{"id":"https://openalex.org/W4235183230","doi":"https://doi.org/10.1109/date.2012.6176658","title":"Monitoring active filters under automotive aging scenarios with embedded instrument","display_name":"Monitoring active filters under automotive aging scenarios with embedded instrument","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W4235183230","doi":"https://doi.org/10.1109/date.2012.6176658"},"language":"en","primary_location":{"id":"doi:10.1109/date.2012.6176658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176658","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027188334","display_name":"Jinbo Wan","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Jinbo Wan","raw_affiliation_strings":["Testable Design and Testing of Integrated Systems Group, University of Twente, CTIT, Enschede, Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Testing of Integrated Systems Group, University of Twente, CTIT, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. G. Kerkhoff","raw_affiliation_strings":["Testable Design and Testing of Integrated Systems Group, University of Twente, CTIT, Enschede, Netherlands"],"affiliations":[{"raw_affiliation_string":"Testable Design and Testing of Integrated Systems Group, University of Twente, CTIT, Enschede, Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5027188334"],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":0.2492,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65849518,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1096","last_page":"1101"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flagging","display_name":"Flagging","score":0.8098404407501221},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.7725204229354858},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7243528366088867},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6493738889694214},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5228962302207947},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.4860985279083252},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.4119079113006592},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40585964918136597},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3876511752605438},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.262220561504364}],"concepts":[{"id":"https://openalex.org/C2777548347","wikidata":"https://www.wikidata.org/wiki/Q5456937","display_name":"Flagging","level":2,"score":0.8098404407501221},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.7725204229354858},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7243528366088867},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6493738889694214},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5228962302207947},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.4860985279083252},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.4119079113006592},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40585964918136597},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3876511752605438},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.262220561504364},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/date.2012.6176658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176658","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:publications/c34c482e-bbb9-400c-a444-2ecca3a88f26","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/xpls/icp.jsp?arnumber=6176658","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1977408845","https://openalex.org/W1980971811","https://openalex.org/W1991891926","https://openalex.org/W2017085810","https://openalex.org/W2087523608","https://openalex.org/W2100057759","https://openalex.org/W2111486897","https://openalex.org/W2121844340","https://openalex.org/W2126834173","https://openalex.org/W2127145135","https://openalex.org/W2129748997","https://openalex.org/W2131682677","https://openalex.org/W2149833715","https://openalex.org/W2163040160","https://openalex.org/W2543260924","https://openalex.org/W6644533274","https://openalex.org/W6645299839"],"related_works":["https://openalex.org/W2132658806","https://openalex.org/W2758348730","https://openalex.org/W3210666397","https://openalex.org/W2350662357","https://openalex.org/W2160915513","https://openalex.org/W2769711664","https://openalex.org/W3036272329","https://openalex.org/W2378051443","https://openalex.org/W2885986920","https://openalex.org/W1981289170"],"abstract_inverted_index":{"In":[0],"automotive":[1,75],"mixed-signal":[2],"SoCs,":[3],"the":[4,17,22,32,62,96],"analogue/mixed-signal":[5],"front-ends":[6],"are":[7,27],"of":[8,16,39,64,70],"particular":[9],"interest":[10],"with":[11,55],"regard":[12],"to":[13,31],"dependability.":[14],"Because":[15],"many":[18],"electrical":[19],"disturbances":[20],"at":[21],"front-end,":[23],"often":[24],"(active)":[25],"filters":[26,41,72],"being":[28],"used.":[29],"Due":[30],"harsh":[33],"environments,":[34],"in":[35,66,73,95],"some":[36],"cases,":[37],"degradation":[38],"these":[40],"may":[42],"be":[43,53,90],"encountered":[44],"during":[45],"lifetime":[46],"and":[47,77],"hence":[48],"false":[49],"sensor":[50],"information":[51],"could":[52],"provided":[54],"potential":[56],"fatal":[57],"results.":[58],"This":[59],"paper":[60],"investigates":[61],"influence":[63],"aging":[65,85],"three":[67],"different":[68],"types":[69],"active":[71],"an":[74,79],"environment,":[76],"presents":[78],"embedded":[80],"instrument,":[81],"which":[82],"monitors":[83],"this":[84],"behaviour.":[86],"The":[87],"monitor":[88],"can":[89],"used":[91],"for":[92],"flagging":[93],"problems":[94],"car":[97],"console":[98],"or":[99],"initiate":[100],"automatic":[101],"correction.":[102]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-16T09:10:04.655348","created_date":"2025-10-10T00:00:00"}