{"id":"https://openalex.org/W2070315111","doi":"https://doi.org/10.1109/ddecs.2010.5491835","title":"Safety features of SoCs: How can they be re-used?","display_name":"Safety features of SoCs: How can they be re-used?","publication_year":2010,"publication_date":"2010-04-01","ids":{"openalex":"https://openalex.org/W2070315111","doi":"https://doi.org/10.1109/ddecs.2010.5491835","mag":"2070315111"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2010.5491835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024226992","display_name":"D. Appello","orcid":"https://orcid.org/0000-0001-8178-2785"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Davide Appello","raw_affiliation_strings":["STMicroelectronics, Italy","ST-Microelectronics (Italy)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST-Microelectronics (Italy)","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5024226992"],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11674891,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9805999994277954,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.7783384919166565},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7240013480186462},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.653240978717804},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.5375703573226929},{"id":"https://openalex.org/keywords/root","display_name":"Root (linguistics)","score":0.5290713906288147},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.5249911546707153},{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.5120044350624084},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.5060910582542419},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.4860871136188507},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.48584505915641785},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4546140432357788},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4442979693412781},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3501173257827759},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.16394901275634766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15916940569877625}],"concepts":[{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.7783384919166565},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7240013480186462},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.653240978717804},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.5375703573226929},{"id":"https://openalex.org/C171078966","wikidata":"https://www.wikidata.org/wiki/Q111029","display_name":"Root (linguistics)","level":2,"score":0.5290713906288147},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.5249911546707153},{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.5120044350624084},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.5060910582542419},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.4860871136188507},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.48584505915641785},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4546140432357788},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4442979693412781},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3501173257827759},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16394901275634766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15916940569877625},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2010.5491835","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491835","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2030594396","https://openalex.org/W2535098331","https://openalex.org/W2202104725","https://openalex.org/W4255366506","https://openalex.org/W2056250485","https://openalex.org/W4280640835","https://openalex.org/W2885334669","https://openalex.org/W2111856191","https://openalex.org/W4230518569","https://openalex.org/W4230900947"],"abstract_inverted_index":{"Summary":[0],"form":[1,38],"only":[2],"given:":[3],"Safety":[4],"is":[5,10,26,56,122],"a":[6,12,30,94,156,170],"concept":[7],"which":[8],"nowadays":[9],"pervading":[11],"large":[13],"spectrum":[14,32],"of":[15,33,39,54,62,81,103],"applications":[16],"fields.":[17],"It":[18],"was":[19],"pioneered":[20],"by":[21,115],"military":[22],"and":[23,25,45,87,99,120,131,147,166],"aerospace":[24],"now":[27],"exploited":[28],"in":[29,135],"wide":[31],"systems":[34],"to":[35,41,43,46,57,76,85,110,125,159,180],"prevent":[36,58],"any":[37,60],"injury":[40],"people":[42],"properties":[44],"the":[47,52,97,100,112,116,128,149,177],"environment.":[48],"In":[49],"other":[50],"words,":[51],"purpose":[53],"safety":[55],"that":[59],"type":[61],"error":[63,82,104,129,163],"generate":[64,152],"unacceptable":[65],"risk":[66],"conditions.":[67],"This":[68],"talk":[69],"will":[70,90,107],"explore":[71],"two":[72],"specific":[73],"aspects":[74],"linked":[75],"safety.":[77],"First,":[78],"an":[79],"analysis":[80],"sources":[83],"(limited":[84],"hardware":[86],"environmentally-dependant":[88],"errors)":[89],"be":[91,108,139],"taken.":[92],"Secondly,":[93],"discussion":[95],"on":[96],"detection":[98,130],"diagnosis":[101,132],"techniques":[102],"root":[105,164],"causes":[106,165],"proposed,":[109],"follow-up":[111],"question":[113],"asked":[114],"keynote":[117],"title.":[118],"How":[119],"when":[121],"it":[123],"possible":[124],"exploit":[126],"differently":[127],"features":[133],"present":[134],"SoCs?":[136],"Could":[137],"they":[138,151],"re-used":[140],"during":[141],"off-line":[142],"operations?":[143],"Can":[144],"we":[145],"log":[146],"access":[148],"data":[150],"on-line?":[153],"Is":[154],"this":[155],"good":[157],"chance":[158],"learn":[160],"better":[161,168],"about":[162],"activating":[167],"(=in":[169],"tailored":[171],"manner)":[172],"prevention":[173],"mechanisms?":[174],"Which":[175],"are":[176],"key":[178],"enablers":[179],"succeed?":[181]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}