{"id":"https://openalex.org/W2115895773","doi":"https://doi.org/10.1109/date.2011.5763300","title":"Transition-Time-Relation based capture-safety checking for at-speed scan test generation","display_name":"Transition-Time-Relation based capture-safety checking for at-speed scan test generation","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2115895773","doi":"https://doi.org/10.1109/date.2011.5763300","mag":"2115895773"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763300","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079877073","display_name":"Kohei Miyase","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K Miyase","raw_affiliation_strings":["JST-CREST, Japan","Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"X Wen","raw_affiliation_strings":["JST-CREST, Japan","Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055734358","display_name":"Masao Aso","orcid":null},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M Aso","raw_affiliation_strings":["Renesas Micro Systems Company Limited, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Micro Systems Company Limited, USA","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072540704","display_name":"Hidemitsu Furukawa","orcid":"https://orcid.org/0000-0002-0778-3330"},"institutions":[{"id":"https://openalex.org/I75636454","display_name":"Renesas Electronics (United States)","ror":"https://ror.org/014775w70","country_code":"US","type":"company","lineage":["https://openalex.org/I4210153176","https://openalex.org/I75636454"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H Furukawa","raw_affiliation_strings":["Renesas Micro Systems Company Limited, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Micro Systems Company Limited, USA","institution_ids":["https://openalex.org/I75636454"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113665744","display_name":"Y. Yamato","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097531","display_name":"Kitakyushu Foundation for the Advancement of Industry, Science and Technology","ror":"https://ror.org/00wse9j86","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210097531"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y Yamato","raw_affiliation_strings":["Fukuoka Industry Science and Technology Foundation, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fukuoka Industry Science and Technology Foundation, Japan","institution_ids":["https://openalex.org/I4210097531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S Kajihara","raw_affiliation_strings":["JST-CREST, Japan","Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"JST-CREST, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7729,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.7437408,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6665588617324829},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5931594371795654},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5873392224311829},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.5066702961921692},{"id":"https://openalex.org/keywords/sign","display_name":"Sign (mathematics)","score":0.49192309379577637},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.47433915734291077},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4651340842247009},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4253443777561188},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.35132086277008057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16831955313682556},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16301751136779785},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16247773170471191},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.16003718972206116},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.10269442200660706}],"concepts":[{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6665588617324829},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5931594371795654},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5873392224311829},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.5066702961921692},{"id":"https://openalex.org/C139676723","wikidata":"https://www.wikidata.org/wiki/Q1193832","display_name":"Sign (mathematics)","level":2,"score":0.49192309379577637},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.47433915734291077},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4651340842247009},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4253443777561188},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35132086277008057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16831955313682556},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16301751136779785},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16247773170471191},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.16003718972206116},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.10269442200660706},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763300","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1900996732","https://openalex.org/W2115700624","https://openalex.org/W2132565185","https://openalex.org/W2132881562","https://openalex.org/W2135615172","https://openalex.org/W2135936250","https://openalex.org/W2152321821","https://openalex.org/W2156340730","https://openalex.org/W2168247232","https://openalex.org/W2170506040","https://openalex.org/W2171769301","https://openalex.org/W2464594873","https://openalex.org/W3151076167","https://openalex.org/W4242107829","https://openalex.org/W6639759450","https://openalex.org/W6682700446","https://openalex.org/W6684847144"],"related_works":["https://openalex.org/W2144004661","https://openalex.org/W2001352955","https://openalex.org/W3109020709","https://openalex.org/W1588361197","https://openalex.org/W1968374692","https://openalex.org/W2151556234","https://openalex.org/W2044021627","https://openalex.org/W2074895070","https://openalex.org/W2240333541","https://openalex.org/W2116129521"],"abstract_inverted_index":{"Excessive":[0],"capture":[1],"power":[2],"in":[3,12,43],"at-speed":[4],"scan":[5],"testing":[6],"may":[7],"cause":[8],"timing":[9],"failures,":[10],"resulting":[11],"test-induced":[13],"yield":[14],"loss.":[15],"This":[16,25],"has":[17],"made":[18],"capture-safety":[19,44],"checking":[20,47],"mandatory":[21],"for":[22],"test":[23,57,62],"vectors.":[24],"paper":[26],"presents":[27],"a":[28],"novel":[29],"metric,":[30,35],"called":[31],"the":[32,49,54],"TTR":[33,50],"(Transition-Time-Relation-based)":[34],"which":[36],"takes":[37],"transition":[38],"time":[39],"relations":[40],"into":[41],"consideration":[42],"checking.":[45],"Capture-safety":[46],"with":[48],"metric":[51],"greatly":[52],"improves":[53],"accuracy":[55],"of":[56],"vector":[58],"sign-off":[59],"and":[60],"low-capture-power":[61],"generation.":[63]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}