{"id":"https://openalex.org/W2110181702","doi":"https://doi.org/10.1109/ddecs.2008.4538805","title":"Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation","display_name":"Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation","publication_year":2008,"publication_date":"2008-04-01","ids":{"openalex":"https://openalex.org/W2110181702","doi":"https://doi.org/10.1109/ddecs.2008.4538805","mag":"2110181702"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2008.4538805","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538805","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018694023","display_name":"Juraj Brenku\u015d","orcid":null},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"J. Brenkus","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","Dept. of Microelectron., Slovak Univ. of Technol., Bratislava"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]},{"raw_affiliation_string":"Dept. of Microelectron., Slovak Univ. of Technol., Bratislava","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030204131","display_name":"Viera Stopjakov\u00e1","orcid":"https://orcid.org/0000-0002-0010-8965"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"V. Stopjakova","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","Dept. of Microelectron., Slovak Univ. of Technol., Bratislava"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]},{"raw_affiliation_string":"Dept. of Microelectron., Slovak Univ. of Technol., Bratislava","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037645435","display_name":"Jozef Mihalov","orcid":null},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"J. Mihalov","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","Dept. of Microelectron., Slovak Univ. of Technol., Bratislava"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]},{"raw_affiliation_string":"Dept. of Microelectron., Slovak Univ. of Technol., Bratislava","institution_ids":["https://openalex.org/I110757952"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I110757952"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21785441,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6142961382865906},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5747430324554443},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5338165760040283},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5278176069259644},{"id":"https://openalex.org/keywords/buffer-amplifier","display_name":"Buffer amplifier","score":0.5174880027770996},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4757780134677887},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.46272459626197815},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4501292407512665},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.44361382722854614},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.43391844630241394},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.4336530566215515},{"id":"https://openalex.org/keywords/circuit-extraction","display_name":"Circuit extraction","score":0.4263416528701782},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.419106662273407},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29826757311820984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2774047255516052},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.24224239587783813}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6142961382865906},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5747430324554443},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5338165760040283},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5278176069259644},{"id":"https://openalex.org/C127749002","wikidata":"https://www.wikidata.org/wiki/Q978470","display_name":"Buffer amplifier","level":4,"score":0.5174880027770996},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4757780134677887},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46272459626197815},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4501292407512665},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.44361382722854614},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.43391844630241394},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.4336530566215515},{"id":"https://openalex.org/C26490066","wikidata":"https://www.wikidata.org/wiki/Q17006835","display_name":"Circuit extraction","level":4,"score":0.4263416528701782},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.419106662273407},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29826757311820984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2774047255516052},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.24224239587783813},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2008.4538805","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538805","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1507681276","https://openalex.org/W2077251002","https://openalex.org/W2097832094","https://openalex.org/W2119157332","https://openalex.org/W2151393930","https://openalex.org/W2153610276","https://openalex.org/W2163598532","https://openalex.org/W4246714199"],"related_works":["https://openalex.org/W2098366763","https://openalex.org/W2101187277","https://openalex.org/W4247677020","https://openalex.org/W2152740599","https://openalex.org/W2131925274","https://openalex.org/W2073258809","https://openalex.org/W4210982822","https://openalex.org/W2369354612","https://openalex.org/W2612939591","https://openalex.org/W2389085077"],"abstract_inverted_index":{"An":[0],"experimental":[1],"analog":[2],"design":[3],"for":[4],"parametric":[5],"test":[6,27],"methods":[7],"efficiency":[8],"evaluation":[9],"is":[10,14,29,44,57],"presented.":[11],"The":[12,24,38,76],"circuit":[13,25,43],"implemented":[15,35],"in":[16],"a":[17,30,47,55,72,83],"standard":[18],"0.35\u03bcm":[19],"CMOS":[20],"process":[21],"by":[22,46],"AMS.":[23],"under":[26],"(CUT)":[28],"two-stage":[31],"operational":[32],"amplifier":[33],"with":[34],"addressable":[36],"faults.":[37],"control":[39],"of":[40,66],"the":[41,60,64,69,88],"overall":[42],"ensured":[45],"7-bit":[48],"shift":[49],"register.":[50],"For":[51],"higher":[52],"loading":[53],"capability":[54],"buffer":[56],"connected":[58,81],"to":[59,82],"output.":[61],"To":[62],"preserve":[63],"possibility":[65],"voltage":[67],"ramping,":[68],"CUT":[70,77],"has":[71],"separated":[73],"supply":[74],"rail.":[75],"can":[78],"be":[79],"also":[80],"feedback":[84],"network":[85],"integrated":[86],"on":[87],"chip,":[89],"and":[90],"thus,":[91],"turned":[92],"into":[93],"an":[94],"oscillator.":[95]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}