{"id":"https://openalex.org/W2139677920","doi":"https://doi.org/10.1109/date.2011.5763271","title":"Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories","display_name":"Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2139677920","doi":"https://doi.org/10.1109/date.2011.5763271","mag":"2139677920"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051158316","display_name":"Nor Zaidi Haron","orcid":null},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["MY","NL"],"is_corresponding":false,"raw_author_name":"N Z Haron","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technnology, Netherlands","Faculty of Electronic and Computer Engineering, Universiti Teknikal Malaysia Melaka, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technnology, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Faculty of Electronic and Computer Engineering, Universiti Teknikal Malaysia Melaka, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S Hamdioui","raw_affiliation_strings":["Computer Engineering Laboratory, Delft University of Technnology, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, Delft University of Technnology, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4475,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.61790477,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7844930291175842},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7284265756607056},{"id":"https://openalex.org/keywords/soft-decision-decoder","display_name":"Soft-decision decoder","score":0.6298997402191162},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.6274343729019165},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.6196848154067993},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5754328370094299},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4199322760105133},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4016433358192444},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.399655818939209},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37302273511886597},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24973446130752563},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.08338853716850281}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7844930291175842},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7284265756607056},{"id":"https://openalex.org/C185588885","wikidata":"https://www.wikidata.org/wiki/Q7553811","display_name":"Soft-decision decoder","level":3,"score":0.6298997402191162},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.6274343729019165},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.6196848154067993},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5754328370094299},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4199322760105133},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4016433358192444},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.399655818939209},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37302273511886597},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24973446130752563},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.08338853716850281},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W200456569","https://openalex.org/W1970319669","https://openalex.org/W1971705300","https://openalex.org/W1986943557","https://openalex.org/W1992635254","https://openalex.org/W2003964202","https://openalex.org/W2017521824","https://openalex.org/W2045197688","https://openalex.org/W2076490805","https://openalex.org/W2080564856","https://openalex.org/W2096302652","https://openalex.org/W2099569658","https://openalex.org/W2099665976","https://openalex.org/W2130169026","https://openalex.org/W2138404515","https://openalex.org/W2153551298","https://openalex.org/W2167002145","https://openalex.org/W3149410719","https://openalex.org/W4240060828","https://openalex.org/W6669485717","https://openalex.org/W7062389935"],"related_works":["https://openalex.org/W2356119241","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2182248074","https://openalex.org/W2102525122","https://openalex.org/W2019141945","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W2036953450"],"abstract_inverted_index":{"Existing":[0],"work":[1],"on":[2,80,102],"fault":[3,138,150],"tolerance":[4],"in":[5,16,24],"hybrid":[6,52,121,162,177],"nanoelectronic":[7],"memories":[8,53],"(hybrid":[9],"memories)":[10],"assumes":[11],"that":[12,54,108],"faults":[13],"only":[14],"occur":[15],"the":[17,21,25,29,85,89,95,109,119,137,152,160,166],"memory":[18,122,143,163],"array":[19,144],"and":[20,75,98,142,147],"encoder,":[22],"not":[23],"decoder.":[26,132],"However,":[27],"as":[28,128],"decoder":[30,50,90,111,141,154,168],"is":[31,38,67,91,112,145],"structured":[32],"using":[33],"scaled":[34],"CMOS":[35],"devices,":[36],"it":[37,100],"also":[39],"becoming":[40],"vulnerable":[41],"to":[42,114,130],"faults.":[43,64],"This":[44],"paper":[45],"presents":[46],"a":[47,58],"cost-efficient":[48,86],"fault-tolerant":[49],"for":[51,174],"are":[55],"impacted":[56],"by":[57,69,93],"high":[59],"degree":[60],"of":[61,88,118,159],"non-permanent":[62],"clustered":[63],"Fault-tolerant":[65],"capability":[66],"achieved":[68],"combining":[70],"partial":[71],"hardware":[72],"redundancy":[73],"scheme":[74,78],"on-line":[76],"masking":[77],"based":[79,101],"M\u00fcller":[81],"C-gates.":[82],"In":[83],"addition,":[84],"implementation":[87],"realized":[92],"modifying":[94],"decoding":[96],"sequence":[97],"implementing":[99],"time":[103],"redundancy.":[104],"Experimental":[105],"results":[106],"show":[107],"proposed":[110,153,167],"able":[113],"provide":[115],"better":[116],"reliability":[117,158],"overall":[120,161],"system,":[123],"yet":[124],"requires":[125],"smaller":[126,171],"area":[127,172],"compared":[129],"conventional":[131],"For":[133],"example,":[134],"when":[135],"assuming":[136],"ratio":[139],"between":[140],"1:10":[146],"at":[148],"10%":[149],"rate,":[151],"ensures":[155],"1%":[156],"higher":[157],"system.":[164],"Moreover,":[165],"realizes":[169],"18.4%":[170],"overhead":[173],"64-bit":[175],"word":[176],"memory.":[178]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}