{"id":"https://openalex.org/W3144742869","doi":"https://doi.org/10.1109/date.2008.4484911","title":"Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication","display_name":"Impact of Leakage Current on Data Retention of RF-powered Devices During Amplitude-Modulation-based Communication","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W3144742869","doi":"https://doi.org/10.1109/date.2008.4484911","mag":"3144742869"},"language":"en","primary_location":{"id":"doi:10.1109/date.2008.4484911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2008.4484911","pdf_url":null,"source":{"id":"https://openalex.org/S4363607582","display_name":"2008 Design, Automation and Test in Europe","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Design, Automation and Test in Europe","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028279216","display_name":"Josef Haid","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Josef Haid","raw_affiliation_strings":["Infineon Technologies Austria AG, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038933325","display_name":"Bernd Zimek","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernd Zimek","raw_affiliation_strings":["Infineon Technologies Austria AG, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054369393","display_name":"Thomas Leutgeb","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Thomas Leutgeb","raw_affiliation_strings":["Infineon Technologies Austria AG, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108196490","display_name":"T. Kunemund","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Thomas Kunemund","raw_affiliation_strings":["Infineon Technologies Austria AG, Austria"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG, Austria","institution_ids":["https://openalex.org/I4210131793"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5028279216"],"corresponding_institution_ids":["https://openalex.org/I4210131793"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.50643275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":null,"first_page":"784","last_page":"787"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6497249007225037},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5723997354507446},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5700265765190125},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5448591113090515},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5157399773597717},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48128288984298706},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46531060338020325},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.4548322856426239},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4469986855983734},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4449637234210968},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41586342453956604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21794092655181885},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10196089744567871}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6497249007225037},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5723997354507446},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5700265765190125},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5448591113090515},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5157399773597717},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48128288984298706},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46531060338020325},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.4548322856426239},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4469986855983734},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4449637234210968},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41586342453956604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21794092655181885},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10196089744567871},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2008.4484911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2008.4484911","pdf_url":null,"source":{"id":"https://openalex.org/S4363607582","display_name":"2008 Design, Automation and Test in Europe","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 Design, Automation and Test in Europe","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2105524902","https://openalex.org/W2119836271","https://openalex.org/W2130342263","https://openalex.org/W2131862714","https://openalex.org/W2150526221","https://openalex.org/W4232706277","https://openalex.org/W4235547147","https://openalex.org/W6681979597"],"related_works":["https://openalex.org/W2143400404","https://openalex.org/W2069427488","https://openalex.org/W4281694563","https://openalex.org/W2801267388","https://openalex.org/W2080696413","https://openalex.org/W1506140395","https://openalex.org/W2163182355","https://openalex.org/W2744827311","https://openalex.org/W2558598037","https://openalex.org/W2376107070"],"abstract_inverted_index":{"Devices":[0],"powered":[1],"by":[2,105,131,151],"an":[3],"electromagnetic":[4],"field":[5,22,113],"are":[6,62,103],"inherently":[7],"power-constrained":[8],"and":[9,15,21],"thus":[10],"must":[11],"carefully":[12],"manage":[13],"static":[14,51],"dynamic":[16],"power.":[17],"High":[18],"ambient":[19],"temperatures":[20],"strengths":[23],"can":[24],"increase":[25],"the":[26,40,50,68,74,93,106,127,140],"temperature":[27],"of":[28,49,73,117],"RF-powered":[29,60],"devices":[30,61],"up":[31,152],"to":[32,43,45,70,153,162],"more":[33],"than":[34],"100":[35],"degrees":[36],"Celsius,":[37],"thereby":[38],"allowing":[39],"leakage":[41,84,118],"current":[42],"rise":[44],"a":[46,86],"dominating":[47],"portion":[48],"power":[52,144],"consumption.":[53],"Leakage":[54],"reduction":[55,85,119],"techniques":[56,120],"for":[57,92,99],"application":[58],"in":[59,64,137,147],"examined":[63],"this":[65],"paper":[66],"with":[67],"goal":[69],"avoid":[71],"malfunction":[72],"device":[75],"during":[76],"amplitude":[77],"modulation-based":[78],"communication.":[79],"Results":[80],"show":[81],"that":[82,102,122],"without":[83],"correct":[87],"operation":[88],"cannot":[89],"be":[90],"guaranteed":[91],"investigated":[94],"130":[95],"nm":[96],"process":[97],"technology":[98],"energy":[100],"gaps":[101,145],"defined":[104],"widely":[107],"applied":[108],"ISO/IEC":[109],"14443-2":[110],"standard":[111],"(100%":[112],"modulation).":[114],"The":[115],"evaluation":[116],"shows":[121],"applying":[123],"body":[124],"biasing":[125,136],"prolongs":[126],"data":[128,148],"retention":[129,149],"time":[130,150],"nearly":[132],"200%,":[133],"while":[134],"source":[135],"general":[138],"aggravated":[139],"circuit's":[141],"robustness":[142],"against":[143],"(reduction":[146],"76%":[154],"loss),":[155],"as":[156],"did":[157],"also":[158],"voltage":[159],"scaling":[160],"(up":[161],"98%":[163],"reduction).":[164]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}