{"id":"https://openalex.org/W4231294944","doi":"https://doi.org/10.1109/date.2004.1268934","title":"Regression simulation: applying path-based learning in delay test and post-silicon validation","display_name":"Regression simulation: applying path-based learning in delay test and post-silicon validation","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W4231294944","doi":"https://doi.org/10.1109/date.2004.1268934"},"language":"en","primary_location":{"id":"doi:10.1109/date.2004.1268934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268934","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of ECE, University of California,\uc2a0Santa Barbara, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California,\uc2a0Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100369642"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"692","last_page":"693"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7079095840454102},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5712389945983887},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.5441031455993652},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5402112007141113},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.5347487330436707},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.5324232578277588},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.4620259404182434},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4188231825828552},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.39318591356277466},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3870672583580017},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36336004734039307},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15803170204162598},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13921821117401123},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13508957624435425},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09375223517417908}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7079095840454102},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5712389945983887},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.5441031455993652},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5402112007141113},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.5347487330436707},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.5324232578277588},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.4620259404182434},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4188231825828552},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.39318591356277466},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3870672583580017},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36336004734039307},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15803170204162598},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13921821117401123},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13508957624435425},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09375223517417908},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2004.1268934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2004.1268934","pdf_url":null,"source":{"id":"https://openalex.org/S4363608792","display_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1503689022","https://openalex.org/W1511843316","https://openalex.org/W1597805936","https://openalex.org/W2170489924","https://openalex.org/W6635673271"],"related_works":["https://openalex.org/W4384302763","https://openalex.org/W31220157","https://openalex.org/W2312753042","https://openalex.org/W4289356671","https://openalex.org/W2389155397","https://openalex.org/W2165884543","https://openalex.org/W3186837933","https://openalex.org/W2368989808","https://openalex.org/W1969346022","https://openalex.org/W2034959125"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,32,58,82,87,90,101],"novel":[4],"path-based":[5,74],"learning":[6,75],"methodology":[7,14,76],"to":[8,30,38,60],"achieve":[9],"timing":[10,36,46],"regression":[11,25,52,111],"simulation.":[12,47],"The":[13],"can":[15,27,54],"be":[16,28,55],"applied":[17],"for":[18,98],"two":[19],"purposes:":[20],"(1)":[21],"In":[22,49],"pre-silicon":[23],"phase,":[24,51],"simulation":[26,53,112],"used":[29,56],"produce":[31],"fast":[33],"and":[34,100,114],"approximate":[35],"simulator":[37],"avoid":[39],"the":[40,65,70,96,106],"high":[41],"cost":[42],"associated":[43],"with":[44],"statistical":[45],"(2)":[48],"post-silicon":[50],"as":[57,95],"vehicle":[59],"deduce":[61],"critical":[62],"paths":[63,94],"from":[64],"pass/fail":[66],"behavior":[67],"observed":[68],"on":[69],"test":[71,84],"chips.":[72],"Our":[73],"consists":[77],"of":[78,92],"four":[79],"major":[80],"components:":[81],"delay":[83],"pattern":[85],"set,":[86],"logic":[88],"simulator,":[89],"set":[91],"selected":[93],"basis":[97],"learning,":[99],"machine":[102],"learner.":[103],"We":[104],"summarize":[105],"key":[107],"concepts":[108],"in":[109],"our":[110],"approach":[113],"present":[115],"experimental":[116],"results.":[117]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}