{"id":"https://openalex.org/W2133831885","doi":"https://doi.org/10.1109/date.2011.5763239","title":"Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation","display_name":"Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2133831885","doi":"https://doi.org/10.1109/date.2011.5763239","mag":"2133831885"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation &amp; Test in Europe","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"G Gielen","raw_affiliation_strings":["ESAT-MICAS, K.U. Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, K.U. Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023516811","display_name":"Elie Maricau","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"E Maricau","raw_affiliation_strings":["ESAT-MICAS, K.U. Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, K.U. Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108501153","display_name":"Pieter De Wit","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P De Wit","raw_affiliation_strings":["ESAT-MICAS, K.U. Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, K.U. Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5029270525"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":5.5642,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.96219628,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7564123868942261},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6414161920547485},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5528603196144104},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5232043266296387},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5084308981895447},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5062967538833618},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5044609308242798},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4476088583469391},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.43299010396003723},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4321237802505493},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4150366187095642},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4119388461112976},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40638405084609985},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.36026373505592346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2989007234573364},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1314937174320221},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08854129910469055}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7564123868942261},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6414161920547485},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5528603196144104},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5232043266296387},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5084308981895447},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5062967538833618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5044609308242798},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4476088583469391},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43299010396003723},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4321237802505493},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4150366187095642},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4119388461112976},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40638405084609985},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.36026373505592346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2989007234573364},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1314937174320221},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08854129910469055},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation &amp; Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1583499813","https://openalex.org/W1972427123","https://openalex.org/W1979006344","https://openalex.org/W1990794787","https://openalex.org/W2026610840","https://openalex.org/W2036537371","https://openalex.org/W2041424982","https://openalex.org/W2047552062","https://openalex.org/W2062874667","https://openalex.org/W2064979487","https://openalex.org/W2070588354","https://openalex.org/W2093553477","https://openalex.org/W2096995644","https://openalex.org/W2098318937","https://openalex.org/W2099138617","https://openalex.org/W2099835127","https://openalex.org/W2100375511","https://openalex.org/W2105510174","https://openalex.org/W2107073052","https://openalex.org/W2113258421","https://openalex.org/W2122520074","https://openalex.org/W2130688260","https://openalex.org/W2136122966","https://openalex.org/W2140823559","https://openalex.org/W2141899849","https://openalex.org/W3147897646","https://openalex.org/W4241148352","https://openalex.org/W4251692722","https://openalex.org/W6662390653"],"related_works":["https://openalex.org/W4318953393","https://openalex.org/W2744643496","https://openalex.org/W2048419807","https://openalex.org/W3075611072","https://openalex.org/W2081795747","https://openalex.org/W3094423394","https://openalex.org/W2357721494","https://openalex.org/W1553422968","https://openalex.org/W1974416117","https://openalex.org/W2168458994"],"abstract_inverted_index":{"The":[0],"paper":[1],"discusses":[2],"reliability":[3,28,53,81,96],"threats":[4],"and":[5,48,89],"opportunities":[6],"for":[7,69,93],"analog":[8,70,133],"circuit":[9,71,95,137],"design":[10,120],"in":[11,34],"high-k":[12,35],"sub-32":[13],"nanometer":[14],"technologies.":[15],"Compared":[16],"to":[17,31,38,76,126],"older":[18],"SiO":[19],"<sub":[20],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[21],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[22],"or":[23],"SiON":[24],"based":[25,55],"technologies,":[26],"transistor":[27],"is":[29,98,108],"found":[30],"be":[32],"worse":[33],"nodes":[36],"due":[37],"larger":[39],"oxide":[40],"electric":[41],"fields,":[42],"the":[43,113,132,136],"severely":[44],"aggravated":[45],"PBTI":[46],"effect":[47,85],"increased":[49],"time-dependent":[50],"variability.":[51],"Conventional":[52],"margins,":[54,82],"on":[56,60],"accelerated":[57],"stress":[58],"measurements":[59],"individual":[61],"transistors,":[62],"are":[63,87],"no":[64],"longer":[65],"sufficient":[66],"nor":[67],"adequate":[68],"design.":[72],"As":[73],"a":[74,143,147],"means":[75],"find":[77],"more":[78],"accurate,":[79],"circuit-dependent":[80],"advanced":[83],"degradation":[84],"models":[86],"reviewed":[88],"an":[90,101,124],"efficient":[91],"method":[92],"stochastic":[94],"simulation":[97,115],"discussed.":[99],"Also,":[100],"example":[102],"6-bit":[103],"32nm":[104],"current-steering":[105],"digital-to-analog":[106],"converter":[107],"studied.":[109],"Experiments":[110],"demonstrate":[111],"how":[112],"proposed":[114],"tool,":[116],"combined":[117],"with":[118],"novel":[119],"techniques,":[121],"can":[122],"provide":[123],"up":[125],"89%":[127],"better":[128],"area-power":[129],"product":[130],"of":[131,135,149],"part":[134],"under":[138],"study,":[139],"while":[140],"still":[141],"guaranteeing":[142],"99.7%":[144],"yield":[145],"over":[146],"lifetime":[148],"5":[150],"years.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}