{"id":"https://openalex.org/W4246085191","doi":"https://doi.org/10.1109/date.2010.5457025","title":"NIM- a noise index model to estimate delay discrepancies between silicon and simulation","display_name":"NIM- a noise index model to estimate delay discrepancies between silicon and simulation","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W4246085191","doi":"https://doi.org/10.1109/date.2010.5457025"},"language":"en","primary_location":{"id":"doi:10.1109/date.2010.5457025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028556229","display_name":"Elif Alpaslan","orcid":null},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Elif Alpaslan","raw_affiliation_strings":["Division of Engineering, Brown University, Providence, USA"],"affiliations":[{"raw_affiliation_string":"Division of Engineering, Brown University, Providence, USA","institution_ids":["https://openalex.org/I27804330"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044465911","display_name":"Jennifer Dworak","orcid":null},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jennifer Dworak","raw_affiliation_strings":["Division of Engineering, Brown University, Providence, USA"],"affiliations":[{"raw_affiliation_string":"Division of Engineering, Brown University, Providence, USA","institution_ids":["https://openalex.org/I27804330"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013997501","display_name":"B. Kruseman","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bram Kruseman","raw_affiliation_strings":["Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven, Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035706027","display_name":"Ananta K Majhi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ananta K Majhi","raw_affiliation_strings":["Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven, Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004698748","display_name":"Wilmar M Heuvelman","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wilmar M Heuvelman","raw_affiliation_strings":["Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven, Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109248404","display_name":"Paul van de Wiel","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Paul van de Wiel","raw_affiliation_strings":["Eindhoven, Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven, Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5028556229"],"corresponding_institution_ids":["https://openalex.org/I27804330"],"apc_list":null,"apc_paid":null,"fwci":0.7491,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.75831165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"97","issue":null,"first_page":"1373","last_page":"1376"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7902530431747437},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6324646472930908},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6172959208488464},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.6049385070800781},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5702324509620667},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5615733861923218},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.49466726183891296},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4716039299964905},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1678462028503418},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13110890984535217},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10147273540496826},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.09422847628593445}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7902530431747437},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6324646472930908},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6172959208488464},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.6049385070800781},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5702324509620667},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5615733861923218},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.49466726183891296},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4716039299964905},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1678462028503418},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13110890984535217},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10147273540496826},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.09422847628593445},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2010.5457025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W616429135","https://openalex.org/W1976944456","https://openalex.org/W1980499623","https://openalex.org/W2083231191","https://openalex.org/W2096842682","https://openalex.org/W2104295613","https://openalex.org/W2109791184","https://openalex.org/W2126157463","https://openalex.org/W2127807526","https://openalex.org/W2155202144","https://openalex.org/W2157080063","https://openalex.org/W2168670003","https://openalex.org/W2171474236","https://openalex.org/W3141795114","https://openalex.org/W3143337210","https://openalex.org/W3151076167","https://openalex.org/W4237840841","https://openalex.org/W4242987207","https://openalex.org/W4249541960","https://openalex.org/W6678647550","https://openalex.org/W6683155022","https://openalex.org/W6684236933","https://openalex.org/W6684847144"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2313216219","https://openalex.org/W4249541960","https://openalex.org/W2107551409"],"abstract_inverted_index":{"As":[0],"CMOS":[1],"technology":[2],"continues":[3],"to":[4,34,49,82,102],"scale,":[5],"the":[6,13,46,50,60,66,84,97,103,109,113,144,149],"accurate":[7],"prediction":[8],"of":[9,15,62,68,99,108],"silicon":[10,117,154],"timing":[11,25,40,51],"through":[12],"use":[14],"pre-silicon":[16],"modeling":[17],"and":[18,55,88,105,129,148,153],"analysis":[19],"has":[20],"become":[21],"especially":[22],"difficult.":[23],"These":[24],"mismatches":[26],"are":[27],"important":[28],"because":[29],"they":[30],"make":[31],"it":[32],"hard":[33],"accurately":[35],"design":[36,128],"circuits":[37],"that":[38,137],"meet":[39],"specifications":[41],"at":[42],"first-silicon.":[43],"Among":[44],"all":[45],"parameters":[47],"leading":[48],"discrepancy":[52],"between":[53,86,143,151],"simulation":[54],"silicon,":[56],"this":[57],"paper":[58],"studies":[59],"effect":[61],"dynamic":[63],"IR-drop":[64],"on":[65,119],"delay":[67],"a":[69,73,138],"path.":[70],"We":[71,135],"propose":[72],"noise":[74,93,145],"index":[75,94,146],"model,":[76],"NIM,":[77],"which":[78],"can":[79],"be":[80],"used":[81],"predict":[83],"mismatch":[85],"expected":[87],"real":[89],"path":[90,104],"delays.":[91],"The":[92],"considers":[95],"both":[96],"proximity":[98],"switching":[100],"activity":[101],"physical":[106],"characteristics":[107],"design.":[110],"To":[111],"evaluate":[112],"method,":[114],"we":[115],"performed":[116],"measurements":[118],"randomly":[120],"selected":[121],"paths":[122],"from":[123],"an":[124],"industrial":[125],"65":[126],"nm":[127],"compared":[130],"these":[131],"with":[132],"Spice":[133],"simulations.":[134],"show":[136],"very":[139],"strong":[140],"correlation":[141],"exists":[142],"model":[147],"deviations":[150],"simulations":[152],"measurements.":[155]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}