{"id":"https://openalex.org/W2117030060","doi":"https://doi.org/10.1109/ddecs.2009.5012089","title":"Investigating the linearity of MOSFET-only switched-capacitor ΔΣ modulators under low-voltage condition","display_name":"Investigating the linearity of MOSFET-only switched-capacitor ΔΣ modulators under low-voltage condition","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2117030060","doi":"https://doi.org/10.1109/ddecs.2009.5012089","mag":"2117030060"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2009.5012089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036851315","display_name":"Farhad A. Parsan","orcid":null},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Farhad Alibeygi Parsan","raw_affiliation_strings":["Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]},{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052497282","display_name":"Ahmad Ayatollahi","orcid":"https://orcid.org/0000-0003-1005-9009"},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ahmad Ayatollahi","raw_affiliation_strings":["Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]},{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008957089","display_name":"Adib Abrishamifar","orcid":"https://orcid.org/0000-0001-6117-8839"},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Adib Abrishamifar","raw_affiliation_strings":["Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]},{"raw_affiliation_string":"Electrical Engineering Department, Iran University of Science and Technology, IUST, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036851315"],"corresponding_institution_ids":["https://openalex.org/I67009956"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.16500994,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"51","issue":null,"first_page":"12","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.8209691643714905},{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.7978956699371338},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5555459260940552},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5353679060935974},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4677595794200897},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46304231882095337},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4289088249206543},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4025081694126129},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2549087107181549},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1360880732536316}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.8209691643714905},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.7978956699371338},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5555459260940552},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5353679060935974},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4677595794200897},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46304231882095337},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4289088249206543},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4025081694126129},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2549087107181549},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1360880732536316}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2009.5012089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W605564925","https://openalex.org/W1535765378","https://openalex.org/W1571697891","https://openalex.org/W1598172883","https://openalex.org/W1881763088","https://openalex.org/W2102966428","https://openalex.org/W2171990329","https://openalex.org/W2499011794","https://openalex.org/W2985726535"],"related_works":["https://openalex.org/W2023858428","https://openalex.org/W4247324130","https://openalex.org/W4398198689","https://openalex.org/W2354365353","https://openalex.org/W2538259895","https://openalex.org/W2811287415","https://openalex.org/W2291633415","https://openalex.org/W2103923652","https://openalex.org/W2124313625","https://openalex.org/W2356735381"],"abstract_inverted_index":{"Effect":[0],"of":[1,5,12,70],"asymmetric":[2,44,83],"operating":[3],"condition":[4,84],"depletion-mode":[6,56],"MOS":[7,39,57],"capacitors":[8,48,58],"on":[9,47,74],"the":[10,24,52,55,88],"linearity":[11],"MOSFET-only":[13],"switched-capacitor":[14,22],"DeltaSigma":[15,76,94],"modulators":[16],"is":[17,79,85,97],"investigated.":[18],"In":[19],"very":[20],"low-voltage":[21],"circuits":[23],"opamp":[25],"input":[26],"and":[27,87],"output":[28],"common-mode":[29],"levels":[30],"are":[31,59,90],"separated":[32],"to":[33],"provide":[34],"maximum":[35],"overdrive":[36],"voltage":[37,45],"for":[38],"switches.":[40],"This":[41],"causes":[42],"an":[43,82],"drop":[46],"during":[49],"operation.":[50],"On":[51],"other":[53],"hand,":[54],"most":[60],"linear":[61],"when":[62],"operated":[63,80,98],"under":[64,81,99],"a":[65,75,93,100],"symmetric":[66,101],"condition.":[67,102],"The":[68],"effect":[69],"this":[71],"increased":[72],"nonlinearity":[73],"modulator":[77,95],"which":[78,96],"simulated":[86],"results":[89],"compared":[91],"with":[92]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}