{"id":"https://openalex.org/W1875053419","doi":"https://doi.org/10.1109/ddecs.2006.1649578","title":"Die attach quality testing by fully contact-less measurement method","display_name":"Die attach quality testing by fully contact-less measurement method","publication_year":2006,"publication_date":"2006-07-10","ids":{"openalex":"https://openalex.org/W1875053419","doi":"https://doi.org/10.1109/ddecs.2006.1649578","mag":"1875053419"},"language":"en","primary_location":{"id":"doi:10.1109/ddecs.2006.1649578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2006.1649578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015047710","display_name":"Gerg\u0151 Bogn\u00e1r","orcid":"https://orcid.org/0000-0001-7818-5760"},"institutions":[{"id":"https://openalex.org/I29770179","display_name":"Budapest University of Technology and Economics","ror":"https://ror.org/02w42ss30","country_code":"HU","type":"education","lineage":["https://openalex.org/I29770179"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"G. Bognar","raw_affiliation_strings":["Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","Department of Electron Devices, Budapest University of Technology and Economics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","institution_ids":["https://openalex.org/I29770179"]},{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics","institution_ids":["https://openalex.org/I29770179"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032295070","display_name":"Gy. Horv\u00e1th","orcid":"https://orcid.org/0000-0002-0286-2005"},"institutions":[{"id":"https://openalex.org/I29770179","display_name":"Budapest University of Technology and Economics","ror":"https://ror.org/02w42ss30","country_code":"HU","type":"education","lineage":["https://openalex.org/I29770179"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"G. Horvath","raw_affiliation_strings":["Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","Department of Electron Devices, Budapest University of Technology and Economics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","institution_ids":["https://openalex.org/I29770179"]},{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics","institution_ids":["https://openalex.org/I29770179"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080940092","display_name":"Zolt\u00e1n Sz\u0171cs","orcid":"https://orcid.org/0000-0003-0581-2975"},"institutions":[{"id":"https://openalex.org/I29770179","display_name":"Budapest University of Technology and Economics","ror":"https://ror.org/02w42ss30","country_code":"HU","type":"education","lineage":["https://openalex.org/I29770179"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"Z. Szucs","raw_affiliation_strings":["Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","Department of Electron Devices, Budapest University of Technology and Economics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","institution_ids":["https://openalex.org/I29770179"]},{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics","institution_ids":["https://openalex.org/I29770179"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102791972","display_name":"V. Sz\u00e9kely","orcid":null},"institutions":[{"id":"https://openalex.org/I29770179","display_name":"Budapest University of Technology and Economics","ror":"https://ror.org/02w42ss30","country_code":"HU","type":"education","lineage":["https://openalex.org/I29770179"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"V. Szekely","raw_affiliation_strings":["Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","Department of Electron Devices, Budapest University of Technology and Economics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary","institution_ids":["https://openalex.org/I29770179"]},{"raw_affiliation_string":"Department of Electron Devices, Budapest University of Technology and Economics","institution_ids":["https://openalex.org/I29770179"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I29770179"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11544974,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"510","issue":null,"first_page":"79","last_page":"80"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stylus","display_name":"Stylus","score":0.9135327339172363},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.6808779835700989},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.6176903247833252},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5004067420959473},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.48837345838546753},{"id":"https://openalex.org/keywords/semiconductor-laser-theory","display_name":"Semiconductor laser theory","score":0.4864892363548279},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4688250720500946},{"id":"https://openalex.org/keywords/thermal-contact","display_name":"Thermal contact","score":0.44697463512420654},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.4446497857570648},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.4389420747756958},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3104017972946167},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11661657691001892},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.11204618215560913}],"concepts":[{"id":"https://openalex.org/C164086593","wikidata":"https://www.wikidata.org/wiki/Q1227035","display_name":"Stylus","level":2,"score":0.9135327339172363},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.6808779835700989},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6176903247833252},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5004067420959473},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.48837345838546753},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.4864892363548279},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4688250720500946},{"id":"https://openalex.org/C142014798","wikidata":"https://www.wikidata.org/wiki/Q7783037","display_name":"Thermal contact","level":3,"score":0.44697463512420654},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4446497857570648},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.4389420747756958},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3104017972946167},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11661657691001892},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.11204618215560913},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ddecs.2006.1649578","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ddecs.2006.1649578","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2159697803","https://openalex.org/W2187257790","https://openalex.org/W6686702507"],"related_works":["https://openalex.org/W1514950410","https://openalex.org/W4310506326","https://openalex.org/W2047065129","https://openalex.org/W2401480642","https://openalex.org/W3022681545","https://openalex.org/W2484086337","https://openalex.org/W2072361192","https://openalex.org/W2499398221","https://openalex.org/W2365121631","https://openalex.org/W2076571966"],"abstract_inverted_index":{"The":[0],"paper":[1],"presents":[2],"a":[3],"novel,":[4],"fully":[5],"contact-less":[6],"method":[7,51],"for":[8],"detecting":[9],"die":[10],"attach":[11],"problems":[12],"of":[13],"semiconductor":[14],"devices":[15],"by":[16,36],"measuring":[17,26],"the":[18,32,41,46,52],"dilatation":[19,34],"resulting":[20],"from":[21],"thermal":[22,33],"expansion.":[23],"Laser":[24],"interferometer":[25],"system":[27],"was":[28],"used":[29],"to":[30],"measure":[31],"caused":[35],"infrared":[37],"radiation":[38],"directed":[39],"onto":[40],"measured":[42],"structure.":[43],"By":[44],"using":[45],"contact":[47],"based":[48],"stylus":[49],"measurement":[50],"previously":[53],"got":[54],"results":[55],"have":[56],"been":[57],"cross-verified":[58]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}