{"id":"https://openalex.org/W1971295415","doi":"https://doi.org/10.1109/ddecs.2010.5491748","title":"Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes","display_name":"Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes","publication_year":2010,"publication_date":"2010-04-01","ids":{"openalex":"https://openalex.org/W1971295415","doi":"https://doi.org/10.1109/ddecs.2010.5491748","mag":"1971295415"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2010.5491748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491748","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046933538","display_name":"Fanyi Wu","orcid":"https://orcid.org/0000-0001-8766-0885"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"F. Wu","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001777299","display_name":"Luigi Dilillo","orcid":"https://orcid.org/0000-0002-1295-2688"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Dilillo","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bosio","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041515093","display_name":"S. Pravossoudovitch","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Pravossoudovitch","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Virazel","raw_affiliation_strings":["Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic, LIRMM, University of Montpellier 2, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307"]},{"raw_affiliation_string":"Dept. of Microelectronic, LIRMM, University of Montpellier II / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002029078","display_name":"Junxia Ma","orcid":"https://orcid.org/0000-0002-0151-3188"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Ma","raw_affiliation_strings":["University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT USA#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT USA#TAB#","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039871179","display_name":"Wei Zhao","orcid":"https://orcid.org/0000-0003-4841-7756"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Zhao","raw_affiliation_strings":["University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT USA#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT USA#TAB#","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102766705","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0009-0006-8410-2347"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Tehranipoor","raw_affiliation_strings":["University of Connecticut, Storrs, CT, USA","University of Connecticut, Storrs, CT USA#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT USA#TAB#","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"X. Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Fukuoka, Japan","Kyushu Institute of Technology,Iizuka, Fukuoka,Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology,Iizuka, Fukuoka,Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5046933538"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":1.7478,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.8497639,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"376","last_page":"381"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.732552170753479},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6071348786354065},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5825594663619995},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5805814862251282},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5380063056945801},{"id":"https://openalex.org/keywords/consumption","display_name":"Consumption (sociology)","score":0.4961188733577728},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4916759133338928},{"id":"https://openalex.org/keywords/power-demand","display_name":"Power demand","score":0.4815509617328644},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4638623595237732},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4542745053768158},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24024727940559387},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14562198519706726},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.11466628313064575},{"id":"https://openalex.org/keywords/sociology","display_name":"Sociology","score":0.06751707196235657}],"concepts":[{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.732552170753479},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6071348786354065},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5825594663619995},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5805814862251282},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5380063056945801},{"id":"https://openalex.org/C30772137","wikidata":"https://www.wikidata.org/wiki/Q5164762","display_name":"Consumption (sociology)","level":2,"score":0.4961188733577728},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4916759133338928},{"id":"https://openalex.org/C2983317576","wikidata":"https://www.wikidata.org/wiki/Q1853339","display_name":"Power demand","level":4,"score":0.4815509617328644},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4638623595237732},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4542745053768158},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24024727940559387},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14562198519706726},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11466628313064575},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.06751707196235657},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2010.5491748","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2010.5491748","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1557977552","https://openalex.org/W1568407911","https://openalex.org/W1908034516","https://openalex.org/W1966348745","https://openalex.org/W1980985044","https://openalex.org/W2039868523","https://openalex.org/W2096146619","https://openalex.org/W2104677752","https://openalex.org/W2119691242","https://openalex.org/W2119854194","https://openalex.org/W2125424164","https://openalex.org/W2144817027","https://openalex.org/W2148271311","https://openalex.org/W2156577524","https://openalex.org/W2477948566","https://openalex.org/W3210820645","https://openalex.org/W6641769569","https://openalex.org/W6683103440","https://openalex.org/W6721075071"],"related_works":["https://openalex.org/W2118008391","https://openalex.org/W1816461854","https://openalex.org/W2776409113","https://openalex.org/W2060442164","https://openalex.org/W3187939022","https://openalex.org/W2091858233","https://openalex.org/W2089997255","https://openalex.org/W2156573693","https://openalex.org/W2590119245","https://openalex.org/W2291698372"],"abstract_inverted_index":{"At-speed":[0],"scan":[1,17],"testing":[2,18,68],"has":[3,34,53],"become":[4],"mandatory":[5],"due":[6],"to":[7,81,91],"the":[8,39,42,66,83],"extreme":[9],"CMOS":[10],"technology":[11],"scaling.":[12],"The":[13],"two":[14,67],"main":[15],"at-speed":[16],"schemes":[19,69],"are":[20],"namely":[21],"Launch-Off-Shift":[22],"(LOS)":[23],"and":[24,76,85,132],"Launch-Off-Capture":[25],"(LOC).":[26],"As":[27],"it":[28],"can":[29],"be":[30],"easily":[31],"implemented,":[32],"LOC":[33],"been":[35],"widely":[36],"investigated":[37],"in":[38,41,70,79,103,117],"literature":[40],"last":[43],"few":[44],"years,":[45],"especially":[46,116],"regarding":[47],"test":[48],"power":[49,77,113],"consumption.":[50],"Conversely,":[51],"LOS":[52,88,97],"received":[54],"much":[55,111],"less":[56],"attention.":[57],"In":[58],"this":[59],"paper,":[60],"we":[61],"propose":[62],"a":[63],"comparison":[64],"between":[65],"terms":[71,118],"of":[72,87,119],"transition":[73],"fault":[74],"coverage":[75,104],"consumption,":[78],"order":[80],"quantify":[82],"pros":[84],"cons":[86],"with":[89],"respect":[90],"LOC.":[92],"This":[93],"study":[94],"shows":[95],"that":[96],"not":[98,108],"only":[99],"exhibits":[100],"higher":[101],"performance":[102],"but":[105],"also":[106],"does":[107],"require":[109],"as":[110,114],"extra":[112],"predicted,":[115],"peak":[120],"power.":[121],"These":[122],"facts":[123],"may":[124],"represent":[125],"convincing":[126],"arguments":[127],"for":[128],"its":[129],"wider":[130],"use":[131],"development.":[133]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}