{"id":"https://openalex.org/W4246394099","doi":"https://doi.org/10.1109/date.2004.1268975","title":"False-noise analysis for domino circuits","display_name":"False-noise analysis for domino circuits","publication_year":2004,"publication_date":"2004-07-20","ids":{"openalex":"https://openalex.org/W4246394099","doi":"https://doi.org/10.1109/date.2004.1268975"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268975","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083748155","display_name":"A. Glebov","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Glebov","raw_affiliation_strings":["Microstyle, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microstyle, Moscow, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053906683","display_name":"S. V. Gavrilov","orcid":"https://orcid.org/0000-0003-0566-4482"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Gavrilov","raw_affiliation_strings":["Microstyle, Moscow, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microstyle, Moscow, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073642600","display_name":"V. Zolotov","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Zolotov","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102168885","display_name":"Chanhee Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chanhee Oh","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011411731","display_name":"R. Panda","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Panda","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061561931","display_name":"M. Becer","orcid":null},"institutions":[{"id":"https://openalex.org/I1333370159","display_name":"Motorola (United States)","ror":"https://ror.org/01hafxd32","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Becer","raw_affiliation_strings":["Motorola, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Motorola, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1333370159"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.58578631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"784","last_page":"789"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/domino-logic","display_name":"Domino logic","score":0.8823458552360535},{"id":"https://openalex.org/keywords/domino","display_name":"Domino","score":0.6955761909484863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6523692011833191},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6159831285476685},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5719783902168274},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5284806489944458},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5266059637069702},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.511616051197052},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4822843372821808},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.43094515800476074},{"id":"https://openalex.org/keywords/logic-family","display_name":"Logic family","score":0.4215722978115082},{"id":"https://openalex.org/keywords/pass-transistor-logic","display_name":"Pass transistor logic","score":0.41090795397758484},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.36021801829338074},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.299744576215744},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2401638925075531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17395594716072083},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1380816400051117},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.12684747576713562}],"concepts":[{"id":"https://openalex.org/C2777555262","wikidata":"https://www.wikidata.org/wiki/Q173391","display_name":"Domino logic","level":5,"score":0.8823458552360535},{"id":"https://openalex.org/C2776416436","wikidata":"https://www.wikidata.org/wiki/Q3751781","display_name":"Domino","level":3,"score":0.6955761909484863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6523692011833191},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6159831285476685},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5719783902168274},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5284806489944458},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5266059637069702},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.511616051197052},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4822843372821808},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.43094515800476074},{"id":"https://openalex.org/C162454741","wikidata":"https://www.wikidata.org/wiki/Q173359","display_name":"Logic family","level":4,"score":0.4215722978115082},{"id":"https://openalex.org/C198521697","wikidata":"https://www.wikidata.org/wiki/Q7142438","display_name":"Pass transistor logic","level":4,"score":0.41090795397758484},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.36021801829338074},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.299744576215744},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2401638925075531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17395594716072083},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1380816400051117},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.12684747576713562},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1268975","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268975","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2042714121","https://openalex.org/W2080267935","https://openalex.org/W2100738443","https://openalex.org/W2129260045","https://openalex.org/W2147897801","https://openalex.org/W2170949280","https://openalex.org/W2171493164","https://openalex.org/W4239082490","https://openalex.org/W4246830553","https://openalex.org/W4248793972","https://openalex.org/W4301264637","https://openalex.org/W6668899087"],"related_works":["https://openalex.org/W2142702094","https://openalex.org/W2050591234","https://openalex.org/W2171918386","https://openalex.org/W2594780754","https://openalex.org/W2534190481","https://openalex.org/W2991771859","https://openalex.org/W2118487491","https://openalex.org/W4285230816","https://openalex.org/W2158157809","https://openalex.org/W2139625229"],"abstract_inverted_index":{"High-performance":[0],"digital":[1],"circuits":[2,83,91,133],"are":[3,93],"facing":[4],"increasingly":[5],"severe":[6],"noise":[7,12,15,45,55,86,104,113,127,223],"problems":[8],"due":[9,36],"to":[10,37,96,135,197],"cross-coupled":[11],"injection.":[13],"Traditionally,":[14],"analysis":[16,105,128,224],"tools":[17],"use":[18,75],"the":[19,32,41,103,162,199,208],"conservative":[20],"assumption":[21],"that":[22,164],"all":[23],"neighbors":[24],"of":[25,102,111,151,172,192,201],"a":[26,52,148,173],"net":[27],"can":[28,176],"switch":[29],"simultaneously,":[30],"producing":[31],"worst-case":[33,44],"noise.":[34,98],"However,":[35],"logic":[38,61,77,138,153,187,202],"correlations":[39,62,139,154,188],"in":[40,51,108,140,155,178,220],"circuit,":[42],"this":[43,144],"may":[46],"not":[47],"be":[48,177],"realizable,":[49],"resulting":[50],"so-called":[53],"false":[54,112,126],"failure.":[56],"Some":[57],"techniques":[58],"for":[59,78,130,189],"computing":[60,152],"have":[63,84],"been":[64],"designed":[65],"targeting":[66],"static":[67,89,131],"CMOS":[68,90,132],"circuits.":[69,142,157],"However":[70],"high":[71,229],"performance":[72,230],"microprocessors":[73],"commonly":[74],"domino":[76,82,141,156,174,193],"their":[79],"ALU.":[80],"The":[81,182,215],"lower":[85],"margins":[87],"than":[88],"and":[92,115,168,226],"more":[94],"sensitive":[95],"coupled":[97],"Any":[99],"unnecessary":[100],"pessimism":[101],"tool":[106,225],"results":[107],"large":[109],"number":[110],"violations":[114],"either":[116],"requires":[117],"additional":[118,186],"extensive":[119],"SPICE":[120],"simulations":[121],"or":[122],"circuit":[123],"over-design.":[124],"Unfortunately":[125],"developed":[129],"fails":[134],"compute":[136],"many":[137],"In":[143,195],"paper":[145],"we":[146,206],"propose":[147],"novel":[149],"technique":[150,184,205,217],"It":[158],"takes":[159],"into":[160],"account":[161],"fact":[163],"both":[165],"pull":[166,169],"up":[167],"down":[170],"networks":[171],"gate":[175],"non":[179],"conducting":[180],"state.":[181],"proposed":[183,216],"generates":[185],"such":[190],"states":[191],"gates.":[194],"order":[196],"improve":[198],"capability":[200],"correlation":[203],"derivation":[204],"combine":[207],"resolution":[209],"method":[210],"with":[211],"recursive":[212],"learning":[213],"algorithm.":[214],"is":[218],"implemented":[219],"an":[221],"industrial":[222],"tested":[227],"on":[228],"ALU":[231],"blocks.":[232]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}