{"id":"https://openalex.org/W4255993536","doi":"https://doi.org/10.1109/date.2004.1269053","title":"Status of IEEE testability standards 1149.4, 1532 and 1149.6","display_name":"Status of IEEE testability standards 1149.4, 1532 and 1149.6","publication_year":2004,"publication_date":"2004-07-20","ids":{"openalex":"https://openalex.org/W4255993536","doi":"https://doi.org/10.1109/date.2004.1269053"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1269053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1269053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008568988","display_name":"B. Bennetts","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119244","display_name":"Bennetts Associates","ror":"https://ror.org/02evg2181","country_code":"GB","type":"other","lineage":["https://openalex.org/I4210119244"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"B. Bennetts","raw_affiliation_strings":["Bennetts Associates, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bennetts Associates, UK","institution_ids":["https://openalex.org/I4210119244"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5008568988"],"corresponding_institution_ids":["https://openalex.org/I4210119244"],"apc_list":null,"apc_paid":null,"fwci":0.412,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5817939,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"93","issue":null,"first_page":"1184","last_page":"1189"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.9415748119354248},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.9192463159561157},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.559538722038269},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5536273717880249},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5162408351898193},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3511226773262024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30417126417160034},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1401538848876953},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10075414180755615}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.9415748119354248},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.9192463159561157},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.559538722038269},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5536273717880249},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5162408351898193},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3511226773262024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30417126417160034},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1401538848876953},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10075414180755615}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1269053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1269053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Partnerships for the goals","id":"https://metadata.un.org/sdg/17"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1555400249","https://openalex.org/W1604279453","https://openalex.org/W2125196703","https://openalex.org/W2147105328","https://openalex.org/W2157522390","https://openalex.org/W2183928100","https://openalex.org/W2284648111","https://openalex.org/W2482764214","https://openalex.org/W2493599268","https://openalex.org/W4232841900","https://openalex.org/W4248451031"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2132255345","https://openalex.org/W2354946480","https://openalex.org/W2164349885","https://openalex.org/W4248272744","https://openalex.org/W2373135325","https://openalex.org/W1853803081","https://openalex.org/W2101025877","https://openalex.org/W2082120371"],"abstract_inverted_index":{"Single":[0],"board,":[1],"and":[2],"now":[3],"multi-board":[4],"testability":[5],"is":[6,34],"highly":[7],"conditioned":[8],"by":[9,40],"the":[10,22,43,48],"availability":[11],"of":[12,15,42],"various":[13],"forms":[14],"boundary":[16,30],"scan":[17],"technology.":[18],"This":[19],"paper":[20,33],"surveys":[21],"three":[23,37],"more":[24],"recent":[25],"IEEE":[26,49],"Standards":[27,50],"relating":[28],"to":[29],"scan.":[31],"The":[32],"based":[35],"on":[36],"backgrounders":[38],"prepared":[39],"members":[41],"individual":[44],"Working":[45],"Groups":[46],"for":[47],"booth":[51],"at":[52],"ITC":[53],"2003.":[54]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}