{"id":"https://openalex.org/W2107784707","doi":"https://doi.org/10.1109/ddecs.2007.4295270","title":"A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories","display_name":"A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2107784707","doi":"https://doi.org/10.1109/ddecs.2007.4295270","mag":"2107784707"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2007.4295270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2007.4295270","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061611664","display_name":"G. Harutunyan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Harutunyan","raw_affiliation_strings":["Virage Logic, Yerevan, Armenia","Virage Logic, Yerevan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virage Logic, Yerevan, Armenia","institution_ids":[]},{"raw_affiliation_string":"Virage Logic, Yerevan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017670571","display_name":"V.A. Vardanian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V.A. Vardanian","raw_affiliation_strings":["Virage Logic, Yerevan, Armenia","Virage Logic, Yerevan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virage Logic, Yerevan, Armenia","institution_ids":[]},{"raw_affiliation_string":"Virage Logic, Yerevan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108606295","display_name":"Y. Zorian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Zorian","raw_affiliation_strings":["Virage Logic, Fremont, CA, USA","Virage Logic, 47100 Bayside Parkway, Fremont, CA, 94538"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virage Logic, Fremont, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Virage Logic, 47100 Bayside Parkway, Fremont, CA, 94538","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2107,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.41600344,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7005428075790405},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.6936719417572021},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6781260967254639},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.6622832417488098},{"id":"https://openalex.org/keywords/random-access","display_name":"Random access","score":0.6319578886032104},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5080828666687012},{"id":"https://openalex.org/keywords/simple-algorithm","display_name":"SIMPLE algorithm","score":0.45568206906318665},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.43341368436813354},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.41712701320648193},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08790820837020874}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7005428075790405},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.6936719417572021},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6781260967254639},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.6622832417488098},{"id":"https://openalex.org/C101722063","wikidata":"https://www.wikidata.org/wiki/Q218825","display_name":"Random access","level":2,"score":0.6319578886032104},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5080828666687012},{"id":"https://openalex.org/C97542219","wikidata":"https://www.wikidata.org/wiki/Q497863","display_name":"SIMPLE algorithm","level":2,"score":0.45568206906318665},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.43341368436813354},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.41712701320648193},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08790820837020874},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2007.4295270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2007.4295270","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W2100287799","https://openalex.org/W2104677646","https://openalex.org/W2105539905","https://openalex.org/W2106935654","https://openalex.org/W2110637318","https://openalex.org/W2115521620","https://openalex.org/W2120330602","https://openalex.org/W2157672623","https://openalex.org/W4247767635","https://openalex.org/W6675503376","https://openalex.org/W6682880721"],"related_works":["https://openalex.org/W3133183159","https://openalex.org/W2952222336","https://openalex.org/W3117544412","https://openalex.org/W4297872561","https://openalex.org/W2116633494","https://openalex.org/W2951701061","https://openalex.org/W2888733329","https://openalex.org/W2767687907","https://openalex.org/W2899709827","https://openalex.org/W2740103453"],"abstract_inverted_index":{"In":[0,35,56,79],"this":[1],"paper,":[2],"we":[3,62,82],"propose":[4,63],"a":[5,38,64,84,88],"multiphase":[6],"March-like":[7],"algorithm":[8,40,66,86],"for":[9,46,59,70,91],"partial":[10,47],"and":[11,53],"full":[12,92],"diagnosis":[13,48,93],"of":[14,28,31,41,67,72,75,87,94],"all":[15,95],"simple":[16,96],"static":[17,20,97],"faults":[18],"in":[19],"random":[21],"access":[22],"memories,":[23],"as":[24,26],"well":[25],"location":[27,71],"the":[29,32,73,76],"position":[30,74],"failed":[33,77],"bit.":[34,78],"phase":[36,57],"1,":[37],"march-like":[39,65,85],"complexity":[42,68,90],"2N":[43],"is":[44],"proposed":[45],"to":[49],"differentiate":[50],"between":[51],"single-cell":[52],"two-cell":[54,60],"faults.":[55,98],"2,":[58],"faults,":[61],"41N":[69],"Phase":[80],"3,":[81],"used":[83],"constant":[89]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}