{"id":"https://openalex.org/W4242774919","doi":"https://doi.org/10.1109/date.2010.5457003","title":"Enhancing double-patterning detailed routing with lazy coloring and within-path conflict avoidance","display_name":"Enhancing double-patterning detailed routing with lazy coloring and within-path conflict avoidance","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W4242774919","doi":"https://doi.org/10.1109/date.2010.5457003"},"language":"en","primary_location":{"id":"doi:10.1109/date.2010.5457003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058706214","display_name":"Xin Gao","orcid":"https://orcid.org/0000-0002-6671-7560"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xin Gao","raw_affiliation_strings":["Department of Electrical Engineering, University of Hawaii, Manoa, Honolulu, HI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Hawaii, Manoa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052069851","display_name":"L. Macchiarulo","orcid":"https://orcid.org/0009-0004-1141-0344"},"institutions":[{"id":"https://openalex.org/I117965899","display_name":"University of Hawai\u02bbi at M\u0101noa","ror":"https://ror.org/01wspgy28","country_code":"US","type":"education","lineage":["https://openalex.org/I117965899"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luca Macchiarulo","raw_affiliation_strings":["Department of Electrical Engineering, University of Hawaii, Manoa, Honolulu, HI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Hawaii, Manoa, Honolulu, HI, USA","institution_ids":["https://openalex.org/I117965899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5058706214"],"corresponding_institution_ids":["https://openalex.org/I117965899"],"apc_list":null,"apc_paid":null,"fwci":1.4432,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.84729412,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"6521","issue":null,"first_page":"1279","last_page":"1284"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.7477614879608154},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7217219471931458},{"id":"https://openalex.org/keywords/overlay","display_name":"Overlay","score":0.5994170904159546},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5749828815460205},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5062688589096069},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.4937652051448822},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.472371369600296},{"id":"https://openalex.org/keywords/multiple-patterning","display_name":"Multiple patterning","score":0.415999174118042},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.31609439849853516},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1394035518169403},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.08782383799552917}],"concepts":[{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.7477614879608154},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7217219471931458},{"id":"https://openalex.org/C136085584","wikidata":"https://www.wikidata.org/wiki/Q910289","display_name":"Overlay","level":2,"score":0.5994170904159546},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5749828815460205},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5062688589096069},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.4937652051448822},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.472371369600296},{"id":"https://openalex.org/C177409738","wikidata":"https://www.wikidata.org/wiki/Q1917460","display_name":"Multiple patterning","level":4,"score":0.415999174118042},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.31609439849853516},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1394035518169403},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.08782383799552917},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C53524968","wikidata":"https://www.wikidata.org/wiki/Q7315582","display_name":"Resist","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2010.5457003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2010.5457003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1970086667","https://openalex.org/W1985761733","https://openalex.org/W1990184359","https://openalex.org/W2041600236","https://openalex.org/W2094370252","https://openalex.org/W2118866757","https://openalex.org/W2146192871","https://openalex.org/W4254569978","https://openalex.org/W6647904913","https://openalex.org/W6660964161","https://openalex.org/W6673907574","https://openalex.org/W6681512425"],"related_works":["https://openalex.org/W1595862343","https://openalex.org/W2098330390","https://openalex.org/W2094793671","https://openalex.org/W1980872675","https://openalex.org/W2036839078","https://openalex.org/W2047305564","https://openalex.org/W2102664849","https://openalex.org/W3115337098","https://openalex.org/W2334021962","https://openalex.org/W2368328740"],"abstract_inverted_index":{"Double":[0],"patterning":[1],"technology":[2,9],"(DPT)":[3],"is":[4],"emerging":[5],"as":[6],"the":[7,12,30,72],"dominant":[8],"to":[10,37,70],"achieve":[11],"32-nm":[13],"node":[14],"and":[15,25,58],"beyond.":[16],"Two":[17],"challenges":[18],"faced":[19],"by":[20,76],"DPT":[21,39],"are":[22,68],"layout":[23],"decomposition":[24],"overlay":[26],"error.":[27],"To":[28],"handle":[29],"challenges,":[31],"some":[32],"effort":[33],"has":[34],"been":[35],"made":[36],"consider":[38],"during":[40],"detailed":[41,53],"routing.":[42],"In":[43],"this":[44],"paper,":[45],"we":[46],"propose":[47],"two":[48],"enhancing":[49],"techniques":[50,67],"for":[51],"DPT-friendly":[52],"routing:":[54],"lazy":[55],"color":[56],"decision":[57],"last":[59],"conflict":[60],"segment":[61],"recording.":[62],"Experiments":[63],"show":[64],"that":[65],"our":[66],"able":[69],"reduce":[71],"number":[73],"of":[74],"stitches":[75],"15~20%":[77],"with":[78],"4%":[79],"increase":[80],"in":[81],"running":[82],"time.":[83]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}