{"id":"https://openalex.org/W2147524308","doi":"https://doi.org/10.1109/date.2011.5763252","title":"A unified methodology for pre-silicon verification and post-silicon validation","display_name":"A unified methodology for pre-silicon verification and post-silicon validation","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2147524308","doi":"https://doi.org/10.1109/date.2011.5763252","mag":"2147524308"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763252","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763252","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014058894","display_name":"Allon Adir","orcid":"https://orcid.org/0000-0001-8128-6706"},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"A Adir","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067671744","display_name":"Shady Copty","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"S Copty","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002839109","display_name":"Shimon Landa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"S Landa","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083923985","display_name":"Amir Nahir","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"A Nahir","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020810091","display_name":"Gil Shurek","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"G Shurek","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065672051","display_name":"Alon Ziv","orcid":"https://orcid.org/0000-0001-9297-0300"},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"A Ziv","raw_affiliation_strings":["IBM Research, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Research, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110346977","display_name":"C. Meissner","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C Meissner","raw_affiliation_strings":["IBM Server and Technology Group, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108470348","display_name":"John Schumann","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J Schumann","raw_affiliation_strings":["IBM Server and Technology Group, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5014058894"],"corresponding_institution_ids":["https://openalex.org/I4210167297"],"apc_list":null,"apc_paid":null,"fwci":6.5484,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":{"value":0.97222487,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7517960667610168},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.6589871644973755},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.6537460684776306},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5349314212799072},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.45179203152656555},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.43831509351730347},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3704177737236023},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3536941409111023},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.24311140179634094},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13085544109344482}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7517960667610168},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.6589871644973755},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.6537460684776306},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5349314212799072},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.45179203152656555},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.43831509351730347},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3704177737236023},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3536941409111023},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.24311140179634094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13085544109344482},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763252","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763252","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W626284047","https://openalex.org/W1515959435","https://openalex.org/W1544635590","https://openalex.org/W1600068019","https://openalex.org/W1977375970","https://openalex.org/W2096950720","https://openalex.org/W2097027490","https://openalex.org/W2121327775","https://openalex.org/W2122146819","https://openalex.org/W2123205813","https://openalex.org/W2136357775","https://openalex.org/W2150148998","https://openalex.org/W2151051752","https://openalex.org/W2156591015","https://openalex.org/W2158668620","https://openalex.org/W2164380910","https://openalex.org/W2492757556","https://openalex.org/W6632404128","https://openalex.org/W6637046749","https://openalex.org/W6644658493","https://openalex.org/W6678313375","https://openalex.org/W6678329786","https://openalex.org/W6682200594"],"related_works":["https://openalex.org/W2072806201","https://openalex.org/W2024218563","https://openalex.org/W1517743118","https://openalex.org/W1516169988","https://openalex.org/W2965845133","https://openalex.org/W2281090687","https://openalex.org/W1670831115","https://openalex.org/W3091728393","https://openalex.org/W2556057931","https://openalex.org/W2005310092"],"abstract_inverted_index":{"The":[0],"growing":[1],"importance":[2],"of":[3,10,56,102],"post-silicon":[4,23,36,67],"validation":[5],"in":[6,99],"ensuring":[7],"functional":[8,29],"correctness":[9],"high-end":[11],"designs":[12],"increases":[13],"the":[14,19,33,57,66,71,78,100,103],"need":[15],"for":[16,32,50,65,73],"synergy":[17],"between":[18,80],"pre-silicon":[20,84],"verification":[21,30,45,101],"and":[22,35,47,52,77,82,96],"validation.":[24],"We":[25,69],"propose":[26],"a":[27,43,60,75,92],"unified":[28],"methodology":[31,39,58],"pre-":[34],"domains.":[37],"This":[38],"is":[40],"based":[41],"on":[42,87],"common":[44],"plan":[46],"similar":[48],"languages":[49],"test-templates":[51],"coverage":[53],"models.":[54],"Implementation":[55],"requires":[59],"user-directable":[61],"stimuli":[62],"generation":[63],"tool":[64,76,93],"domain.":[68],"analyze":[70],"requirements":[72],"such":[74],"differences":[79],"it":[81,98],"its":[83],"counterpart.":[85],"Based":[86],"these":[88],"requirements,":[89],"we":[90],"implemented":[91],"called":[94],"Threadmill":[95],"used":[97],"IBM":[104],"POWER7":[105],"processor":[106],"chip":[107],"with":[108],"encouraging":[109],"results.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":11},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}