{"id":"https://openalex.org/W4243014576","doi":"https://doi.org/10.1109/date.2010.5457206","title":"IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults","display_name":"IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W4243014576","doi":"https://doi.org/10.1109/date.2010.5457206"},"language":"en","primary_location":{"id":"doi:10.1109/date.2010.5457206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016799154","display_name":"Songjun Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Songjun Pan","raw_affiliation_strings":["Chinese Academy of Sciences, Beijing, China","Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100300984","display_name":"Yu Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Hu","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy and Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5016799154"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":1.4432,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.84729954,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"238","last_page":"243"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.7096640467643738},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6804874539375305},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6341152787208557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.630342960357666},{"id":"https://openalex.org/keywords/register-file","display_name":"Register file","score":0.5879409909248352},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5790717601776123},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5226193070411682},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.49533095955848694},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.44859421253204346},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.44817742705345154},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2203267216682434},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18543657660484314},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.16104289889335632},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.14689737558364868},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.12893706560134888},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.10867545008659363},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.0933864414691925}],"concepts":[{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.7096640467643738},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6804874539375305},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6341152787208557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.630342960357666},{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.5879409909248352},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5790717601776123},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5226193070411682},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49533095955848694},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.44859421253204346},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.44817742705345154},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2203267216682434},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18543657660484314},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.16104289889335632},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.14689737558364868},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.12893706560134888},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10867545008659363},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0933864414691925},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2010.5457206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W147650083","https://openalex.org/W2017521824","https://openalex.org/W2096865422","https://openalex.org/W2100866260","https://openalex.org/W2101395364","https://openalex.org/W2107635292","https://openalex.org/W2116059696","https://openalex.org/W2119610788","https://openalex.org/W2119963115","https://openalex.org/W2123907700","https://openalex.org/W2145064068","https://openalex.org/W2153456949","https://openalex.org/W2163208120","https://openalex.org/W2169213530","https://openalex.org/W2171085247","https://openalex.org/W3140488055","https://openalex.org/W4245052796","https://openalex.org/W4249144718","https://openalex.org/W6605987033"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2407896","https://openalex.org/W2078707653","https://openalex.org/W1990419382","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2133971626"],"abstract_inverted_index":{"With":[0],"the":[1,21,50,62,87,99,132,159],"advancement":[2],"of":[3,23,52,64,89,134,142],"CMOS":[4],"manufacturing":[5],"process":[6],"to":[7,16,26,36,48,55,67,85,92,119,158,163],"nano-scale,":[8],"future":[9],"shipped":[10],"microprocessors":[11],"will":[12],"be":[13],"increasingly":[14],"vulnerable":[15,161],"intermittent":[17,27,68,81,93,102],"faults.":[18,94],"Quantitatively":[19],"characterizing":[20],"vulnerability":[22,51,63,82,88],"microprocessor":[24,53,90],"structures":[25,54,66,91,151,162],"faults":[28,69],"at":[29],"early":[30],"design":[31],"stage":[32],"is":[33,98,137],"significantly":[34,148],"helpful":[35],"balance":[37],"system":[38,165],"performance":[39],"and":[40,58,125,152],"reliability.":[41],"Prior":[42],"researches":[43],"have":[44],"proposed":[45],"several":[46],"metrics":[47],"characterize":[49,86],"soft":[56],"errors":[57],"permanent":[59],"faults,":[60],"however,":[61],"these":[65],"are":[70],"still":[71],"rarely":[72],"considered.":[73],"In":[74],"this":[75],"work,":[76],"we":[77],"propose":[78],"a":[79,114],"metric":[80],"factor":[83],"(IVF)":[84],"A":[95],"structure's":[96],"IVF":[97,133,146],"probability":[100],"an":[101,108],"fault":[103],"in":[104],"that":[105,131,141],"structure":[106],"causes":[107],"external":[109],"visible":[110],"error.":[111],"We":[112],"instrument":[113],"cycle-accurate":[115],"execution-driven":[116],"simulator":[117],"Sim-Alpha":[118],"compute":[120],"IVFs":[121],"for":[122],"reorder":[123,135],"buffer":[124,136],"register":[126,143],"file.":[127,144],"Experimental":[128],"results":[129],"show":[130],"much":[138],"higher":[139],"than":[140],"Besides,":[145],"varies":[147],"across":[149],"different":[150],"workloads,":[153],"which":[154],"implies":[155],"partial":[156],"protection":[157],"most":[160],"improve":[164],"reliability":[166],"with":[167],"less":[168],"overhead.":[169]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}