{"id":"https://openalex.org/W2108923520","doi":"https://doi.org/10.1109/ddecs.2008.4538810","title":"SoC Symbolic Simulation: a case study on delay fault testing","display_name":"SoC Symbolic Simulation: a case study on delay fault testing","publication_year":2008,"publication_date":"2008-04-01","ids":{"openalex":"https://openalex.org/W2108923520","doi":"https://doi.org/10.1109/ddecs.2008.4538810","mag":"2108923520"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2008.4538810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bosio","raw_affiliation_strings":["L.I.R.M.M, Montpellier, France","LIRMM, Montpellier, FR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, Montpellier, FR","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["L.I.R.M.M, Montpellier, France","LIRMM, Montpellier, FR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, Montpellier, FR","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043022228","display_name":"S. Pravossoudovich","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Pravossoudovich","raw_affiliation_strings":["L.I.R.M.M, Montpellier, France","LIRMM, Montpellier, FR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, Montpellier, FR","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Bernardi","raw_affiliation_strings":["Politecnico di Torino I, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Torino I, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1273,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.7655914,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7411142587661743},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5353007912635803},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5050786137580872},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.49779844284057617},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.48590603470802307},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4671074151992798},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.46082744002342224},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4567711055278778},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4349942207336426},{"id":"https://openalex.org/keywords/symbolic-execution","display_name":"Symbolic execution","score":0.43376266956329346},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42133650183677673},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4186098575592041},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4129989743232727},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.39142799377441406},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2660582661628723},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13001495599746704},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08794105052947998}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7411142587661743},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5353007912635803},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5050786137580872},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.49779844284057617},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.48590603470802307},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4671074151992798},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.46082744002342224},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4567711055278778},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4349942207336426},{"id":"https://openalex.org/C2779639559","wikidata":"https://www.wikidata.org/wiki/Q7661178","display_name":"Symbolic execution","level":3,"score":0.43376266956329346},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42133650183677673},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4186098575592041},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4129989743232727},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.39142799377441406},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2660582661628723},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13001495599746704},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08794105052947998},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ddecs.2008.4538810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-00278340v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00278340","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ui.savba.sk/DDECS2008/","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1978853990","https://openalex.org/W2002006950","https://openalex.org/W2064340169","https://openalex.org/W2102127226","https://openalex.org/W2114932664","https://openalex.org/W2139247671","https://openalex.org/W2144375411","https://openalex.org/W2146489916","https://openalex.org/W2155341425","https://openalex.org/W2161329778","https://openalex.org/W3136299071"],"related_works":["https://openalex.org/W1600260729","https://openalex.org/W2801797726","https://openalex.org/W3216514701","https://openalex.org/W2364496964","https://openalex.org/W2946207961","https://openalex.org/W2914996832","https://openalex.org/W2054112973","https://openalex.org/W4234532445","https://openalex.org/W622360268","https://openalex.org/W2742111403"],"abstract_inverted_index":{"Functional":[0],"test":[1,112],"methodologies":[2],"such":[3],"as":[4],"software-based":[5,29],"self-test":[6],"appear":[7],"to":[8,61,71,85],"suit":[9],"well":[10],"SoC":[11,74],"delay":[12,32,68],"fault":[13,69],"testing.":[14,55],"State-of-the-art":[15],"solutions":[16],"in":[17,42,48,83],"this":[18,35],"topic":[19],"are":[20,59],"quite":[21],"far":[22],"from":[23],"maturity":[24],"and":[25,40,65,88,105],"few":[26],"works":[27],"consider":[28,97],"diagnosis":[30],"for":[31,46,108],"faults.":[33],"In":[34],"paper":[36],"we":[37,96],"evaluate":[38],"benefits":[39],"costs":[41],"using":[43],"symbolic":[44,79],"simulation":[45,57],"SoCs,":[47],"particular":[49],"focusing":[50],"on":[51],"embedded":[52],"processor":[53],"core":[54,103],"Symbolic":[56],"principles":[58],"key":[60],"enable":[62],"fast":[63],"analysis":[64],"speed":[66],"up":[67],"diagnosis;":[70],"cope":[72],"with":[73],"behavior,":[75],"the":[76],"traditional":[77],"6-valued":[78],"algebra":[80],"was":[81],"expanded":[82],"order":[84],"tackle":[86],"X":[87],"Z":[89],"logic":[90],"states.":[91],"As":[92],"a":[93,98],"case":[94],"study":[95],"large":[99],"design":[100],"including":[101],"many":[102],"types":[104],"suitable":[106],"DFT":[107],"performing":[109],"high":[110],"quality":[111],"without":[113],"scan":[114],"chains.":[115]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}