalex.org/W2162696040","https://openalex.org/W2334801967","https://openalex.org/W2624991222","https://openalex.org/W2799185990","https://openalex.org/W2918741387"],"related_works":[],"abstract_inverted_index":{"The":[0,49,94,111],"identification":[1,35,90],"of":[2,52,70],"safe":[3,33,71,88,95],"faults":[4,6,72,96],"(i.e.,":[5],"which":[7],"are":[8,101],"guaranteed":[9],"not":[10],"to":[11,98,104,116],"produce":[12],"any":[13],"failure)":[14],"in":[15,56],"an":[16,46,74],"electronic":[17],"system":[18,76,119],"is":[19,36,91,114],"a":[20,79,117],"crucial":[21],"step":[22],"when":[23],"analyzing":[24],"its":[25,28],"dependability":[26],"and":[27,43],"test":[29],"plan":[30],"development.":[31],"Unfortunately,":[32],"fault":[34,89],"poorly":[37],"supported":[38],"by":[39],"available":[40],"EDA":[41],"tools,":[42],"thus":[44],"remains":[45],"open":[47,124],"problem.":[48],"complexity":[50],"growth":[51],"modern":[53],"systems":[54],"used":[55],"safety-critical":[57],"applications":[58],"further":[59],"complicates":[60],"their":[61],"identification.":[62],"In":[63],"this":[64],"article,":[65],"we":[66],"identify":[67],"some":[68],"classes":[69],"within":[73],"embedded":[75],"based":[77],"on":[78],"pipelined":[80],"processor.":[81,126],"A":[82],"new":[83],"method":[84],"for":[85],"automating":[86],"the":[87,122],"also":[92],"proposed.":[93],"belonging":[97],"each":[99],"class":[100],"identified":[102],"resorting":[103],"Automatic":[105],"Test":[106],"Pattern":[107],"Generation":[108],"(ATPG)":[109],"techniques.":[110],"proposed":[112],"methodology":[113],"applied":[115],"sample":[118],"built":[120],"around":[121],"OpenRisc1200":[123],"source":[125]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2019-06-07T00:00:00"}