{"id":"https://openalex.org/W2108999265","doi":"https://doi.org/10.1109/date.2011.5763055","title":"A cost-effective substantial-impact-filter based method to tolerate voltage emergencies","display_name":"A cost-effective substantial-impact-filter based method to tolerate voltage emergencies","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2108999265","doi":"https://doi.org/10.1109/date.2011.5763055","mag":"2108999265"},"language":"en","primary_location":{"id":"doi:10.1109/date.2011.5763055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016799154","display_name":"Songjun Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songjun Pan","raw_affiliation_strings":["Chinese Academy and Sciences, Beijing, China","Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy and Sciences, Beijing, China","institution_ids":[]},{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100721270","display_name":"Yu Hu","orcid":"https://orcid.org/0000-0001-8818-4075"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Hu","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101964036","display_name":"Xing Hu","orcid":"https://orcid.org/0000-0002-9979-0561"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Hu","raw_affiliation_strings":["Chinese Academy of Sciences, Beijing, Beijing, CN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Beijing, Beijing, CN","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3425,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.79112171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5710614919662476},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4776836037635803},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4555339813232422},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41309282183647156},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3470919728279114},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2044471800327301},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17144179344177246},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.13609471917152405},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.06417009234428406}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5710614919662476},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4776836037635803},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4555339813232422},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41309282183647156},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3470919728279114},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2044471800327301},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17144179344177246},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.13609471917152405},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.06417009234428406}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2011.5763055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2011.5763055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Design, Automation & Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1972489788","https://openalex.org/W1972661221","https://openalex.org/W2016253482","https://openalex.org/W2023571465","https://openalex.org/W2032094184","https://openalex.org/W2078423579","https://openalex.org/W2083842387","https://openalex.org/W2102727118","https://openalex.org/W2104677471","https://openalex.org/W2114937530","https://openalex.org/W2131095522","https://openalex.org/W2134067926","https://openalex.org/W2140351961","https://openalex.org/W2144512449","https://openalex.org/W2147599221","https://openalex.org/W2148952606","https://openalex.org/W2150283124","https://openalex.org/W2152144298","https://openalex.org/W2153456949","https://openalex.org/W2156476900","https://openalex.org/W2163208120","https://openalex.org/W2167244863","https://openalex.org/W2171461313"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"Supply":[0],"voltage":[1,16,21,26,36,64,90,102,134,144],"fluctuation":[2],"caused":[3],"by":[4],"inductive":[5],"noises":[6],"has":[7],"become":[8],"a":[9,84,109,138],"critical":[10],"problem":[11],"in":[12,67],"microprocessor":[13,30,126],"design.":[14],"A":[15],"emergency":[17],"occurs":[18],"when":[19],"supply":[20],"variation":[22],"exceeds":[23],"the":[24,29,98,123,156,161],"acceptable":[25],"margin,":[27],"jeopardizing":[28],"reliability.":[31],"Existing":[32],"techniques":[33],"assume":[34],"all":[35,63],"emergencies":[37,65,103],"would":[38],"definitely":[39],"lead":[40],"to":[41,51,75,88,120,133,142],"incorrect":[42],"program":[43,105],"execution":[44],"and":[45,53,130],"prudently":[46],"activate":[47],"rollbacks":[48],"or":[49],"flushes":[50],"recover,":[52],"consequently":[54],"incur":[55],"high":[56],"performance":[57,157],"overhead.":[58],"We":[59],"observe":[60],"that":[61],"not":[62],"result":[66],"external":[68],"visible":[69],"errors,":[70],"which":[71],"can":[72],"be":[73],"exploited":[74],"avoid":[76],"unnecessary":[77],"protection.":[78],"In":[79],"this":[80],"paper,":[81],"we":[82],"propose":[83],"substantial-impact-filter":[85,139],"based":[86,140],"method":[87,141],"tolerate":[89],"emergencies,":[91],"including":[92],"three":[93],"key":[94],"techniques:":[95],"1)":[96],"Analyze":[97],"architecture-level":[99],"masking":[100],"of":[101,125,155],"during":[104],"execution;":[106],"2)":[107],"Propose":[108,137],"metric":[110],"intermittent":[111,115],"vulnerability":[112,124],"factor":[113],"for":[114],"timing":[116],"faults":[117],"(IV":[118],"Fitf)":[119],"quantitatively":[121],"estimate":[122],"structures":[127],"(load/store":[128],"queue":[129],"register":[131],"file)":[132],"emergencies;":[135],"3)":[136],"handle":[143],"emergencies.":[145],"Experimental":[146],"results":[147],"demonstrate":[148],"our":[149],"approach":[150],"gains":[151],"back":[152],"nearly":[153],"57%":[154],"loss":[158],"compared":[159],"with":[160],"once-occur-then-rollback":[162],"approach.":[163]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}