{"id":"https://openalex.org/W3144372847","doi":"https://doi.org/10.1109/date.2009.5090714","title":"Improving yield and reliability of chip multiprocessors","display_name":"Improving yield and reliability of chip multiprocessors","publication_year":2009,"publication_date":"2009-04-01","ids":{"openalex":"https://openalex.org/W3144372847","doi":"https://doi.org/10.1109/date.2009.5090714","mag":"3144372847"},"language":"en","primary_location":{"id":"doi:10.1109/date.2009.5090714","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090714","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation & Test in Europe Conference & Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077520791","display_name":"Alfred A. Pan","orcid":"https://orcid.org/0000-0003-0708-7834"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Pan","raw_affiliation_strings":["University Of Massachusetts, Amherst, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048129220","display_name":"Omer Khan","orcid":"https://orcid.org/0000-0001-6293-7403"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Khan","raw_affiliation_strings":["University Of Massachusetts, Amherst, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054064879","display_name":"Sandip Kundu","orcid":"https://orcid.org/0000-0001-8221-3824"},"institutions":[{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Kundu","raw_affiliation_strings":["University Of Massachusetts, Amherst, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24603500"],"apc_list":null,"apc_paid":null,"fwci":2.4271,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.89967218,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"490","last_page":"495"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7266821265220642},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.604912519454956},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.6048806309700012},{"id":"https://openalex.org/keywords/coprocessor","display_name":"Coprocessor","score":0.5421328544616699},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5379830598831177},{"id":"https://openalex.org/keywords/multiprocessing","display_name":"Multiprocessing","score":0.5168171525001526},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4975273907184601},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4800913631916046},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.43756672739982605},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3891851007938385},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.19503605365753174},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1231856644153595}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7266821265220642},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.604912519454956},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.6048806309700012},{"id":"https://openalex.org/C86111242","wikidata":"https://www.wikidata.org/wiki/Q859595","display_name":"Coprocessor","level":2,"score":0.5421328544616699},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5379830598831177},{"id":"https://openalex.org/C4822641","wikidata":"https://www.wikidata.org/wiki/Q846651","display_name":"Multiprocessing","level":2,"score":0.5168171525001526},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4975273907184601},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4800913631916046},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.43756672739982605},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3891851007938385},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.19503605365753174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1231856644153595},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/date.2009.5090714","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090714","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation & Test in Europe Conference & Exhibition","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarworks.umass.edu:20.500.14394/21577","is_oa":false,"landing_page_url":"https://hdl.handle.net/20.500.14394/21577","pdf_url":null,"source":{"id":"https://openalex.org/S4306402057","display_name":"Scholarworks (University of Massachusetts Amherst)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I24603500","host_organization_name":"University of Massachusetts Amherst","host_organization_lineage":["https://openalex.org/I24603500"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"published","raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1925913808","https://openalex.org/W1973039798","https://openalex.org/W2051747677","https://openalex.org/W2053117197","https://openalex.org/W2073237284","https://openalex.org/W2095767129","https://openalex.org/W2104086123","https://openalex.org/W2105415532","https://openalex.org/W2106780604","https://openalex.org/W2120712411","https://openalex.org/W2125169487","https://openalex.org/W2125890858","https://openalex.org/W2127633472","https://openalex.org/W2151913116","https://openalex.org/W2159596684","https://openalex.org/W2172278174","https://openalex.org/W2916411819","https://openalex.org/W3004266210","https://openalex.org/W4237281620","https://openalex.org/W4242482135","https://openalex.org/W4248445118","https://openalex.org/W6678799711","https://openalex.org/W6679236733"],"related_works":["https://openalex.org/W2137567370","https://openalex.org/W2378211422","https://openalex.org/W1988690899","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W4246352526","https://openalex.org/W2326041751"],"abstract_inverted_index":{"An":[0],"increasing":[1],"number":[2],"of":[3,30,112,115,133],"hardware":[4],"failures":[5],"can":[6,174],"be":[7],"attributed":[8],"to":[9,39,82,89,103,119,129,176,192],"device":[10],"reliability":[11,29],"problems":[12],"that":[13,36,51,66,93,148],"cause":[14],"partial":[15,143],"system":[16,136],"failure":[17],"or":[18,139],"shutdown.":[19],"In":[20,117],"this":[21,121],"paper":[22],"we":[23,123,173],"propose":[24],"a":[25,31,70,77,80,87,126,134,150,157,164,168],"scheme":[26],"for":[27,63,167],"improving":[28],"homogeneous":[32],"chip":[33],"multiprocessor":[34],"(CMP)":[35],"also":[37],"serves":[38],"improve":[40,104],"manufacturing":[41],"yield.":[42],"Our":[43,145],"solution":[44],"centers":[45],"on":[46,79],"exploiting":[47],"the":[48,94,110,131],"natural":[49],"redundancy":[50],"already":[52],"exists":[53],"in":[54,69,163],"multi-core":[55],"systems":[56],"by":[57],"using":[58],"services":[59],"from":[60,183],"other":[61],"cores":[62,141,185],"functional":[64],"units":[65],"are":[67],"defective":[68],"faulty":[71,179],"core.":[72],"A":[73],"micro-architectural":[74],"modification":[75],"allows":[76],"core":[78,85,180],"CMP":[81],"use":[83],"another":[84],"as":[86,156,187,189],"coprocessor":[88],"service":[90,100],"any":[91],"instruction":[92],"former":[95],"cannot":[96],"execute":[97],"correctly.":[98],"This":[99],"is":[101],"accessed":[102],"yield":[105],"and":[106,152,194],"reliability,":[107],"but":[108],"at":[109],"cost":[111],"some":[113],"loss":[114,122],"performance.":[116],"order":[118],"quantify":[120],"have":[124],"used":[125],"cycle-accurate":[127],"simulator":[128],"simulate":[130],"performance":[132,193],"dual-core":[135],"with":[137,181,186],"one":[138],"two":[140],"sustaining":[142],"failure.":[144],"results":[146],"indicate":[147],"when":[149],"large":[151],"sparingly-used":[153],"unit":[154,161],"such":[155],"floating":[158,169],"point":[159,170],"arithmetic":[160],"fails":[162],"core,":[165],"even":[166],"intensive":[171],"benchmark,":[172],"continue":[175],"run":[177],"each":[178],"help":[182],"companion":[184],"little":[188],"10%":[190],"impact":[191],"less":[195],"than":[196],"1%":[197],"area":[198],"overhead.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}