{"id":"https://openalex.org/W2156837195","doi":"https://doi.org/10.1109/ddecs.2009.5012096","title":"A fast untestability proof for SAT-based ATPG","display_name":"A fast untestability proof for SAT-based ATPG","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2156837195","doi":"https://doi.org/10.1109/ddecs.2009.5012096","mag":"2156837195"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2009.5012096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059569542","display_name":"Daniel Tille","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Daniel Tille","raw_affiliation_strings":["Institute of Computer Science, University of Brethemen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, University of Brethemen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071742136","display_name":"Rolf Drechsler","orcid":"https://orcid.org/0000-0002-9872-1740"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Drechsler","raw_affiliation_strings":["Institute of Computer Science, University of Brethemen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, University of Brethemen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059569542"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":0.536,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.70099385,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"38","last_page":"43"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.937313437461853},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6440847516059875},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.6379976272583008},{"id":"https://openalex.org/keywords/satisfiability","display_name":"Satisfiability","score":0.6100603342056274},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5383369326591492},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5063427686691284},{"id":"https://openalex.org/keywords/conjunctive-normal-form","display_name":"Conjunctive normal form","score":0.5018599033355713},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.49692776799201965},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.45395252108573914},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3734513223171234},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.29166939854621887},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2563919126987457},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15248051285743713},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10852813720703125}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.937313437461853},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6440847516059875},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.6379976272583008},{"id":"https://openalex.org/C168773769","wikidata":"https://www.wikidata.org/wiki/Q1350299","display_name":"Satisfiability","level":2,"score":0.6100603342056274},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5383369326591492},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5063427686691284},{"id":"https://openalex.org/C16221470","wikidata":"https://www.wikidata.org/wiki/Q846564","display_name":"Conjunctive normal form","level":2,"score":0.5018599033355713},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.49692776799201965},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.45395252108573914},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3734513223171234},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.29166939854621887},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2563919126987457},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15248051285743713},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10852813720703125},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/ddecs.2009.5012096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.144.2149","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.144.2149","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.informatik.uni-bremen.de/agra/doc/work/09tuz_fast_untestability.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.522.8275","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.522.8275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.informatik.uni-bremen.de/agra/doc/konf/09_ddecs.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1518705996","https://openalex.org/W2044560939","https://openalex.org/W2057361103","https://openalex.org/W2075959177","https://openalex.org/W2107470986","https://openalex.org/W2111994103","https://openalex.org/W2112886407","https://openalex.org/W2118289054","https://openalex.org/W2119241964","https://openalex.org/W2124618076","https://openalex.org/W2133527541","https://openalex.org/W2135613306","https://openalex.org/W2142785340","https://openalex.org/W2146148755","https://openalex.org/W2149107969","https://openalex.org/W2160444875","https://openalex.org/W2162226695","https://openalex.org/W2169468177","https://openalex.org/W2173124859","https://openalex.org/W4247585869","https://openalex.org/W4251370346","https://openalex.org/W6679878532"],"related_works":["https://openalex.org/W2480084299","https://openalex.org/W2014111643","https://openalex.org/W3107131366","https://openalex.org/W2091617677","https://openalex.org/W2571882453","https://openalex.org/W2076399409","https://openalex.org/W4211028879","https://openalex.org/W3128448798","https://openalex.org/W2408080066","https://openalex.org/W1608133301"],"abstract_inverted_index":{"Automatic":[0],"Test":[1],"Pattern":[2],"Generation":[3],"(ATPG)":[4],"based":[5],"on":[6,25,120],"Boolean":[7],"satisfiability":[8],"(SAT)":[9],"has":[10],"been":[11],"shown":[12,117],"to":[13,18],"be":[14],"a":[15,51,84],"beneficial":[16],"complement":[17],"traditional":[19],"ATPG":[20,38,48,108],"techniques.":[21],"SAT":[22,61,98],"solvers":[23],"work":[24],"instances":[26],"given":[27],"in":[28],"Conjunctive":[29],"Normal":[30],"Form":[31],"(CNF).":[32],"The":[33,110],"required":[34],"transformation":[35],"of":[36,46,54,92,105,112],"the":[37,55,60,64,69,90,97,103,106,113],"problem":[39],"into":[40],"CNF":[41],"is":[42,63,72,116],"one":[43],"main":[44,66],"part":[45],"SAT-based":[47],"and":[49],"needs":[50],"significant":[52],"portion":[53],"overall":[56],"run":[57],"time.":[58],"Solving":[59],"instance":[62,99],"other":[65],"part.":[67],"Here,":[68],"time":[70],"needed":[71],"often":[73],"negligible":[74],"-":[75],"especially":[76],"for":[77],"easy-to-classify":[78],"untestable":[79,93],"faults.":[80],"This":[81,101],"paper":[82],"presents":[83],"preprocessing":[85],"technique":[86],"that":[87],"speeds":[88],"up":[89],"classification":[91],"faults":[94],"by":[95,118],"accelerating":[96],"generation.":[100],"increases":[102],"robustness":[104],"entire":[107],"process.":[109],"efficiency":[111],"proposed":[114],"method":[115],"experiments":[119],"large":[121],"industrial":[122],"designs.":[123]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}