{"id":"https://openalex.org/W2127755313","doi":"https://doi.org/10.1109/ddecs.2009.5012086","title":"Challenges for test and design for test","display_name":"Challenges for test and design for test","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2127755313","doi":"https://doi.org/10.1109/ddecs.2009.5012086","mag":"2127755313"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2009.5012086","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012086","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082035154","display_name":"Anton Chichkov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]},{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["BE","US"],"is_corresponding":true,"raw_author_name":"Anton Chichkov","raw_affiliation_strings":["On Semiconductor Corporation, Oudenaarde, Belgium","On Semiconductor Corp, Oudenaarde, Belgium#TAB#"],"affiliations":[{"raw_affiliation_string":"On Semiconductor Corporation, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"On Semiconductor Corp, Oudenaarde, Belgium#TAB#","institution_ids":["https://openalex.org/I100625452"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5082035154"],"corresponding_institution_ids":["https://openalex.org/I100625452","https://openalex.org/I4210110772"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.11043895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"3","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9724000096321106,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9189000129699707,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7913579940795898},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5861571431159973},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5591790676116943},{"id":"https://openalex.org/keywords/test-design","display_name":"Test design","score":0.5169586539268494},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.509802520275116},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.4980311393737793},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.43295663595199585},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.3222178816795349},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2966293692588806},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09134462475776672},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.08790120482444763}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7913579940795898},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5861571431159973},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5591790676116943},{"id":"https://openalex.org/C11017329","wikidata":"https://www.wikidata.org/wiki/Q7705763","display_name":"Test design","level":3,"score":0.5169586539268494},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.509802520275116},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.4980311393737793},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.43295663595199585},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.3222178816795349},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2966293692588806},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09134462475776672},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.08790120482444763},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2009.5012086","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2009.5012086","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"If":[0],"test":[1,31,43,63,111,122,147,163,183],"is":[2,27,57,66,86,117,141],"mentioned":[3],"normally":[4],"there":[5,65,157],"are":[6,19,23],"several":[7],"remarks":[8],"that":[9,58,74,93],"have":[10],"been":[11],"repeated":[12],"for":[13,110],"the":[14,30,36,39,76,80,95,106,119,138,143,152,160,182],"last":[15,174],"20":[16],"years.":[17],"ICs":[18],"too":[20,24,28,33],"fast,":[21],"patterns":[22],"big,":[25],"testing":[26],"slow,":[29],"development":[32],"costly.":[34],"Although,":[35],"advance":[37],"of":[38,62,69,97,145,154,162],"technology":[40,70,92],"has":[41],"improved":[42],"in":[44,159,181],"general,":[45],"these":[46],"statements":[47],"seems":[48],"to":[49],"prevail":[50],"and":[51,71,100,125,130,134,149,169],"sound":[52],"still":[53],"valid.":[54],"One":[55],"reason":[56],"on":[59,127,137],"every":[60],"improvement":[61,68],"strategies":[64],"also":[67],"design":[72,132,135],"strategy":[73],"keeps":[75,94],"gap":[77,120],"open.":[78],"On":[79],"other":[81],"hand":[82],"ATE":[83],"equipment":[84,126,148],"inevitably":[85],"build":[87],"with":[88],"one":[89,128],"generation":[90],"older":[91],"challenge":[96],"speed":[98],"noise":[99],"complexity":[101],"alive.":[102],"In":[103],"this":[104],"presentation":[105],"following":[107],"few":[108],"challenges":[109],"will":[112],"be":[113],"further":[114],"discussed.":[115],"How":[116,140],"evolving":[118,142],"between":[121],"methods":[123],"tools":[124,136],"side":[129],"technology,":[131],"methodology":[133],"other?":[139],"cost":[144,153,161],"production":[146],"as":[150],"consequence":[151],"test?":[155],"Is":[156],"change":[158],"development?":[164],"What":[165],"about":[166,179],"high":[167],"quality":[168],"reliability":[170],"application":[171],"testing?":[172],"And":[173],"but":[175],"not":[176],"least":[177],"what":[178],"research":[180],"domain":[184],"during":[185],"economic":[186],"crisis.":[187]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}