{"id":"https://openalex.org/W2110719747","doi":"https://doi.org/10.1109/ddecs.2011.5783115","title":"Measurement point selection for in-operation wear-out monitoring","display_name":"Measurement point selection for in-operation wear-out monitoring","publication_year":2011,"publication_date":"2011-04-01","ids":{"openalex":"https://openalex.org/W2110719747","doi":"https://doi.org/10.1109/ddecs.2011.5783115","mag":"2110719747"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2011.5783115","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783115","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011843358","display_name":"Urban Ingelsson","orcid":null},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Urban Ingelsson","raw_affiliation_strings":["Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]},{"raw_affiliation_string":"Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053977822","display_name":"Shih-Yen Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Shih-Yen Chang","raw_affiliation_strings":["Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]},{"raw_affiliation_string":"Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005848285","display_name":"Erik Larsson","orcid":"https://orcid.org/0000-0001-6672-0279"},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Erik Larsson","raw_affiliation_strings":["Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Link\u00f6ping Universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]},{"raw_affiliation_string":"Dept. of Computer and Information Science, Link\u00f6pings universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011843358"],"corresponding_institution_ids":["https://openalex.org/I102134673"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.14380524,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"381","last_page":"386"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.8578303456306458},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.8210170269012451},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5570091605186462},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5376165509223938},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5184606909751892},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5003819465637207},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.475195050239563},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4384554922580719},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.4256511628627777},{"id":"https://openalex.org/keywords/warning-system","display_name":"Warning system","score":0.42248648405075073},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41097259521484375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27512556314468384},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1693931221961975},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14737248420715332},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09898048639297485}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.8578303456306458},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.8210170269012451},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5570091605186462},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5376165509223938},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5184606909751892},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5003819465637207},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.475195050239563},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4384554922580719},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4256511628627777},{"id":"https://openalex.org/C29825287","wikidata":"https://www.wikidata.org/wiki/Q1427940","display_name":"Warning system","level":2,"score":0.42248648405075073},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41097259521484375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27512556314468384},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1693931221961975},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14737248420715332},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09898048639297485},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/ddecs.2011.5783115","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783115","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.421.8061","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.421.8061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ida.liu.se/labs/eslab/publications/pap/db/urbin_DDECS11.pdf","raw_type":"text"},{"id":"pmh:oai:lup.lub.lu.se:75060357-3d78-4e74-bef2-a49cef032e15","is_oa":false,"landing_page_url":"https://lup.lub.lu.se/record/2340790","pdf_url":null,"source":{"id":"https://openalex.org/S4306400536","display_name":"Lund University Publications (Lund University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I187531555","host_organization_name":"Lund University","host_organization_lineage":["https://openalex.org/I187531555"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"contributiontobookanthology/conference"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1980303205","https://openalex.org/W1993301830","https://openalex.org/W1993770272","https://openalex.org/W2014269421","https://openalex.org/W2016745542","https://openalex.org/W2017634415","https://openalex.org/W2049171978","https://openalex.org/W2052504177","https://openalex.org/W2105058680","https://openalex.org/W2105619224","https://openalex.org/W2121319784","https://openalex.org/W2131583184","https://openalex.org/W2147828967","https://openalex.org/W2154122798","https://openalex.org/W2155506703","https://openalex.org/W2156327154","https://openalex.org/W2156770737","https://openalex.org/W2164529645","https://openalex.org/W2167678606","https://openalex.org/W2546163117","https://openalex.org/W4246352371"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2542708587","https://openalex.org/W4229007131","https://openalex.org/W2364197307","https://openalex.org/W4381800218","https://openalex.org/W2034853009","https://openalex.org/W2381557379","https://openalex.org/W2951187577"],"abstract_inverted_index":{"In":[0],"recent":[1],"IC":[2],"designs,":[3],"the":[4,38,52,83,87],"risk":[5],"of":[6,24,41,54,65,74,85],"early":[7],"failure":[8],"due":[9,15],"to":[10,16,37,50,81],"electromigration":[11],"wear-out":[12,27,66,88],"has":[13],"increased":[14],"reduced":[17],"feature":[18],"dimensions.":[19],"To":[20],"give":[21],"a":[22,48,71],"warning":[23],"impending":[25],"failure,":[26],"monitoring":[28],"approaches":[29],"have":[30],"included":[31],"delay":[32,42],"measurement":[33,43,56,75],"circuitry":[34,44],"on-chip.":[35],"Due":[36],"high":[39],"cost":[40],"this":[45],"paper":[46],"presents":[47],"method":[49,60,92],"reduce":[51],"number":[53,73],"necessary":[55],"points.":[57],"The":[58,91],"proposed":[59],"is":[61,93],"based":[62],"on":[63,95],"identification":[64],"sensitive":[67,89],"interconnects":[68],"and":[69],"selects":[70],"small":[72],"points":[76],"that":[77],"can":[78],"be":[79],"used":[80],"observe":[82],"state":[84],"all":[86],"interconnects.":[90],"demonstrated":[94],"ISCAS85":[96],"benchmark":[97],"ICs":[98],"with":[99],"encouraging":[100],"results.":[101]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}