{"id":"https://openalex.org/W2077507869","doi":"https://doi.org/10.1109/ddecs.2010.5491773","title":"Using a CISC microcontroller to test embedded memories","display_name":"Using a CISC microcontroller to test embedded memories","publication_year":2010,"publication_date":"2010-04-01","ids":{"openalex":"https://openalex.org/W2077507869","doi":"https://doi.org/10.1109/ddecs.2010.5491773","mag":"2077507869"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2010.5491773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023523866","display_name":"Ad van de Goor","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Ad van de Goor","raw_affiliation_strings":["Computer Engineering, Technical University Delft, Netherlands","ComTex, Gouda, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Computer Engineering, Technical University Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"ComTex, Gouda, The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Computer Engineering, Technical University Delft, Netherlands","[Computer Engineering, TU Delft, The Netherlands]"],"affiliations":[{"raw_affiliation_string":"Computer Engineering, Technical University Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"[Computer Engineering, TU Delft, The Netherlands]","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075050234","display_name":"Georgi Gaydadjiev","orcid":"https://orcid.org/0000-0002-3678-7007"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Georgi Gaydadjiev","raw_affiliation_strings":["Computer Engineering, Technical University Delft, Netherlands","[Computer Engineering, TU Delft, The Netherlands]"],"affiliations":[{"raw_affiliation_string":"Computer Engineering, Technical University Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"[Computer Engineering, TU Delft, The Netherlands]","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5023523866"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.9987,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.77662137,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"261","last_page":"266"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.8237416744232178},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7272205352783203},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6458858847618103},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4408613443374634},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3845895528793335}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.8237416744232178},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7272205352783203},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6458858847618103},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4408613443374634},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3845895528793335}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2010.5491773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W1544582518","https://openalex.org/W1696527132","https://openalex.org/W2042841653","https://openalex.org/W2103344295","https://openalex.org/W2106935654","https://openalex.org/W2108917733","https://openalex.org/W2130686022","https://openalex.org/W2131437577","https://openalex.org/W2141727284","https://openalex.org/W2163518473","https://openalex.org/W2163707679","https://openalex.org/W2165487727","https://openalex.org/W2537456650","https://openalex.org/W4231050950"],"related_works":["https://openalex.org/W3091627987","https://openalex.org/W2147310439","https://openalex.org/W1605551782","https://openalex.org/W2089988144","https://openalex.org/W1985703800","https://openalex.org/W1972388196","https://openalex.org/W2347749188","https://openalex.org/W4362711618","https://openalex.org/W2735419558","https://openalex.org/W4302313182"],"abstract_inverted_index":{"Small":[0],"microcontroller-based":[1],"systems":[2],"are":[3],"omnipresent.":[4],"Often,":[5],"they":[6],"do":[7],"not":[8,17],"have":[9],"Memory":[10],"BIST":[11],"(MBIST),":[12],"or":[13],"the":[14,20,25,29,36,40,46],"MBIST":[15],"is":[16],"available":[18],"to":[19,32,53],"user.":[21],"In":[22],"such":[23],"cases":[24],"CPU":[26],"will":[27],"be":[28],"only":[30],"resource":[31],"perform":[33],"at":[34],"least":[35],"Power-On":[37],"testing":[38],"of":[39,50],"embedded":[41],"memories.":[42],"This":[43],"paper":[44],"highlights":[45],"capabilities":[47],"and":[48],"limitations":[49],"CISC":[51],"architectures":[52],"apply":[54],"at-speed":[55],"memory":[56],"tests.":[57]},"counts_by_year":[{"year":2017,"cited_by_count":5},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}