{"id":"https://openalex.org/W2940128495","doi":"https://doi.org/10.1109/dcis.2018.8681485","title":"Single Event Transient injection in large mixed-signal circuits","display_name":"Single Event Transient injection in large mixed-signal circuits","publication_year":2018,"publication_date":"2018-11-01","ids":{"openalex":"https://openalex.org/W2940128495","doi":"https://doi.org/10.1109/dcis.2018.8681485","mag":"2940128495"},"language":"en","primary_location":{"id":"doi:10.1109/dcis.2018.8681485","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dcis.2018.8681485","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Conference on Design of Circuits and Integrated Systems (DCIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020547467","display_name":"Valent\u00edn Guti\u00e9rrez","orcid":"https://orcid.org/0000-0003-1902-4750"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Valentin Gutierrez","raw_affiliation_strings":["Instituto de Microlectr\u00f3nica de Sevilla, Universidad de Sevilla, Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microlectr\u00f3nica de Sevilla, Universidad de Sevilla, Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006780064","display_name":"Gildas L\u00e9ger","orcid":"https://orcid.org/0000-0002-2310-7906"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Gildas Leger","raw_affiliation_strings":["Instituto de Microlectr\u00f3nica de Sevilla, Universidad de Sevilla, Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microlectr\u00f3nica de Sevilla, Universidad de Sevilla, Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5020547467"],"corresponding_institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"],"apc_list":null,"apc_paid":null,"fwci":0.3863,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65347062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.7301912307739258},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6490659117698669},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6268401145935059},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6173439025878906},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5129134654998779},{"id":"https://openalex.org/keywords/leverage","display_name":"Leverage (statistics)","score":0.45545050501823425},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.449301540851593},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.4486010670661926},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4176117181777954},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.38184404373168945},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.28572726249694824},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26279473304748535},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2438797950744629},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12661978602409363},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0977250337600708}],"concepts":[{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.7301912307739258},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6490659117698669},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6268401145935059},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6173439025878906},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5129134654998779},{"id":"https://openalex.org/C153083717","wikidata":"https://www.wikidata.org/wiki/Q6535263","display_name":"Leverage (statistics)","level":2,"score":0.45545050501823425},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.449301540851593},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.4486010670661926},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4176117181777954},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.38184404373168945},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.28572726249694824},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26279473304748535},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2438797950744629},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12661978602409363},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0977250337600708},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dcis.2018.8681485","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dcis.2018.8681485","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 Conference on Design of Circuits and Integrated Systems (DCIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1502657187","https://openalex.org/W1596360820","https://openalex.org/W2029159365","https://openalex.org/W2053330176","https://openalex.org/W2088797164","https://openalex.org/W2100249995","https://openalex.org/W2130520838","https://openalex.org/W2132751727","https://openalex.org/W2742498326","https://openalex.org/W4238482881"],"related_works":["https://openalex.org/W3154683910","https://openalex.org/W1846734616","https://openalex.org/W3134543635","https://openalex.org/W2359532622","https://openalex.org/W2921318524","https://openalex.org/W2377571686","https://openalex.org/W2375192119","https://openalex.org/W1975778413","https://openalex.org/W1975511343","https://openalex.org/W2537995507"],"abstract_inverted_index":{"Radiation":[0],"can":[1,32],"influence":[2],"the":[3,17,23,39,49,60,68,77,94,99,107,110,128],"reliability":[4],"of":[5,13,16,25,38,62,70,80,96,98,109,127],"electronic":[6],"circuits":[7,85],"and":[8,51,54,83],"systems":[9],"in":[10,34,73,92],"a":[11,63,117,123],"variety":[12],"ways.":[14],"One":[15],"most":[18],"elusive":[19],"to":[20,67,75,86,121],"detection":[21],"is":[22],"occurrence":[24,97],"Single-Event":[26],"Transients":[27],"(SETs):":[28],"short":[29,42],"current":[30,43],"pulses":[31,44],"occur":[33],"any":[35],"PN":[36],"junction":[37],"semiconductor.":[40],"These":[41],"may":[45],"then":[46],"propagate":[47],"through":[48],"circuit":[50,129],"affect":[52],"operation":[53],"reliability.In":[55],"this":[56],"paper,":[57],"we":[58],"leverage":[59],"power":[61],"fault":[64],"injection":[65],"tool":[66],"case":[69],"Single":[71,100],"Events":[72,101],"order":[74],"assess":[76],"overall":[78],"robustness":[79],"large":[81],"analog":[82],"mixed-signal":[84],"these":[87],"effects.":[88],"The":[89],"idea":[90],"consists":[91],"extracting":[93],"likelihood":[95],"on":[102],"different":[103],"sites":[104],"from":[105],"either":[106],"layout":[108],"schematic":[111],"and,":[112],"with":[113],"that":[114],"information,":[115],"perform":[116],"likelihood-weighted":[118],"random":[119],"sampling":[120],"provide":[122],"statistically":[124],"sound":[125],"estimate":[126],"sensitivity.":[130]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}