{"id":"https://openalex.org/W2146743319","doi":"https://doi.org/10.1109/ddecs.2011.5783060","title":"Low-complexity integrated circuit aging monitor","display_name":"Low-complexity integrated circuit aging monitor","publication_year":2011,"publication_date":"2011-04-01","ids":{"openalex":"https://openalex.org/W2146743319","doi":"https://doi.org/10.1109/ddecs.2011.5783060","mag":"2146743319"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2011.5783060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783060","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045464104","display_name":"Aleksandar Simevski","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Aleksandar Simevski","raw_affiliation_strings":["Brandenburg University of Technology, Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111617436","display_name":"Rolf Kraemer","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]},{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Kraemer","raw_affiliation_strings":["Brandenburg University of Technology, Cottbus, Germany","IHP, Frankfurt, Germany"],"affiliations":[{"raw_affiliation_string":"Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]},{"raw_affiliation_string":"IHP, Frankfurt, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP, Frankfurt, Germany"],"affiliations":[{"raw_affiliation_string":"IHP, Frankfurt, Germany","institution_ids":["https://openalex.org/I92894754"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5045464104"],"corresponding_institution_ids":["https://openalex.org/I51783024"],"apc_list":null,"apc_paid":null,"fwci":0.5299,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.72078534,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"121","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6911959648132324},{"id":"https://openalex.org/keywords/circuit-extraction","display_name":"Circuit extraction","score":0.6153271198272705},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.5752900242805481},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5731677412986755},{"id":"https://openalex.org/keywords/circuit-complexity","display_name":"Circuit complexity","score":0.5726441144943237},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5499765276908875},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5302205681800842},{"id":"https://openalex.org/keywords/discrete-circuit","display_name":"Discrete circuit","score":0.46328702569007874},{"id":"https://openalex.org/keywords/physical-design","display_name":"Physical design","score":0.46272411942481995},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.45783093571662903},{"id":"https://openalex.org/keywords/diode-or-circuit","display_name":"Diode-or circuit","score":0.4457698464393616},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39815619587898254},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3856649696826935},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.37349215149879456},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.36387377977371216},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3466961681842804},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.26201027631759644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20417621731758118},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19413155317306519},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10700371861457825}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6911959648132324},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.6153271198272705},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.5752900242805481},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5731677412986755},{"id":"https://openalex.org/C90702460","wikidata":"https://www.wikidata.org/wiki/Q1055112","display_name":"Circuit complexity","level":3,"score":0.5726441144943237},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5499765276908875},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5302205681800842},{"id":"https://openalex.org/C188058453","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Discrete circuit","level":4,"score":0.46328702569007874},{"id":"https://openalex.org/C188817802","wikidata":"https://www.wikidata.org/wiki/Q13426855","display_name":"Physical design","level":3,"score":0.46272411942481995},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.45783093571662903},{"id":"https://openalex.org/C171065743","wikidata":"https://www.wikidata.org/wiki/Q5279089","display_name":"Diode-or circuit","level":5,"score":0.4457698464393616},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39815619587898254},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3856649696826935},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.37349215149879456},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.36387377977371216},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3466961681842804},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.26201027631759644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20417621731758118},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19413155317306519},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10700371861457825},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2011.5783060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2011.5783060","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1579520342","https://openalex.org/W2006742708","https://openalex.org/W2082102392","https://openalex.org/W2097944675","https://openalex.org/W2105619224","https://openalex.org/W2141565132","https://openalex.org/W2143591075","https://openalex.org/W2154122798","https://openalex.org/W2171805009","https://openalex.org/W2269425946","https://openalex.org/W2295052317","https://openalex.org/W2771743730","https://openalex.org/W4242521389","https://openalex.org/W4246352371"],"related_works":["https://openalex.org/W2390607226","https://openalex.org/W2355158303","https://openalex.org/W2073444951","https://openalex.org/W2184765698","https://openalex.org/W2387876236","https://openalex.org/W3135874697","https://openalex.org/W3034130800","https://openalex.org/W2514330007","https://openalex.org/W2021028930","https://openalex.org/W2146743319"],"abstract_inverted_index":{"Integrated":[0],"circuit":[1,17,28,32,57,91,156],"aging":[2,69,105],"effects":[3,15],"are":[4,39,71,170],"more":[5,7],"and":[6,114,120,147],"pronounced":[8],"with":[9,172],"the":[10,31,67,80,84,129,137,149,152],"continuous":[11],"technological":[12],"downscaling.":[13],"These":[14],"degrade":[16],"operation":[18],"which":[19,169],"is":[20,164],"mainly":[21],"observed":[22],"as":[23],"increased":[24],"input-to-output":[25,76],"delay":[26],"of":[27,35,66,83,116,151],"components.":[29],"Eventually,":[30],"falls":[33],"out":[34],"its":[36,117],"specifications.":[37],"Countermeasures":[38],"needed":[40],"to":[41,62],"prevent":[42],"or":[43],"reduce":[44],"such":[45],"degradation.":[46],"Aging":[47],"monitoring":[48],"can":[49,55,134],"be":[50],"very":[51],"beneficial":[52],"since":[53],"it":[54],"predict":[56,154],"failure":[58,157],"and/or":[59,158],"activate":[60],"mechanisms":[61],"avoid":[63],"failure.":[64],"Most":[65],"present":[68,87],"monitors":[70,127],"based":[72,107],"on":[73,79,108],"reporting":[74],"abnormal":[75],"signal":[77],"delays":[78],"critical":[81],"path":[82],"circuit.":[85,131],"However,":[86],"approaches":[88],"introduce":[89],"additional":[90],"complexity,":[92],"use":[93,97],"complicated":[94],"analog":[95],"design,":[96,118],"non-standard":[98],"cells":[99],"etc.":[100],"We":[101],"propose":[102],"a":[103,142,155],"low-complexity":[104],"monitor":[106,146],"standard":[109],"library":[110],"cells,":[111],"offering":[112],"simplicity":[113],"flexibility":[115],"integration":[119],"use.":[121],"The":[122,132],"designer":[123],"could":[124],"instantiate":[125],"many":[126],"throughout":[128],"integrated":[130],"user":[133],"simply":[135],"read":[136],"\u201caging":[138],"code\u201d":[139],"placed":[140],"in":[141,144,167,174],"register":[143],"each":[145],"determine":[148],"\u201cage\u201d":[150],"circuit,":[153],"take":[159],"an":[160],"appropriate":[161],"action.":[162],"This":[163],"especially":[165],"useful":[166],"microprocessors":[168],"designed":[171],"dependability":[173],"mind.":[175]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}