{"id":"https://openalex.org/W4251658276","doi":"https://doi.org/10.1109/date.2004.1268946","title":"Concurrent sizing, Vdd and V/sub th/ assignment for low-power design","display_name":"Concurrent sizing, Vdd and V/sub th/ assignment for low-power design","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W4251658276","doi":"https://doi.org/10.1109/date.2004.1268946"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268946","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002035285","display_name":"A. Srivastava","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Srivastava","raw_affiliation_strings":["EECS Department, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084533840","display_name":"D. Sylvester","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Sylvester","raw_affiliation_strings":["EECS Department, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026368018","display_name":"D. Blaauw","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Blaauw","raw_affiliation_strings":["EECS Department, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5002035285"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":5.5003,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.96653258,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"718","last_page":"719"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7078160643577576},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.6940102577209473},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6648927330970764},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.6410768032073975},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.533240556716919},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5215116143226624},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.5209749341011047},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.519758403301239},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5018396377563477},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4498051702976227},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4370363652706146},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4324694573879242},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42547282576560974},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4183364808559418},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2905788719654083},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2816733717918396},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25554829835891724},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2004324495792389},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17959275841712952},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.16772645711898804},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.1617283821105957},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06635436415672302}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7078160643577576},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.6940102577209473},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6648927330970764},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.6410768032073975},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.533240556716919},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5215116143226624},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.5209749341011047},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.519758403301239},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5018396377563477},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4498051702976227},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4370363652706146},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4324694573879242},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42547282576560974},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4183364808559418},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2905788719654083},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2816733717918396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25554829835891724},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2004324495792389},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17959275841712952},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.16772645711898804},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.1617283821105957},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06635436415672302},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1268946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268946","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1984176385","https://openalex.org/W2121190917"],"related_works":["https://openalex.org/W2924345281","https://openalex.org/W2122696791","https://openalex.org/W2020064877","https://openalex.org/W2056387586","https://openalex.org/W2167755006","https://openalex.org/W2545960595","https://openalex.org/W1515931217","https://openalex.org/W2122945703","https://openalex.org/W2044919502","https://openalex.org/W2104408907"],"abstract_inverted_index":{"We":[0,62],"present":[1],"a":[2,30],"sensitivity-based":[3],"algorithm":[4,24,48],"for":[5],"total":[6,73],"power":[7,13,52,74],"including":[8,49],"dynamic":[9],"and":[10,19,27],"subthreshold":[11],"leakage":[12],"minimization":[14],"using":[15],"simultaneous":[16],"sizing,":[17],"Vdd":[18,70],"Vth":[20],"assignment.":[21],"The":[22],"proposed":[23],"is":[25],"implemented":[26],"tested":[28],"on":[29,72],"set":[31],"of":[32,46,54,60,67],"combinational":[33],"benchmark":[34],"circuits.":[35],"A":[36],"comparison":[37],"with":[38],"traditional":[39],"CVS":[40],"based":[41],"algorithms":[42],"demonstrates":[43],"the":[44,47,65],"advantage":[45],"an":[50],"average":[51],"reduction":[53],"37%":[55],"at":[56],"primary":[57],"input":[58],"activities":[59],"0.1.":[61],"also":[63],"investigate":[64],"impact":[66],"various":[68],"low":[69],"values":[71],"savings.":[75]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}