{"id":"https://openalex.org/W2617897664","doi":"https://doi.org/10.1109/ddecs.2017.7934576","title":"Improving combinational circuit resilience against soft errors via selective resource allocation","display_name":"Improving combinational circuit resilience against soft errors via selective resource allocation","publication_year":2017,"publication_date":"2017-04-01","ids":{"openalex":"https://openalex.org/W2617897664","doi":"https://doi.org/10.1109/ddecs.2017.7934576","mag":"2617897664"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2017.7934576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2017.7934576","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031599842","display_name":"Tohid Taghizad Gogjeh Yaran","orcid":null},"institutions":[{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Tohid Taghizad Gogjeh Yaran","raw_affiliation_strings":["Computer Engineering Department, Hacettepe University, Ankara, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044482167","display_name":"S\u00fcleyman Tosun","orcid":"https://orcid.org/0000-0002-3708-2009"},"institutions":[{"id":"https://openalex.org/I66514158","display_name":"Hacettepe University","ror":"https://ror.org/04kwvgz42","country_code":"TR","type":"education","lineage":["https://openalex.org/I66514158"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Suleyman Tosun","raw_affiliation_strings":["Computer Engineering Department, Hacettepe University, Ankara, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Hacettepe University, Ankara, Turkey","institution_ids":["https://openalex.org/I66514158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I66514158"],"apc_list":null,"apc_paid":null,"fwci":0.3792,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.45083919,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"42","issue":null,"first_page":"12","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7883427143096924},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7579396367073059},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.702268660068512},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6445205807685852},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.561730682849884},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.5324522256851196},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46636447310447693},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.46122270822525024},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.44355499744415283},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.43559810519218445},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.42750874161720276},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.42350831627845764},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.371672123670578},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.35834693908691406},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.335751473903656},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2491297423839569},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2451593279838562},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2109263837337494},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1560056507587433},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07983580231666565}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7883427143096924},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7579396367073059},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.702268660068512},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6445205807685852},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.561730682849884},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.5324522256851196},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46636447310447693},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.46122270822525024},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.44355499744415283},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.43559810519218445},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.42750874161720276},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.42350831627845764},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.371672123670578},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.35834693908691406},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.335751473903656},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2491297423839569},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2451593279838562},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2109263837337494},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1560056507587433},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07983580231666565},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2017.7934576","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2017.7934576","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1592886836","https://openalex.org/W1850300036","https://openalex.org/W2044672656","https://openalex.org/W2129183345","https://openalex.org/W2137235679","https://openalex.org/W2161516870","https://openalex.org/W2169213530","https://openalex.org/W2171323246","https://openalex.org/W2269743125","https://openalex.org/W2999623539"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W2066664769","https://openalex.org/W1993206924","https://openalex.org/W2036412341","https://openalex.org/W2154207847","https://openalex.org/W2168546702"],"abstract_inverted_index":{"Combinational":[0],"circuits":[1,29],"have":[2],"become":[3],"more":[4],"vulnerable":[5],"to":[6,26,50,65,97,103,107,128],"soft":[7],"errors":[8],"(SEs)":[9],"in":[10,23],"each":[11,83],"CMOS":[12],"technology":[13],"generation.":[14],"Most":[15],"of":[16,69,79,93,111],"the":[17,28,35,41,51,67,80,99,104,109,112],"prior":[18],"studies":[19],"use":[20,76],"hardware":[21],"redundancy":[22,33],"an":[24],"attempt":[25],"harden":[27],"against":[30,135],"errors.":[31],"However,":[32],"increases":[34],"area":[36,116,142],"and":[37,88,117],"power":[38],"consumption.":[39],"Furthermore,":[40],"design":[42,63,113],"constraints":[43],"may":[44],"not":[45],"allow":[46],"adding":[47],"redundant":[48],"resources":[49,102],"final":[52],"circuit.":[53],"In":[54,72],"this":[55,73],"paper,":[56],"we":[57,75,125],"present":[58],"a":[59,136],"genetic":[60],"algorithm":[61],"(GA)-based":[62],"method":[64,95,138],"increase":[66],"reliability":[68,89,110,133],"combinational":[70],"circuits.":[71],"method,":[74],"different":[77,85],"versions":[78],"same":[81],"resources,":[82],"having":[84],"area,":[86],"latency,":[87],"values.":[90],"The":[91],"goal":[92],"GA-based":[94],"is":[96],"allocate":[98],"best":[100],"available":[101],"application":[105],"nodes":[106],"maximize":[108],"under":[114],"tight":[115],"latency":[118],"constraints.":[119],"Our":[120],"experimental":[121],"results":[122],"show":[123],"that":[124],"achieve":[126],"up":[127],"19.90%":[129],"(14.50%":[130],"on":[131],"average)":[132],"improvement":[134],"heuristic":[137],"with":[139],"no":[140],"additional":[141],"overhead.":[143]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}