{"id":"https://openalex.org/W3146604028","doi":"https://doi.org/10.1109/date.2009.5090685","title":"TRAM: A tool for Temperature and Reliability Aware Memory Design","display_name":"TRAM: A tool for Temperature and Reliability Aware Memory Design","publication_year":2009,"publication_date":"2009-04-01","ids":{"openalex":"https://openalex.org/W3146604028","doi":"https://doi.org/10.1109/date.2009.5090685","mag":"3146604028"},"language":"en","primary_location":{"id":"doi:10.1109/date.2009.5090685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation &amp; Test in Europe Conference &amp; Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077252302","display_name":"Amin Khajeh","orcid":"https://orcid.org/0000-0003-0770-0109"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Khajeh","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040193683","display_name":"Aseem Gupta","orcid":"https://orcid.org/0009-0002-8600-1639"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Gupta","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007817952","display_name":"Nikil Dutt","orcid":"https://orcid.org/0000-0002-3060-8119"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Dutt","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Kurdahi","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013660772","display_name":"Ahmed M. Eltawil","orcid":"https://orcid.org/0000-0003-1849-083X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Eltawil","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077269784","display_name":"K.S. Khouri","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Khouri","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011349515","display_name":"Magdy S. Abadir","orcid":"https://orcid.org/0000-0003-4046-2472"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Abadir","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"340","last_page":"345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8156362771987915},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.6330917477607727},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5974094867706299},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.561108410358429},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.5584045648574829},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5232778191566467},{"id":"https://openalex.org/keywords/thermal-management-of-electronic-devices-and-systems","display_name":"Thermal management of electronic devices and systems","score":0.4937938153743744},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4236643314361572},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28936976194381714},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20002290606498718},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16917088627815247},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16525158286094666},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.10493728518486023},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08542114496231079}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8156362771987915},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.6330917477607727},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5974094867706299},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.561108410358429},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.5584045648574829},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5232778191566467},{"id":"https://openalex.org/C114834414","wikidata":"https://www.wikidata.org/wiki/Q15477170","display_name":"Thermal management of electronic devices and systems","level":2,"score":0.4937938153743744},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4236643314361572},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28936976194381714},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20002290606498718},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16917088627815247},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16525158286094666},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.10493728518486023},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08542114496231079},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/date.2009.5090685","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation &amp; Test in Europe Conference &amp; Exhibition","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.619.3544","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.619.3544","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://newport.eecs.uci.edu/~aeltawil/Publications/Conferences/C32.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1607915263","https://openalex.org/W1661368752","https://openalex.org/W1990935421","https://openalex.org/W2111596650","https://openalex.org/W2122087341","https://openalex.org/W2122130138","https://openalex.org/W2130342263","https://openalex.org/W2132621842","https://openalex.org/W2146018705","https://openalex.org/W2159974434","https://openalex.org/W2168101540","https://openalex.org/W2168559772","https://openalex.org/W2978217928","https://openalex.org/W4232226099","https://openalex.org/W6683811732"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Memories":[0],"are":[1],"increasingly":[2],"dominating":[3],"Systems":[4],"on":[5,44,76,146],"Chip":[6],"(SoC)":[7],"designs":[8],"and":[9,22,42,47,54,74,105],"thus":[10],"contribute":[11],"a":[12,29,52,79],"large":[13],"percentage":[14],"of":[15,35,68,91,93,103,110],"the":[16,33,66,113,132],"total":[17,133],"system's":[18],"power":[19,72,134],"dissipation,":[20,73],"area":[21],"reliability.":[23],"In":[24],"this":[25],"paper,":[26],"we":[27],"present":[28],"tool":[30],"which":[31,61],"captures":[32],"effects":[34,67],"supply":[36,70],"voltage":[37],"V":[38,123],"<sub":[39,124],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40,125],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dd</sub>":[41,126],"temperature":[43,75],"memory":[45],"performance":[46],"their":[48],"interrelationships.":[49],"We":[50,117],"propose":[51],"Temperature-":[53],"Reliability-":[55],"Aware":[56],"Memory":[57],"Design":[58],"(TRAM)":[59],"approach":[60],"allows":[62],"designers":[63],"to":[64,107,138],"examine":[65],"frequency,":[69],"voltage,":[71],"reliability":[77],"in":[78],"mutually":[80],"interrelated":[81],"manner.":[82],"Our":[83],"experimental":[84],"results":[85],"indicate":[86],"that":[87,120],"thermal":[88,121],"unaware":[89],"estimation":[90],"probability":[92],"error":[94],"can":[95,130],"be":[96],"off":[97],"by":[98,136],"at":[99],"least":[100],"two":[101],"orders":[102,109],"magnitude":[104,111],"up":[106,137],"five":[108],"from":[112],"realistic,":[114],"temperature-aware":[115],"cases.":[116],"also":[118],"observed":[119],"aware":[122],"selection":[127],"using":[128],"TRAM":[129],"reduce":[131],"dissipation":[135],"2.5times":[139],"while":[140],"attaining":[141],"an":[142],"identical":[143],"predefined":[144],"limit":[145],"errors.":[147]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}