{"id":"https://openalex.org/W4233628565","doi":"https://doi.org/10.1109/date.2010.5457242","title":"Multicore soft error rate stabilization using adaptive dual modular redundancy","display_name":"Multicore soft error rate stabilization using adaptive dual modular redundancy","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W4233628565","doi":"https://doi.org/10.1109/date.2010.5457242"},"language":"en","primary_location":{"id":"doi:10.1109/date.2010.5457242","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457242","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016028914","display_name":"Ramakrishna Vadlamani","orcid":null},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ramakrishna Vadlamani","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101724268","display_name":"Jia Zhao","orcid":"https://orcid.org/0000-0003-3838-0582"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jia Zhao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033415719","display_name":"Wayne Burleson","orcid":"https://orcid.org/0000-0002-7068-4351"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wayne Burleson","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012168703","display_name":"Russell Tessier","orcid":"https://orcid.org/0000-0003-0591-7566"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Russell Tessier","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5016028914"],"corresponding_institution_ids":["https://openalex.org/I24603500"],"apc_list":null,"apc_paid":null,"fwci":3.5232,"has_fulltext":false,"cited_by_count":77,"citation_normalized_percentile":{"value":0.9322561,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"27","last_page":"32"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.7877877354621887},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7426040172576904},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.7397096753120422},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7091327905654907},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6199596524238586},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5941461324691772},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.571759819984436},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.570472240447998},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4814309775829315},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.43588581681251526},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.4285633862018585},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.38923612236976624},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3785717189311981},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3605048954486847},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.24747416377067566},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.24139699339866638},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.23117202520370483},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.17473015189170837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12444227933883667},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12243452668190002}],"concepts":[{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.7877877354621887},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7426040172576904},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.7397096753120422},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7091327905654907},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6199596524238586},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5941461324691772},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.571759819984436},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.570472240447998},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4814309775829315},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.43588581681251526},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.4285633862018585},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.38923612236976624},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3785717189311981},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3605048954486847},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.24747416377067566},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.24139699339866638},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.23117202520370483},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.17473015189170837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12444227933883667},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12243452668190002},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2010.5457242","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457242","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1991753666","https://openalex.org/W2013642378","https://openalex.org/W2038769854","https://openalex.org/W2043318181","https://openalex.org/W2096834828","https://openalex.org/W2118033476","https://openalex.org/W2122224409","https://openalex.org/W2127664190","https://openalex.org/W2133507530","https://openalex.org/W2139613807","https://openalex.org/W2142358791","https://openalex.org/W2152165066","https://openalex.org/W3140903683","https://openalex.org/W3148719811","https://openalex.org/W4249144718","https://openalex.org/W4256365438","https://openalex.org/W6680717467","https://openalex.org/W6792941224"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2154351074","https://openalex.org/W2151223307","https://openalex.org/W1970479385","https://openalex.org/W2078707653","https://openalex.org/W2604133224","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W4224229821","https://openalex.org/W2023400509"],"abstract_inverted_index":{"The":[0,98],"use":[1],"of":[2,22,51],"dynamic":[3],"voltage":[4],"and":[5,112,118,139],"frequency":[6],"scaling":[7],"(DVFS)":[8],"in":[9,57,90,102,135],"contemporary":[10],"multicores":[11],"provides":[12],"significant":[13],"protection":[14],"from":[15],"unpredictable":[16],"thermal":[17,96,116],"events.":[18,97],"A":[19],"side":[20],"effect":[21],"DVFS":[23,93],"can":[24],"be":[25],"an":[26,131],"increased":[27,60],"processor":[28,66],"exposure":[29],"to":[30,45,59,78,92],"soft":[31,83],"errors.":[32],"To":[33],"address":[34],"this":[35],"issue,":[36],"a":[37,48,80,108,124,140],"flexible":[38],"fault":[39],"prevention":[40],"mechanism":[41],"has":[42],"been":[43],"developed":[44],"selectively":[46],"enable":[47],"small":[49],"amount":[50],"per-core":[52],"dual":[53],"modular":[54],"redundancy":[55],"(DMR)":[56],"response":[58,91],"vulnerability,":[61],"as":[62],"measured":[63],"by":[64,87,95,143],"the":[65,105],"architectural":[67],"vulnerability":[68],"factor":[69],"(AVF).":[70],"Our":[71],"new":[72],"algorithm":[73,99],"for":[74],"DMR":[75,89,146,149],"deployment":[76],"aims":[77],"provide":[79],"stable":[81,141],"effective":[82],"error":[84],"rate":[85],"(SER)":[86],"using":[88,107,127,144],"caused":[94],"is":[100],"implemented":[101],"real-time":[103],"on":[104],"multicore":[106,119,125],"dedicated":[109],"monitor":[110],"network-on-chip":[111],"controller":[113],"which":[114],"evaluates":[115],"information":[117],"performance":[120],"statistics.":[121],"Experiments":[122],"with":[123],"simulator":[126],"standard":[128],"benchmarks":[129],"show":[130],"average":[132],"6%":[133],"improvement":[134],"overall":[136],"power":[137],"consumption":[138],"SER":[142],"selective":[145],"versus":[147],"continuous":[148],"deployment.":[150]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-12T06:13:28.667946","created_date":"2025-10-10T00:00:00"}