{"id":"https://openalex.org/W2151527553","doi":"https://doi.org/10.1109/ddecs.2008.4538802","title":"Excitation optimization in fault diagnosis of analog electronic circuits","display_name":"Excitation optimization in fault diagnosis of analog electronic circuits","publication_year":2008,"publication_date":"2008-04-01","ids":{"openalex":"https://openalex.org/W2151527553","doi":"https://doi.org/10.1109/ddecs.2008.4538802","mag":"2151527553"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2008.4538802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080418501","display_name":"Lukas Chruszczyk","orcid":"https://orcid.org/0000-0001-9812-8851"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"L. Chruszczyk","raw_affiliation_strings":["Institute Of Electronics, Silesian University of Technology, Gliwice, Poland"],"affiliations":[{"raw_affiliation_string":"Institute Of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041953192","display_name":"Jerzy Rutkowski","orcid":null},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Rutkowski","raw_affiliation_strings":["Institute Of Electronics, Silesian University of Technology, Gliwice, Poland"],"affiliations":[{"raw_affiliation_string":"Institute Of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5080418501"],"corresponding_institution_ids":["https://openalex.org/I119004910"],"apc_list":null,"apc_paid":null,"fwci":0.6932,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.77477407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"61","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9692000150680542,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6387388706207275},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6257684826850891},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6246110796928406},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.6207143068313599},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6039060354232788},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5970178842544556},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5402403473854065},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5361874103546143},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.5201559662818909},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5152149796485901},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49250850081443787},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.48122429847717285},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.47670668363571167},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3572341799736023},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.31587734818458557},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2667982578277588},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16117653250694275},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11139100790023804}],"concepts":[{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6387388706207275},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6257684826850891},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6246110796928406},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.6207143068313599},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6039060354232788},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5970178842544556},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5402403473854065},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5361874103546143},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.5201559662818909},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5152149796485901},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49250850081443787},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48122429847717285},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.47670668363571167},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3572341799736023},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.31587734818458557},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2667982578277588},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16117653250694275},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11139100790023804},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2008.4538802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2008.4538802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1561029587","https://openalex.org/W1924227955","https://openalex.org/W2151554678","https://openalex.org/W3011460294"],"related_works":["https://openalex.org/W2382174632","https://openalex.org/W2129959498","https://openalex.org/W2784060934","https://openalex.org/W2902714807","https://openalex.org/W2537489131","https://openalex.org/W2046633342","https://openalex.org/W2394084632","https://openalex.org/W2358293514","https://openalex.org/W2059273319","https://openalex.org/W2077021924"],"abstract_inverted_index":{"This":[0],"article":[1],"describes":[2],"optimization":[3],"of":[4,9,18,42,55],"excitation":[5,68],"signal":[6],"for":[7],"purpose":[8],"fault":[10,43],"diagnosis.":[11],"The":[12,25],"goal":[13],"is":[14],"to":[15],"enhance":[16],"efficiency":[17,45],"faults":[19],"detection":[20,44],"in":[21],"analog":[22],"electronic":[23],"circuits.":[24],"method":[26],"has":[27,46],"been":[28,47,61],"verified":[29],"on":[30],"cases":[31],"with":[32,49,63],"single":[33],"hard":[34],"(catastrophic)":[35],"and":[36,69],"soft":[37],"(parametric)":[38],"faults.":[39],"Further":[40],"enhancement":[41],"achieved":[48],"additional":[50],"feature":[51,72],"extractio":[52],"by":[53],"means":[54],"wavelet":[56],"transform.":[57],"Obtained":[58],"results":[59],"have":[60],"compared":[62],"diagnosis":[64,70],"using":[65],"step":[66],"function":[67],"without":[71],"extraction.":[73]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}