{"id":"https://openalex.org/W3151359730","doi":"https://doi.org/10.1109/date.2009.5090681","title":"Incorporating graceful degradation into embedded system design","display_name":"Incorporating graceful degradation into embedded system design","publication_year":2009,"publication_date":"2009-04-01","ids":{"openalex":"https://openalex.org/W3151359730","doi":"https://doi.org/10.1109/date.2009.5090681","mag":"3151359730"},"language":"en","primary_location":{"id":"doi:10.1109/date.2009.5090681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation & Test in Europe Conference & Exhibition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"M. Glass","orcid":null},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"M. Glass","raw_affiliation_strings":["Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, DE"],"affiliations":[{"raw_affiliation_string":"Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Bayern, DE","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043887536","display_name":"Martin Lukasiewycz","orcid":null},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Lukasiewycz","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063619304","display_name":"Christian Haubelt","orcid":"https://orcid.org/0000-0002-1568-5423"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Haubelt","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076672029","display_name":"J\u00fcrgen Teich","orcid":"https://orcid.org/0000-0001-6285-5862"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J. Teich","raw_affiliation_strings":["University of Erlangen-Nuremberg, Germany"],"affiliations":[{"raw_affiliation_string":"University of Erlangen-Nuremberg, Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I181369854"],"apc_list":null,"apc_paid":null,"fwci":0.2712,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.64655172,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"2","issue":null,"first_page":"320","last_page":"323"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7798396348953247},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6796327829360962},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6763431429862976},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6037623286247253},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5680156946182251},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.5478786826133728},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4685674011707306},{"id":"https://openalex.org/keywords/resource","display_name":"Resource (disambiguation)","score":0.45619139075279236},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4548330008983612},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.45255011320114136},{"id":"https://openalex.org/keywords/resource-allocation","display_name":"Resource allocation","score":0.4265252351760864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22806531190872192},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08327987790107727},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.07285702228546143}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7798396348953247},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6796327829360962},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6763431429862976},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6037623286247253},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5680156946182251},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.5478786826133728},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4685674011707306},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.45619139075279236},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4548330008983612},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.45255011320114136},{"id":"https://openalex.org/C29202148","wikidata":"https://www.wikidata.org/wiki/Q287260","display_name":"Resource allocation","level":2,"score":0.4265252351760864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22806531190872192},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08327987790107727},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.07285702228546143},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2009.5090681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 Design, Automation & Test in Europe Conference & Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1950313600","https://openalex.org/W1968054699","https://openalex.org/W2048972217","https://openalex.org/W2080267935","https://openalex.org/W2099202057","https://openalex.org/W2106545286","https://openalex.org/W2115299214","https://openalex.org/W2116758077","https://openalex.org/W2151781992","https://openalex.org/W2153726799","https://openalex.org/W3148113800","https://openalex.org/W3148341734","https://openalex.org/W4256752174","https://openalex.org/W6635028985","https://openalex.org/W6675768715"],"related_works":["https://openalex.org/W2012531322","https://openalex.org/W2534928293","https://openalex.org/W2785900585","https://openalex.org/W2353730437","https://openalex.org/W2490303674","https://openalex.org/W2609066826","https://openalex.org/W2150099345","https://openalex.org/W2810752900","https://openalex.org/W3186538219","https://openalex.org/W2365677836"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"the":[3,8,20,33,37,45,65,68,84,89,97,105,111,114],"focus":[4],"is":[5,41],"put":[6],"on":[7,36],"behavior":[9,49],"of":[10,27,32,67,104,113],"a":[11,15,29,53,59,93,101],"system":[12,21],"in":[13],"case":[14,108],"fault":[16],"occurs":[17],"that":[18,43,63],"disables":[19],"from":[22],"executing":[23,28],"its":[24],"applications.":[25],"Instead":[26],"random":[30],"subset":[31],"applications":[34],"depending":[35],"fault,":[38],"an":[39,78],"approach":[40],"presented":[42],"optimizes":[44],"systems":[46],"structure":[47],"and":[48,71,74,96],"with":[50,92,100],"respect":[51],"to":[52],"possible":[54],"graceful":[55],"degradation.":[56],"It":[57],"includes":[58],"degradation-aware":[60],"reliability":[61],"analysis":[62],"guides":[64],"optimization":[66,95,103],"resource":[69],"allocation":[70],"function":[72],"distribution,":[73],"provides":[75],"data-structures":[76],"for":[77],"efficient":[79],"online":[80,98],"degradation":[81],"algorithm.":[82],"Thus,":[83],"proposed":[85,115],"methodology":[86],"covers":[87],"both,":[88],"design":[90],"phase":[91,99],"structural":[94],"behavioral":[102],"system.":[106],"A":[107],"study":[109],"shows":[110],"effectiveness":[112],"approach.":[116]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-25T23:56:10.502304","created_date":"2025-10-10T00:00:00"}