{"id":"https://openalex.org/W1611480057","doi":"https://doi.org/10.1109/ddecs.2006.1649611","title":"Generation and Propagation of Single Event Transients in CMOS Circuits","display_name":"Generation and Propagation of Single Event Transients in CMOS Circuits","publication_year":2006,"publication_date":"2006-07-10","ids":{"openalex":"https://openalex.org/W1611480057","doi":"https://doi.org/10.1109/ddecs.2006.1649611","mag":"1611480057"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2006.1649611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2006.1649611","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"G.I. Wirth","raw_affiliation_strings":["University of RGS, Guaiba, Rio Grande do Sul, Brazil","UERGS-State, RGS Univ., Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of RGS, Guaiba, Rio Grande do Sul, Brazil","institution_ids":[]},{"raw_affiliation_string":"UERGS-State, RGS Univ., Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111822468","display_name":"Michele G. Vieira","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M.G. Vieira","raw_affiliation_strings":["University of RGS, Guaiba, Rio Grande do Sul, Brazil","UERGS-State, RGS Univ., Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of RGS, Guaiba, Rio Grande do Sul, Brazil","institution_ids":[]},{"raw_affiliation_string":"UERGS-State, RGS Univ., Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014280371","display_name":"Egas Henes Neto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"E.H. Neto","raw_affiliation_strings":["University of RGS, Guaiba, Rio Grande do Sul, Brazil","UERGS-State, RGS Univ., Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of RGS, Guaiba, Rio Grande do Sul, Brazil","institution_ids":[]},{"raw_affiliation_string":"UERGS-State, RGS Univ., Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F.L. Kastensmidt","raw_affiliation_strings":["Inform\u00e1tica-UFRGS, Porto Alegre, Rio Grande do Sul, Brazil","[Inform\u00e1tica-UFRGS, Porto Alegre, Rio Grande do Sul, Brazil]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inform\u00e1tica-UFRGS, Porto Alegre, Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"[Inform\u00e1tica-UFRGS, Porto Alegre, Rio Grande do Sul, Brazil]","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5226,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.54504313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"51","issue":null,"first_page":"196","last_page":"201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7012321949005127},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6236114501953125},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6180834770202637},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5681139826774597},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5496436953544617},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5398648381233215},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.5227689743041992},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5115433931350708},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.48806798458099365},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4242319166660309},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2972974181175232},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28232988715171814}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7012321949005127},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6236114501953125},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6180834770202637},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5681139826774597},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5496436953544617},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5398648381233215},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.5227689743041992},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5115433931350708},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.48806798458099365},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4242319166660309},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2972974181175232},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28232988715171814},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2006.1649611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2006.1649611","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2006097283","https://openalex.org/W2030501553","https://openalex.org/W2033346530","https://openalex.org/W2063837668","https://openalex.org/W2098274007","https://openalex.org/W2106771474","https://openalex.org/W2132387933","https://openalex.org/W2153130122","https://openalex.org/W2159087151","https://openalex.org/W2169213530"],"related_works":["https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2170979950","https://openalex.org/W2572576974","https://openalex.org/W1900707063","https://openalex.org/W3008786049","https://openalex.org/W98453623","https://openalex.org/W2039177842","https://openalex.org/W2081082331","https://openalex.org/W2136396860"],"abstract_inverted_index":{"The":[0,31,55,102],"generation":[1,26],"and":[2,19,27],"the":[3,34,38,48,72,82],"propagation":[4,28],"of":[5,37,40,81,91,116],"radiation":[6],"induced":[7],"single":[8],"event":[9],"transients":[10],"(SET)":[11],"in":[12],"CMOS":[13],"circuits":[14],"are":[15],"evaluated.":[16],"An":[17],"accurate":[18],"computer":[20],"efficient":[21],"analytical":[22],"model":[23,32,56],"for":[24,107],"SET":[25],"is":[29,99,105],"proposed.":[30],"allows":[33],"rapid":[35],"determination":[36],"sensitivity":[39,118],"any":[41],"MOS":[42],"circuit":[43,52,117],"node":[44],"to":[45,50,71,112,119],"SET,":[46],"without":[47],"need":[49],"run":[51],"level":[53],"simulations.":[54],"predicts":[57],"whether":[58],"or":[59,76],"not":[60],"a":[61,65,96],"particle":[62],"hit":[63],"generates":[64],"transient":[66,83],"pulse":[67,84],"which":[68],"may":[69],"propagate":[70],"next":[73],"logic":[74,92],"gate":[75],"memory":[77,97],"element.":[78],"Electrical":[79],"masking":[80],"as":[85],"it":[86,94],"propagates":[87],"through":[88],"each":[89],"stage":[90],"until":[93],"reaches":[95],"element":[98],"also":[100],"modeled.":[101],"proposed":[103],"approach":[104],"suitable":[106],"integration":[108],"into":[109],"CAD-tools,":[110],"intending":[111],"make":[113],"automated":[114],"evaluation":[115],"SEU":[120],"possible":[121]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}