{"id":"https://openalex.org/W3144904247","doi":"https://doi.org/10.1109/date.2012.6176595","title":"Layout-aware optimization of stt mrams","display_name":"Layout-aware optimization of stt mrams","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W3144904247","doi":"https://doi.org/10.1109/date.2012.6176595","mag":"3144904247"},"language":"en","primary_location":{"id":"doi:10.1109/date.2012.6176595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044276472","display_name":"Sumeet Kumar Gupta","orcid":"https://orcid.org/0000-0001-5609-9722"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. K. Gupta","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068099554","display_name":"Sang Phill Park","orcid":"https://orcid.org/0000-0002-2951-8474"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sang Phill Park","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068681753","display_name":"N. N. Mojumder","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. N. Mojumder","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031161187","display_name":"Kaushik Roy","orcid":"https://orcid.org/0000-0002-0735-9695"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Roy","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":80,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1455","last_page":"1458"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4998171329498291},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.471102774143219},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.36369478702545166},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26464223861694336},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1459277868270874}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4998171329498291},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.471102774143219},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.36369478702545166},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26464223861694336},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1459277868270874},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2012.6176595","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176595","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1686183427","https://openalex.org/W1975904824","https://openalex.org/W2019945763","https://openalex.org/W2035925590","https://openalex.org/W2061231471","https://openalex.org/W2096470311"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"We":[0,84,134,164],"present":[1],"a":[2,53,81,89,111],"layout-aware":[3],"optimization":[4],"methodology":[5],"for":[6,46,88,183,227,236],"spin-transfer":[7],"torque":[8],"(STT)":[9],"MRAMs,":[10],"considering":[11],"the":[12,18,31,35,58,97,103,114,131,136,146,150,171,184,193,196,200,228],"dependence":[13],"of":[14,28,38,91,106,138,158,161],"cell":[15,66,76,98,132,154],"area":[16,77,99],"on":[17,149],"access":[19,32],"transistor":[20,33,63],"width":[21],"(W":[22],"<sub":[23,48,71,93,121,142,189],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[24,49,72,94,122,143,190],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">FET</sub>":[25,50,73,95,123,144,191],"),":[26],"number":[27],"fingers":[29],"in":[30,113,130,140,145,170,199,217,223],"and":[34,40,108,153,173,176,206,220],"metal":[36,104,115],"pitch":[37,105,116],"bit-":[39,107],"source-lines.":[41,109],"It":[42],"is":[43,78,100,225],"shown":[44],"that":[45,87],"W":[47,70,92,120,141,188],"less":[51],"than":[52],"critical":[54],"value":[55,198],"(~7":[56],"times":[57],"minimum":[59,65,75,194],"feature":[60],"length),":[61],"one-finger":[62],"yields":[64],"area.":[67,133],"For":[68],"large":[69],",":[74,96],"achieved":[79,226],"with":[80,127,179],"two-finger":[82],"transistor.":[83],"also":[85],"show":[86],"range":[90],"limited":[101,117],"by":[102],"As":[110],"result,":[112],"(MPL)":[118],"region,":[119],"can":[124],"be":[125],"increased":[126],"no":[128],"change":[129],"analyze":[135],"impact":[137],"increase":[139],"MPL":[147,201],"region":[148,202],"write":[151,218],"margin":[152,219],"tunneling":[155],"magneto-resistance":[156],"(CTMR)":[157],"different":[159],"genres":[160],"STT":[162,167,177,230,238],"MRAMs.":[163],"consider":[165],"conventional":[166],"MRAM":[168,239],"cells":[169],"standard":[172],"reverse-connected":[174,229],"configurations":[175],"MRAMs":[178],"tilted":[180],"magnetic":[181],"anisotropy":[182],"analysis.":[185],"By":[186],"increasing":[187],"from":[192],"to":[195,210],"maximum":[197],"(at":[203],"iso-cell":[204],"area)":[205],"reducing":[207],"read":[208],"voltage":[209],"achieve":[211],"iso-read":[212],"disturb":[213],"margin,":[214],"2X":[215],"improvement":[216,222],"27%":[221],"CTMR":[224],"MRAM.":[231],"Similar":[232],"trends":[233],"are":[234],"observed":[235],"other":[237],"cells.":[240]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":11},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}