{"id":"https://openalex.org/W1997151065","doi":"https://doi.org/10.1109/date.2011.5763231","title":"Adaptive test optimization through real time learning of test effectiveness","display_name":"Adaptive test optimization through real time learning of test effectiveness","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W1997151065","doi":"https://doi.org/10.1109/date.2011.5763231","mag":"1997151065"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763231","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048958640","display_name":"Bar\u0131\u015f Arslan","orcid":"https://orcid.org/0000-0001-9386-514X"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"B Arslan","raw_affiliation_strings":["Computer Science and Engineering, University of California, San Diego, CA, USA","QUALCOMM, Inc.orporated, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"QUALCOMM, Inc.orporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006811625","display_name":"Alex Orailo\u011flu","orcid":"https://orcid.org/0000-0002-6104-3923"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A Orailoglu","raw_affiliation_strings":["Computer Science and Engineering, University of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5048958640"],"corresponding_institution_ids":["https://openalex.org/I36258959","https://openalex.org/I4210087596"],"apc_list":null,"apc_paid":null,"fwci":1.0075,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76901785,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7080783247947693},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6730452179908752},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.607184886932373},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5948188304901123},{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.5717350840568542},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.5004191398620605},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4806022346019745},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.479894757270813},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42762359976768494},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4206123948097229},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.35540318489074707},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3135915696620941},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15619173645973206},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.10253351926803589},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0756537914276123}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7080783247947693},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6730452179908752},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.607184886932373},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5948188304901123},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.5717350840568542},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.5004191398620605},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4806022346019745},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.479894757270813},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42762359976768494},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4206123948097229},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.35540318489074707},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3135915696620941},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15619173645973206},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.10253351926803589},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0756537914276123},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763231","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1531696936","https://openalex.org/W1554885925","https://openalex.org/W2034030717","https://openalex.org/W2097328429","https://openalex.org/W2101900253","https://openalex.org/W2102556246","https://openalex.org/W2103543101","https://openalex.org/W2111263361","https://openalex.org/W2112978605","https://openalex.org/W2120349980","https://openalex.org/W2121863487","https://openalex.org/W2135627440","https://openalex.org/W2145468251","https://openalex.org/W2148280402","https://openalex.org/W2153457918","https://openalex.org/W2154417534","https://openalex.org/W2155171480","https://openalex.org/W2156955559","https://openalex.org/W2162433349","https://openalex.org/W2171908682","https://openalex.org/W3147331103","https://openalex.org/W4214717370","https://openalex.org/W4253686352","https://openalex.org/W6675373693"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2021253405","https://openalex.org/W2323083271","https://openalex.org/W2091533492","https://openalex.org/W2570882127","https://openalex.org/W2802691720","https://openalex.org/W2940545572"],"abstract_inverted_index":{"Production":[0],"test":[1,9,17,31,38,45,51,63,69,82,106],"suites":[2],"include":[3],"a":[4,41,50,80],"large":[5],"number":[6],"of":[7,15,26,36,67,90,105],"redundant":[8],"patterns":[10,39,70],"due":[11],"to":[12,92],"the":[13,24,65,95,101],"inclusion":[14],"multiple":[16],"types":[18],"with":[19],"overlapping":[20],"defect":[21,76,97,102],"detection":[22,77,103],"and":[23,34,59],"use":[25],"simple":[27],"fault":[28],"models":[29],"for":[30],"generation.":[32],"Identification":[33],"elimination":[35],"ineffective":[37],"promises":[40],"significant":[42],"reduction":[43],"in":[44,94],"cost.":[46],"This":[47],"paper":[48],"proposes":[49],"framework":[52],"that":[53],"learns,":[54],"without":[55],"extensive":[56],"data":[57],"collection":[58],"at":[60],"no":[61],"additional":[62],"time,":[64],"effectiveness":[66],"individual":[68],"during":[71],"production":[72],"testing":[73],"by":[74,99],"getting":[75],"feedback":[78],"from":[79],"dynamic":[81],"flow.":[83],"The":[84],"proposed":[85],"technique":[86],"is":[87],"further":[88],"capable":[89],"adapting":[91],"changes":[93],"underlying":[96],"mechanisms":[98],"tracking":[100],"trend":[104],"patterns.":[107]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}