{"id":"https://openalex.org/W4246352371","doi":"https://doi.org/10.1109/date.2010.5457131","title":"Programmable aging sensor for automotive safety-critical applications","display_name":"Programmable aging sensor for automotive safety-critical applications","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W4246352371","doi":"https://doi.org/10.1109/date.2010.5457131"},"language":"en","primary_location":{"id":"doi:10.1109/date.2010.5457131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088066283","display_name":"J. C. Vazquez","orcid":null},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX","PT"],"is_corresponding":false,"raw_author_name":"J C Vazquez","raw_affiliation_strings":["INESC-ID, Lisboa, Portugal","Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"V Champac","raw_affiliation_strings":["Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Nacional de Astrof\u00edsica Optica y Electr\u00f3nica, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039557784","display_name":"I.C. Teixeira","orcid":"https://orcid.org/0000-0002-2642-5619"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"I C Teixeira","raw_affiliation_strings":["INESC-ID, Lisboa, Portugal","Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201","https://openalex.org/I4387152517"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047445549","display_name":"Marcelino Santos","orcid":"https://orcid.org/0000-0002-2091-1165"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"M B Santos","raw_affiliation_strings":["INESC-ID, Lisboa, Portugal","Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201","https://openalex.org/I4387152517"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058862498","display_name":"J.P. Teixeira","orcid":"https://orcid.org/0000-0002-0379-6257"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"J P Teixeira","raw_affiliation_strings":["INESC-ID, Lisboa, Portugal","Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"INESC-ID, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"Instituto Superior T\u00e9cnico (IST), UTL, Lisboa, Portugal","institution_ids":["https://openalex.org/I121345201","https://openalex.org/I4387152517"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"618","last_page":"621"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7392764687538147},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6897841095924377},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6063345670700073},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5875713229179382},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5156013369560242},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47744685411453247},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.46174389123916626},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45029354095458984},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.41319942474365234},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.41236400604248047},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.40904420614242554},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3741969168186188},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3086286187171936},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29876023530960083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19890910387039185}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7392764687538147},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6897841095924377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6063345670700073},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5875713229179382},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5156013369560242},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47744685411453247},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.46174389123916626},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45029354095458984},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.41319942474365234},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.41236400604248047},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.40904420614242554},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3741969168186188},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3086286187171936},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29876023530960083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19890910387039185},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2010.5457131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1595368737","https://openalex.org/W2027660975","https://openalex.org/W2099679924","https://openalex.org/W2103792078","https://openalex.org/W2105619224","https://openalex.org/W2122757690","https://openalex.org/W2141565132","https://openalex.org/W2143591075","https://openalex.org/W2144302754","https://openalex.org/W2146410479","https://openalex.org/W2165221819","https://openalex.org/W2171702041","https://openalex.org/W3140488055","https://openalex.org/W4234640396","https://openalex.org/W4237900519","https://openalex.org/W6635424516","https://openalex.org/W6677500415","https://openalex.org/W6679644487","https://openalex.org/W6681681969"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2351672553","https://openalex.org/W2373392303","https://openalex.org/W2765894405","https://openalex.org/W1884735063","https://openalex.org/W2372668238","https://openalex.org/W2560421750","https://openalex.org/W645600747"],"abstract_inverted_index":{"Electronic":[0],"systems":[1],"for":[2,8],"safety-critical":[3],"automotive":[4],"applications":[5],"must":[6],"operate":[7],"many":[9],"years":[10],"in":[11],"harsh":[12],"environments.":[13],"Reliability":[14],"issues":[15,34],"are":[16,27,108],"worsening":[17],"with":[18,102],"device":[19],"scaling":[20],"down,":[21],"while":[22],"performance":[23,37],"and":[24,87,97],"quality":[25],"requirements":[26],"increasing.":[28],"One":[29],"of":[30,64,83,114],"the":[31,112,115],"key":[32],"reliability":[33],"is":[35,67],"long-term":[36],"degradation":[38],"due":[39],"to":[40,60,68,91],"aging.":[41],"For":[42],"safe":[43],"operation,":[44],"aging":[45,55,74,78],"monitoring":[46],"should":[47],"be":[48],"performed":[49],"on":[50],"chip,":[51],"namely":[52],"using":[53],"built-in":[54],"sensors":[56],"(activated":[57],"from":[58],"time":[59],"time).":[61],"The":[62,76],"purpose":[63],"this":[65],"paper":[66],"present":[69],"a":[70,103],"novel":[71],"programmable":[72],"nanometer":[73],"sensor.":[75],"proposed":[77,116],"sensor":[79,106],"allows":[80],"several":[81],"levels":[82],"circuit":[84],"failure":[85],"prediction":[86],"exhibits":[88],"low":[89],"sensitivity":[90],"PVT":[92],"(Process,":[93],"power":[94],"supply":[95],"Voltage":[96],"Temperature)":[98],"variations.":[99],"Simulation":[100],"results":[101],"65":[104],"nm":[105],"design":[107],"presented,":[109],"that":[110],"ascertain":[111],"usefulness":[113],"solution.":[117]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}