{"id":"https://openalex.org/W2100758165","doi":"https://doi.org/10.1109/date.2011.5763138","title":"Correlating inline data with final test outcomes in analog/RF devices","display_name":"Correlating inline data with final test outcomes in analog/RF devices","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2100758165","doi":"https://doi.org/10.1109/date.2011.5763138","mag":"2100758165"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763138","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023142218","display_name":"Nathan Kupp","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N Kupp","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, New Heaven, CT, USA","Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT 06520"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT 06520","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021847892","display_name":"Mohamed Slamani","orcid":"https://orcid.org/0000-0002-2361-4588"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M Slamani","raw_affiliation_strings":["Wireless Test Development Group, IBM, Essex Junction, VT, USA","IBM, Wireless Test Development Group, 1000 River Street 863G, Essex Junction, VT 05452, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wireless Test Development Group, IBM, Essex Junction, VT, USA","institution_ids":[]},{"raw_affiliation_string":"IBM, Wireless Test Development Group, 1000 River Street 863G, Essex Junction, VT 05452, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y Makris","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, New Heaven, CT, USA","Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT 06520"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Heaven, CT, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT 06520","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9501,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.73139217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-relationship","display_name":"Spurious relationship","score":0.7556852698326111},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.6426514983177185},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.614136815071106},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5942167043685913},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5228172540664673},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.5214682817459106},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5110701322555542},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5018110275268555},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4711141884326935},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43960708379745483},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4206535220146179},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.417224645614624},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3464946746826172},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3440432548522949},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27798548340797424},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22264382243156433},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2180263102054596},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1705579161643982},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.12034082412719727},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11737534403800964}],"concepts":[{"id":"https://openalex.org/C97256817","wikidata":"https://www.wikidata.org/wiki/Q1462316","display_name":"Spurious relationship","level":2,"score":0.7556852698326111},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.6426514983177185},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.614136815071106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5942167043685913},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5228172540664673},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.5214682817459106},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5110701322555542},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5018110275268555},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4711141884326935},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43960708379745483},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4206535220146179},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.417224645614624},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3464946746826172},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3440432548522949},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27798548340797424},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22264382243156433},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2180263102054596},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1705579161643982},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.12034082412719727},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11737534403800964},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763138","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763138","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2016706393","https://openalex.org/W2069948346","https://openalex.org/W2102201073","https://openalex.org/W2110282784","https://openalex.org/W2111081435","https://openalex.org/W2126105956","https://openalex.org/W2129690060","https://openalex.org/W2136007135","https://openalex.org/W2136522087","https://openalex.org/W2147018104","https://openalex.org/W2147916294","https://openalex.org/W2950090773","https://openalex.org/W2998216295","https://openalex.org/W4285719527","https://openalex.org/W7066667914"],"related_works":["https://openalex.org/W2162899405","https://openalex.org/W3113091479","https://openalex.org/W941090075","https://openalex.org/W2044987316","https://openalex.org/W2237480245","https://openalex.org/W3134374554","https://openalex.org/W2519167559","https://openalex.org/W2991483587","https://openalex.org/W3116444723","https://openalex.org/W2187490799"],"abstract_inverted_index":{"In":[0,69],"semiconductor":[1,123],"manufacturing,":[2],"a":[3,74,147],"wealth":[4],"of":[5,34,55,149],"wafer-level":[6],"measurements,":[7],"generally":[8,40],"termed":[9],"inline":[10,56,85,151],"data,":[11],"are":[12,23,119],"collected":[13,58],"from":[14,132],"various":[15],"on-die":[16],"and":[17,22,62,81,87,114],"between-die":[18],"(kerf)":[19],"test":[20,67,89,157],"structures":[21],"used":[24],"to":[25,78,112,154],"provide":[26],"characterization":[27],"engineers":[28],"with":[29,65],"information":[30,48],"on":[31,99,142],"the":[32,35,52],"health":[33],"process.":[36],"While":[37],"it":[38],"is":[39],"believed":[41],"that":[42],"these":[43],"measurements":[44,86],"also":[45],"contain":[46],"valuable":[47],"regarding":[49],"die":[50],"performances,":[51],"vast":[53],"amount":[54],"data":[57,75,131],"often":[59],"thwarts":[60],"efficient":[61],"informative":[63],"correlation":[64],"final":[66,88,156],"outcomes.":[68,159],"this":[70],"work,":[71],"we":[72,95,144],"develop":[73],"mining":[76],"approach":[77],"automatically":[79],"identify":[80,113,146],"explore":[82],"correlations":[83],"between":[84],"outcomes":[90],"in":[91,102,122,137],"analog/RF":[92,134],"devices.":[93],"Significantly,":[94],"do":[96],"not":[97],"depend":[98],"statistical":[100],"methods":[101],"isolation,":[103],"but":[104],"incorporate":[105],"domain":[106],"expert":[107],"feedback":[108],"into":[109],"our":[110,128],"algorithm":[111],"remove":[115],"spurious":[116],"autocorrelations":[117],"which":[118,143],"frequently":[120],"present":[121],"manufacturing":[124],"data.":[125],"We":[126],"demonstrate":[127],"method":[129],"using":[130],"an":[133],"product":[135],"manufactured":[136],"IBM's":[138],"90nm":[139],"low-power":[140],"process,":[141],"successfully":[145],"set":[148],"key":[150],"parameters":[152],"correlating":[153],"module":[155],"(MFT)":[158]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}