{"id":"https://openalex.org/W4251180167","doi":"https://doi.org/10.1109/date.2004.1268944","title":"Are our design for testability features fault secure?","display_name":"Are our design for testability features fault secure?","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W4251180167","doi":"https://doi.org/10.1109/date.2004.1268944"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268944","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268944","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088717934","display_name":"C. Metra","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"C. Metra","raw_affiliation_strings":["DEIS, Universit\u00e0 di Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"DEIS, Universit\u00e0 di Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013150200","display_name":"T.M. Mak","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.M. Mak","raw_affiliation_strings":["Intel Corporation, CA, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, CA, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072488212","display_name":"M. Omana","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Omana","raw_affiliation_strings":["DEIS, Universit\u00e0 di Bologna, Italy"],"affiliations":[{"raw_affiliation_string":"DEIS, Universit\u00e0 di Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5088717934"],"corresponding_institution_ids":["https://openalex.org/I9360294"],"apc_list":null,"apc_paid":null,"fwci":0.2833,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52071006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"68","issue":null,"first_page":"714","last_page":"715"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.972100019454956,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9574999809265137,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8381179571151733},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.7529124617576599},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6530830264091492},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6187846660614014},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5403727293014526},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.4644503593444824},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.45500704646110535},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4519290328025818},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34286218881607056},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20433196425437927},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09245237708091736}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8381179571151733},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.7529124617576599},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6530830264091492},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6187846660614014},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5403727293014526},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.4644503593444824},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.45500704646110535},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4519290328025818},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34286218881607056},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20433196425437927},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09245237708091736},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1268944","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268944","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W127812686","https://openalex.org/W1491324588","https://openalex.org/W1625855991","https://openalex.org/W1838879283","https://openalex.org/W1922096662","https://openalex.org/W1937706874","https://openalex.org/W2132881562","https://openalex.org/W2145314233","https://openalex.org/W2162539355","https://openalex.org/W4243202078","https://openalex.org/W6605095531"],"related_works":["https://openalex.org/W3037788266","https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W4249526199","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811"],"abstract_inverted_index":{"We":[0,19,39],"analyze":[1],"the":[2,41,67],"risks":[3],"associated":[4],"with":[5,29],"faults":[6,65],"affecting":[7],"some":[8,23],"common":[9],"design":[10],"for":[11],"testability":[12],"(DFT)":[13],"features":[14],"employed":[15],"within":[16,66],"digital":[17],"products.":[18],"will":[20,47],"show":[21,48],"that":[22,49,52],"DFT":[24,68],"structures":[25],"may":[26,61],"become":[27],"useless,":[28],"consequent":[30],"dramatic":[31],"impact":[32],"on":[33],"test":[34],"effectiveness":[35],"and":[36,45],"product":[37],"quality.":[38],"borrow":[40],"fault":[42],"secure":[43],"property":[44],"we":[46],"it":[50],"guarantees":[51],"no":[53],"escapes":[54],"or":[55],"false":[56],"acceptance":[57],"of":[58,64],"faulty":[59],"products":[60],"occur":[62],"because":[63],"structures.":[69]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}